IP Library Granted Patent US 8,682,163
Granted Patent B2
US 8,682,163 · App. 13/188,681 · Granted Mar 25, 2014

Detecting method, apparatus, and system in an optical distribution network

Inventor: Sulin Yang (Shenzhen, CN)
Assignee: Huawei Technologies Co., Ltd.
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Quick Facts
Patent No.
US 8,682,163
App. No.
13/188,681
Granted
Mar 25, 2014
Kind
B2
Abstract

A detecting method, an apparatus, and a system in an Optical Distribution Network (ODN) are provided. The method includes: an Optical Line Termination (OLT) reserves a test window, and an Optical Network Unit (ONU) stops sending an uplink signal in the test window, the OLT emits a downlink test signal having a wavelength the same as that of the uplink signal in the test window, the OLT receives backward signals of the downlink test signal, in which the backward signals include a backward scattered signal and a backward reflected signal, processes the backward signals, and obtains state information of the ODN according to the backward signals. The method does not need to add other hardware, and the downlink signal is sent normally in the downlink. The implementation is low in the cost and easy in the technology.

Claims (57)

1. A central office subsystem, comprising:

an Optical Distribution Network (ODN) interface,

an optical receiver,

a first optical emitter,

a second optical emitter,

a test processing unit, and

a control unit,

wherein the ODN interface is configured to be connected to an ODN;

wherein the optical receiver is coupled with the ODN interface, and is configured to receive an optical signal used for uplink data transmission, wherein a wavelength of the optical signal used for the uplink data transmission is a second wavelength;

wherein the first optical emitter is coupled with the ODN interface, and is configured to send an optical signal used for downlink data transmission, wherein a wavelength of the optical signal used for the downlink data transmission is a first wavelength;

wherein the test processing unit is configured to generate a test excitation signal, send the generated test excitation signal to the second optical emitter, perform time-domain or frequency-domain analysis on an optical signal reflected and/or scattered by the ODN, and obtain line evaluation information of the ODN;

wherein the second optical emitter is configured to emit an optical signal bearing the test excitation signal with the second wavelength; and

wherein the control unit is configured to specify a test window, and control the test processing unit to send and receive a signal in the specified test window.

2. A central office subsystem, comprising:

an Optical Distribution Network (ODN) interface,

an optical receiver,

a first optical emitter,

a second optical emitter,

a test processing unit, and

a control unit,

wherein the ODN interface is configured to be connected to an ODN;

wherein the optical receiver is coupled with the ODN interface, and is configured to receive an optical signal used for uplink data transmission, wherein a wavelength of the optical signal used for the uplink data transmission is a second wavelength;

wherein the first optical emitter is coupled with the ODN interface, and is configured to send an optical signal used for downlink data transmission, wherein a wavelength of the optical signal used for the downlink data transmission is a first wavelength;

wherein the test processing unit is configured to generate a test excitation signal, send the generated test excitation signal to the second optical emitter, perform time-domain or frequency-domain analysis on an optical signal reflected and/or scattered by the ODN, and obtain line evaluation information of the ODN;

wherein the second optical emitter is configured to emit an optical signal bearing the test excitation signal with the second wavelength; and

wherein the control unit is configured to specify a test window, control the test processing unit to send and receive a signal in the specified test window, and notify the first optical emitter of a notification message for notifying the ONU of stopping sending an uplink data transmission signal, so as to specify the test window.

3. A central office subsystem, comprising:

an Optical Distribution Network (ODN) interface,

an optical receiver,

a first optical emitter,

a second optical emitter,

a test processing unit,

a control unit, and

a bandwidth allocation unit,

wherein the ODN interface is configured to be connected to an ODN;

wherein the optical receiver is coupled with the ODN interface, and is configured to receive an optical signal used for uplink data transmission, wherein a wavelength of the optical signal used for the uplink data transmission is a second wavelength;

wherein the first optical emitter is coupled with the ODN interface, and is configured to send an optical signal used for downlink data transmission, wherein a wavelength of the optical signal used for the downlink data transmission is a first wavelength;

wherein the test processing unit is configured to generate a test excitation signal, send the generated test excitation signal to the second optical emitter, perform time-domain or frequency-domain analysis on an optical signal reflected and/or scattered by the ODN and obtain line evaluation information of the ODN;

wherein the second optical emitter is configured to emit an optical signal bearing the test excitation signal with the second wavelength;

wherein the control unit is configured to specify a test window, control the test processing unit to send and receive a signal in the specified test window, and control the bandwidth allocation unit to specify a null window forbidding any ONU to send uplink data as the test window; and

wherein the bandwidth allocation unit is configured to perform uplink timeslot allocation on the uplink data transmission.

4. An optical communication system, comprising:

at least one Optical Network Unit (ONU); and

a central office subsystem, comprising:

an Optical Distribution Network (ODN) interface,

an optical receiver,

a first optical emitter,

a second optical emitter,

a test processing unit, and

a control unit,

wherein the ODN interface is configured to be connected to an ODN,

wherein the optical receiver is coupled with the ODN interface, and is configured to receive an optical signal used for uplink data transmission, wherein a wavelength of the optical signal used for the uplink data transmission is a second wavelength,

wherein the first optical emitter is coupled with the ODN interface, and is configured to send an optical signal used for downlink data transmission, wherein a wavelength of the optical signal used for the downlink data transmission is a first wavelength,

wherein the test processing unit is configured to generate a test excitation signal, send the generated test excitation signal to the second optical emitter, perform time-domain or frequency-domain analysis on an optical signal reflected and/or scattered by the ODN, and obtain line evaluation information of the ODN,

wherein the second optical emitter is configured to emit an optical signal bearing the test excitation signal with the second wavelength, and

wherein the control unit is configured to specify a test window, and control the test processing unit to send and receive a signal in the specified test window;

wherein the central office subsystem is connected to the ONU through an Optical Distribution Network (ODN).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 22, 2011
From: YANG, SULIN
To: HUAWEI TECHNOLOGIES CO., LTD.
Reel/Frame 026634/0730 →
Priority Claims (1)
CN 2009 1 0105299 · Jan 23, 2009 · national
Continuity (2)
Continuation PCTCN2009074098 · Sep 22, 2009
Related Publication 20110274426A1 · Nov 10, 2011