IP Library › Granted Patent US 8,692,558
Granted Patent B2
US 8,692,558 · App. 13/189,557 · Granted Apr 8, 2014

Display panel and testing method thereof

Inventor: Chung-Ming Shen (Taipei, TW)
Assignee: Au Optronics Corporation
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Quick Facts
Patent No.
US 8,692,558
App. No.
13/189,557
Granted
Apr 8, 2014
Kind
B2
Abstract

A display panel and a testing method of the display panel are provided. The display panel has a display region and a non-display region and includes a first substrate, a second substrate, and a display medium. The display panel further includes scan lines, data lines, pixel units, at least one testing line, and at least one testing pad. The scan lines and the data lines are located on the first substrate within the display region. The pixel units are located on the first substrate within the display region. Each pixel unit electrically connects one of the scan lines and one of the data lines. The testing line is located on the first substrate within the non-display region, crosses over the scan lines, and is insulated from the scan lines. The testing pad is located on the first substrate within the non-display region and electrically connected to the testing line.

Claims (17)

1. A display panel having a display region and a non-display region, the display panel comprising:

a first substrate, a second substrate, and a display medium located between the first substrate and the second substrate;

a plurality of data lines and a plurality of scan lines, the scan lines and the data lines being located on the first substrate within the display region;

a plurality of pixel units located on the first substrate within the display region, each of the pixel units being electrically connected to one of the scan lines and one of the data lines;

at least one testing line located on the first substrate within the non-display region, the scan lines crossing over the at least one testing line and being electrically insulated from the at least one testing line;

at least one testing pad located on the first substrate within the non-display region, the at least one testing pad being electrically connected to the at least one testing line;

a common voltage line located on the first substrate within the non-display region and disposed adjacent to the at least one testing line; and

a common voltage pad located on the first substrate within the non-display region and electrically connected to the common voltage line,

wherein the at least one testing line is electrically connected to the common voltage line.

2. The display panel as claimed in claim 1 , wherein the at least one testing line comprises a first portion and a second portion, the first portion of the at least one testing line crosses over the scan lines, is electrically insulated from the scan lines, and is electrically connected to the at least one testing pad, and the second portion of the at least one testing line crosses over the data lines and is electrically insulated from the data lines.

3. The display panel as claimed in claim 2 , further comprising:

a common voltage line located on the first substrate within the non-display region and disposed adjacent to the at least one testing line; and

a common voltage pad located on the first substrate within the non-display region and electrically connected to the common voltage line.

4. The display panel as claimed in claim 1 , wherein the at least one testing pad is located on the first substrate and is not covered by the second substrate.

5. The display panel as claimed in claim 1 , further comprising at least one driving device located on the first substrate within the non-display region, the scan lines and the data lines being electrically connected to the at least one driving device.

6. The display panel as claimed in claim 1 , wherein no switch devices are configured between the at least testing line and the scan lines.

7. The display panel as claimed in claim 1 , further comprising a bridge line disposed between the at least one testing line and the common voltage line, wherein the bridge line connects the at least one testing line and the common voltage line.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2011
From: SHEN, CHUNG-MING
To: AU OPTRONICS CORPORATION
Reel/Frame 026661/0359 →
Priority Claims (1)
TW 100112993 A · Apr 14, 2011 · national
Continuity (1)
Related Publication 20120262184A1 · Oct 18, 2012