IP Library › Granted Patent US 11,189,642
Granted Patent B2
US 11,189,642 · App. 13/223,475 · Granted Nov 30, 2021

Semiconductor device and light-emitting device

Inventor: Kaoru Hatano (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1225H01L29/78606H01L51/5259
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,189,642
App. No.
13/223,475
Granted
Nov 30, 2021
Kind
B2
Abstract

To provide a highly reliable semiconductor device including an oxide semiconductor. Further to provide a highly reliable light-emitting device including an oxide semiconductor. A second electrode sealed together with a semiconductor element including an oxide semiconductor hardly becomes inactive. A hydrogen ion and/or a hydrogen molecule produced by reaction of the active second electrode with moisture remaining in the semiconductor device and/or moisture entering from the outside of the device increase the carrier concentration in the oxide semiconductor, which causes a reduction in the reliability of the semiconductor device. An adsorption layer of a hydrogen ion and/or a hydrogen molecule may be provided on the other surface side of the second electrode having one surface in contact with the organic layer. Further, an opening which a hydrogen ion and/or a hydrogen molecule passes through may be provided for the second electrode.

Claims (8)

1. A semiconductor device, comprising:

a transistor; and

a light-emitting element electrically connected to the transistor, the light-emitting element comprising an electroluminescent layer,

wherein a through hole of an electrode of the light-emitting element overlaps with a channel formation region of the transistor.

2. The semiconductor device according to claim 1 , wherein the channel formation region comprises an oxide semiconductor.

3. The semiconductor device according to claim 1 , further comprising:

a second transistor electrically connected to the transistor,

wherein a second through hole of the electrode of the light-emitting element overlaps with a channel formation region of the second transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2011
From: HATANO, KAORU
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 026879/0624 →
Priority Claims (1)
JP JP2010-203341 · Sep 10, 2010 · national
Continuity (1)
Related Publication 20120061671A1 · Mar 15, 2012