IP Library Granted Patent US 9,178,112
Granted Patent B2
US 9,178,112 · App. 13/196,648 · Granted Nov 3, 2015

Light emitting device having light extraction structure

Inventor: Sun Kyung Kim (Seoul, KR)
Assignees: LG ELECTRONICS INC.; LG INNOTEK CO., LTD.
H01L33/20H01L33/50H01L33/505H01L33/58H01L33/44H01L2933/0083
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Quick Facts
Patent No.
US 9,178,112
App. No.
13/196,648
Granted
Nov 3, 2015
Kind
B2
Abstract

A light emitting device having a light extraction structure, which is capable of achieving an enhancement in light extraction efficiency and reliability, and a method for manufacturing the same. The light emitting device includes a semiconductor layer having a multi-layered structure including a light emission layer; and a light extraction structure formed on the semiconductor layer in a pattern having unit structures. Further, the wall of each of the unit structures is sloped at an angle of −45° to +45° from a virtual vertical line being parallel to a main light emitting direction of the light emitting device.

Claims (30)

1. A method for manufacturing a light emitting device, the method comprising:

applying a mask layer on a dielectric layer on a semiconductor layer;

forming a pattern into the mask layer, the pattern comprising unit structures,

wherein the unit structures have a hole or a rod shape, and

wherein a wall of the unit structures is sloped at an angle of −45° to +45°, from a virtual vertical line parallel to a light emitting direction of the light emitting device;

forming a light extraction structure into the dielectric layer using the mask layer; and

controlling an average filling factor of the pattern by adjusting at least one of a slope of the wall, a radius of the unit structures, and a lattice structure of the light extraction structure,

wherein the average filling factor of the light extraction structure is more than 5% and less than 37% with respect to an area of a light emission surface of the light emitting device, and

wherein the average filling factor is a ratio of an average area of the pattern with respect to a total area of a light emission surface of the light emitting device.

2. The method according to claim 1 , wherein the semiconductor layer comprises GaN.

3. The method according to claim 1 , wherein the step of forming the pattern comprises:

forming the pattern using photolithography.

4. The method according to claim 3 , wherein a distance between centers of neighboring unit structures of the pattern is 1˜10 times a wavelength of irradiated light.

5. The method according to claim 1 , wherein a period of the light extraction structure or an average distance between centers of neighboring unit structures is 400˜3,000 nm.

6. The method according to claim 1 , wherein a period of the light extraction structure or an average distance between centers of neighboring unit structures is more than 3,000 nm.

7. The method according to claim 1 , wherein a height of the unit structures is λ/2n˜3,000 nm, “n” representing a refraction index of a material of the light extraction structure, and λ representing a central wavelength of the light emitting device.

8. The method according to claim 1 , wherein the unit structures has a truncated shape.

9. The method according to claim 1 , wherein the light extraction structure comprises one of a rectangular lattice structure, a triangular lattice structure, an Archimedean lattice structure, a random structure, a Quasi-crystal structure, and a Quasi-random structure.

10. The method according to claim 1 , wherein a slope of the wall of the unit structures is configured to enhance a light extraction efficiency of the light emitting device.

11. The method according to claim 1 , wherein a light emission surface of the light emitting device is formed as a horizontally sectional virtual surface below the light extraction structure.

12. The method according to claim 1 , wherein the mask layer comprises a photoresist.

13. The method according to claim 1 , wherein the dielectric layer contacts the semiconductor layer.

14. A method for manufacturing a light emitting device, the method comprising:

applying a mask layer on a light extraction layer;

forming a pattern into the mask layer, the pattern comprising unit structures,

wherein the unit structures have a hole or a rod shape, and

wherein a wall of the unit structures is sloped at an angle of −45° to +45° from a virtual vertical line parallel to a light emitting direction of the light emitting device; and

forming a light extraction structure into the light extraction layer using the mask layer,

wherein an average filling factor of the light extraction structure is more than 5% and less than 37% with respect to an area of a light emission surface of the light emitting device, and

wherein the average filling factor is a ratio of an average area of the pattern with respect to a total area of a light emission surface of the light emitting device.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2025
From: LG ELECTRONICS INC.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 072529/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
Priority Claims (1)
KR 10-2007-0108745 · Oct 29, 2007 · national
Continuity (3)
Division 12816258 · Jun 15, 2010
Division 11948828 · Nov 30, 2007
Related Publication 20110287564A1 · Nov 24, 2011