Self-calibrated DAC with reduced glitch mapping

1. A digital-to-analog converter (DAC), comprising:

a plurality of current-steering elements, wherein:

each current-steering element comprises a current source, a current sink, and a current switch, the current switch configured to couple the current source to a calibration-current sink and couple the current sink to a calibration-current source when the current steering element is being calibrated;

each respective current-steering element is configured to operate as instructed by a respective calibration signal during respective steps in a calibration cycle; and

at least one current-steering element is configured to:

operate as instructed by a first control signal during at least a first step in which the at least one current-steering element is not being calibrated; and

operate as instructed by a second control signal during at least a second step in which the at least one current-steering element is not being calibrated.

2. The DAC of claim 1 , wherein at least three respective current-steering elements experience a switchover of signals that instruct the operation of the respective current-steering elements during at least one transition between consecutive steps in the calibration cycle.

3. The DAC of claim 2 , wherein no more than three respective current-steering elements experience a switchover of signals that instruct the operation of the respective current-steering elements during transitions between consecutive steps in the calibration cycle or between a last step in the calibration cycle to a first step in a next calibration cycle.

4. The DAC of claim 1 , further comprising a reference generator configured to:

receive a reference current; and

generate a bias voltage for a plurality of current sinks, wherein the bias voltage is driven by an amplifier.

5. The DAC of claim 1 , further comprising a reference generator configured to:

receive a reference current; and

generate a bias voltage for a plurality of current sources, wherein the bias voltage is driven by an amplifier.

6. The DAC of claim 1 , further comprising a reference generator comprising:

a metal-oxide semiconductor field-effect transistor (MOSFET) configured to receive a reference current, wherein a bias voltage for driving at least one current source is generated based on the size of the MOSFET;

the reference current having one selected value out of a plurality of potential values; and

the MOSFET having one selected size out of a plurality of potential sizes, wherein the selection of the MOSFET size corresponds to the selection of the reference current such that the value of the bias voltage is approximately the same for each potential current reference value.

7. The DAC of claim 1 , further comprising a reference generator comprising:

a metal-oxide semiconductor field-effect transistor (MOSFET) configured to receive a reference current, wherein a bias voltage for driving at least one current sink is generated based on the size of the MOSFET;

the reference current having one selected value out of a plurality of potential values; and

the MOSFET having one selected size out of a plurality of potential sizes, wherein the selection of the MOSFET size corresponds to the selection of the reference current such that the value of the bias voltage is approximately the same for each potential current reference value.

8. The DAC of claim 1 , further comprising a transimpedance output amplifier, the input of the transimpedance output amplifier coupled to each of a plurality of current-steering elements.

9. The DAC of claim 1 , further comprising an integrator, the input of the integrator coupled to each of a plurality of current-steering elements.

10. A digital-to-analog converter (DAC), comprising:

a plurality of current-steering elements, wherein:

each current-steering element comprises a current source, a current sink, and a current switch, the current switch configured to couple the current source to a calibration-current sink and couple the current sink to a calibration-current source when the current steering element is being calibrated;

each respective current-steering element is configured to be calibrated during respective steps in a calibration cycle; and

a control circuit configured to:

output a plurality of control signals;

direct a control signal to a first current-steering element during at least a first step in which the first current-steering element is not being calibrated; and

direct the control signal to a second current-steering element during at least a second step in which the second current-steering element is not being calibrated.

11. The DAC of claim 10 , wherein at least two control signals are redirected to different respective current-steering elements during at least one transition between consecutive steps in the calibration cycle.

12. The DAC of claim 11 , wherein no more than two control signals are redirected to different respective current-steering elements during transitions between consecutive steps in the calibration cycle or between a last step in the calibration cycle to a first step in a next calibration cycle.

13. The DAC of claim 10 , further comprising a reference generator configured to:

receive a reference current; and

generate a bias voltage for a plurality of current sinks, wherein the bias voltage is driven by an amplifier.

14. The DAC of claim 10 , further comprising a reference generator configured to:

receive a reference current; and

generate a bias voltage for a plurality of current sources, wherein the bias voltage is driven by an amplifier.

15. The DAC of claim 10 , further comprising a reference generator comprising:

a metal-oxide semiconductor field-effect transistor (MOSFET) configured to receive a reference current, wherein a bias voltage for driving at least one current source is generated based on the size of the MOSFET;

the reference current having one selected value out of a plurality of potential values; and

the MOSFET having one selected size out of a plurality of potential sizes, wherein the selection of the MOSFET size corresponds to the selection of the reference current such that the value of the bias voltage is approximately the same for each potential current reference value.

16. The DAC of claim 10 , further comprising a reference generator comprising:

a metal-oxide semiconductor field-effect transistor (MOSFET) configured to receive a reference current, wherein a bias voltage for driving at least one current sink is generated based on the size of the MOSFET;

the reference current having one selected value out of a plurality of potential values; and

the MOSFET having one selected size out of a plurality of potential sizes, wherein the selection of the MOSFET size corresponds to the selection of the reference current such that the value of the bias voltage is approximately the same for each potential current reference value.

17. The DAC of claim 10 , further comprising a transimpedance output amplifier, the input of the transimpedance output amplifier coupled to each of a plurality of current-steering elements.

18. The DAC of claim 10 , further comprising an integrator, the input of the integrator coupled to each of a plurality of current-steering elements.

19. A method, comprising:

coupling a calibration-current sink to current sources of respective current-steering elements out of a plurality of current-steering elements during respective steps in a calibration cycle;

coupling a calibration-current source to current sinks of respective current-steering elements out of the plurality of current-steering elements during respective steps in the calibration cycle;

calibrating respective current-steering elements out of the plurality of current-steering elements during respective steps in the calibration cycle, wherein at least one current-steering element is configured to:

operate as instructed by a first control signal during at least a first step in which the at least one current-steering element is not being calibrated; and

operate as instructed by a second control signal during at least a second step in which the at least one current-steering element is not being calibrated; and

directing respective control signals out of a plurality of control signals to the respective current-steering elements that are not being calibrated during the respective steps in the calibration cycle.

20. The method of claim 19 , further comprising redirecting at least two control signals to different respective current-steering elements that are not being calibrated in a next step during at least one transition between consecutive steps in the calibration cycle.

21. The method of claim 19 , wherein no more than two control signals are redirected to different respective current-steering elements during transitions between consecutive steps in the calibration cycle or between a last step in the calibration cycle to a first step in a next calibration cycle.