Partial magnetic biasing of magnetoresistive sensor
Various embodiments can be generally directed to a magnetoresistive stack with a first stripe height and a biasing magnet positioned adjacent the magnetoresistive stack. The biasing magnet can have a second stripe height that is less than the first stripe height. The first and second stripe heights may correspond to a minimum signal to noise ratio in the magnetoresistive stack.
1. A sensor, comprising:
a magnetoresistive stack with a first stripe height as measured orthogonal to an air bearing surface (ABS) of the magnetoresistive stack; and
a biasing magnet positioned adjacent the magnetoresistive stack and having a second stripe height, the second stripe height measured orthogonal to the ABS and being less than the first stripe height, the first and second stripe heights corresponding to a minimum signal to noise ratio in the magnetoresistive stack.
2. The sensor of claim 1 , wherein the magnetoresistive stack has a plurality of magnetic free layers biased to a default magnetization by the biasing magnet.
3. The sensor of claim 1 , wherein the magnetoresistive stack and biasing magnet are on an air bearing surface.
4. The sensor of claim 1 , wherein the first and second stripe heights form a predetermined ratio that is greater than or equal to 2.
5. The sensor of claim 1 , wherein the first and second stripe heights form a predetermined ratio that is greater than or equal to 3.
6. The sensor of claim 1 , wherein first stripe height is 60% to 80% greater than the second stripe height.
7. The sensor of claim 1 , further comprising a second biasing magnet adjacent the magnetoresistive stack and configured with a third stripe height.
8. The sensor of claim 7 , wherein the third stripe height is equal to the second stripe height.
9. The sensor of claim 1 , further comprising an insulating layer disposed between the magnetoresistive stack and a shield.
10. The sensor of claim 1 , wherein the biasing magnet has a first width that is less than or equal to a second width of the magnetoresistive stack.
11. A method comprising:
positioning a magnetoresistive stack with a first stripe height, as measured orthogonal to an air bearing surface (ABS) of the magnetoresistive stack, adjacent a biasing magnet having a second stripe height, the second stripe height measured orthogonal to the ABS and being less than the first stripe height; and
selecting the first and second stripe heights to correspond to a minimum signal to noise ratio in the magnetoresistive stack.
12. The method of claim 11 , wherein the minimum signal to noise ratio is in response to an encountered external data bit.
13. The method of claim 11 , wherein the first and second stripe heights form a biasing region proximal to the ABS.
14. The method of claim 13 , wherein the biasing region extends from the ABS approximately to the second stripe height.
15. The method of claim 11 , wherein the difference between the first and second stripe heights defines a magnetic shunt portion of the magnetoresistive stack.
16. The method of claim 11 , wherein the stack biasing magnet induces a default magnetization in the magnetoresistive state.
17. An apparatus comprising:
a magnetoresistive stack positioned on an air bearing surface (ABS) with a first stripe height as measured orthogonal to the ABS; and
a first biasing magnet positioned adjacent the magnetoresistive stack on the ABS and having a second stripe height, the second stripe height measured orthogonal to the ABS and being less than the first stripe height; and
a second biasing magnet positioned adjacent the magnetoresistive stack on the ABS having a third stripe height, the third stripe height measured orthogonal to the ABS and being less than the first and second stripe heights, the first, second, and third stripe heights corresponding to a minimum signal to noise ratio in the magnetoresistive stack.
18. The apparatus of claim 17 , wherein the second biasing magnet is on an opposite side of the magnetoresistive stack from the first biasing magnet on the ABS.
19. The apparatus claim 17 , where the a first differential is the difference between the first and second stripe heights and a second differential is the difference between the first and third stripe heights, where each differential is measured orthogonal to the ABS.
20. The apparatus of claim 19 , wherein the second and third stripe heights are each 20-40% of the first stripe height.