IP Library › Granted Patent US 8,754,494
Granted Patent B2
US 8,754,494 · App. 13/234,471 · Granted Jun 17, 2014

Image sensing device including through vias electrically connecting imaging lens unit to image sensors

Inventors: Atsuko Kawasaki (Yokohama, JP); Kenichiro Hagiwara (Yokohama, JP); Hirokazu Sekine (Fujisawa, JP)
Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 8,754,494
App. No.
13/234,471
Granted
Jun 17, 2014
Kind
B2
Abstract

According to one embodiment, a solid-state image sensing device includes a semiconductor substrate on which a plurality of pixels are arranged, a transparent substrate including a first through via provided in an opening formed in advance to extend through, an adhesive including a second through via connected to the first through via and configured to bond the semiconductor substrate and the transparent substrate while exposing the pixels, and an imaging lens unit arranged on the transparent substrate.

Claims (38)

1. A solid state image sensing device comprising:

a semiconductor substrate on which a plurality of pixels are arranged;

a transparent substrate including a first hole therein and including a first through via provided in the first hole;

an adhesive including a second hole therein, including a second through via provided in the second hole and connected to the first through via, and configured to bond the semiconductor substrate and the transparent substrate while exposing the pixels;

an imaging lens unit arranged on the transparent substrate;

a back redistribution layer arranged on a lower surface of the semiconductor substrate; and

a third through via electrically connected to the first through via, the second through via, and the back redistribution layer.

2. A solid-state image sensing device comprising:

a semiconductor substrate on which a plurality of pixels are arranged;

a transparent substrate including a first hole therein and including a first through via provided in the first hole;

an adhesive including a second hole therein, including a second through via provided in the second hole and connected to the first through via, and configured to bond the semiconductor substrate and the transparent substrate while exposing the pixels; and

an imaging lens unit arranged on the transparent substrate,

wherein the imaging lens unit has an auto focusing function of automatically focusing an image sensing target onto the pixels.

3. The device of claim 2 , wherein the imaging lens unit further includes:

a lens configured to focus the image sensing target onto the pixels;

an actuator configured to move the lens; and

a driver configured to control the actuator so as to control a focal length between the image sensing target and the lens.

4. The device of claim 3 , wherein the actuator includes one of a voice coil motor, a piezoelectric element, a shape memory alloy, a MEMS, and a liquid lens.

5. A solid state image sensing device comprising:

a semiconductor substrate on which a plurality of pixels are arranged;

a transparent substrate including a first hole therein and including a first through via provided in the first hole;

an adhesive including a second hole therein, including a second through via provided in the second hole and connected to the first through via, and configured to bond the semiconductor substrate and the transparent substrate while exposing the pixels;

an imaging lens unit arranged on the transparent substrate;

a back redistribution layer arranged on a lower surface of the semiconductor substrate; and

a third through via electrically connected to the first through via, the second through via, and the back redistribution layer,

wherein an interconnection layer to drive the pixels includes multilayered interconnections.

6. A solid-state image sensing device comprising:

a semiconductor substrate on which a plurality of pixels are arranged;

a transparent substrate including a first hole therein and including a first through via provided in the first hole;

an adhesive including a second hole therein, including a second through via provided in the second hole and connected to the first through via and configured to bond the semiconductor substrate and the transparent substrate while exposing the pixels;

an imaging lens unit arranged on the transparent substrate,

wherein an interconnection layer to drive the pixels includes multilayered interconnection, and

wherein the imaging lens unit has an auto focusing function of automatically focusing an image sensing target onto the pixels.

7. The device of claim 6 , wherein the imaging lens unit further includes:

a lens configured to focus the image sensing target onto the pixels;

an actuator configured to move the lens; and

a driver configured to control the actuator so as to control a focal length between the image sensing target and the lens.

8. The device of claim 7 , wherein the actuator includes one of a voice coil motor, a piezoelectric element, a shape memory alloy, a MEMS, and a liquid lens.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2011
From: KAWASAKI, ATSUKO; HAGIWARA, KENICHIRO; SEKINE, HIROKAZU
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 026920/0585 →
Priority Claims (1)
JP 2010-211431 · Sep 21, 2010 · national
Continuity (1)
Related Publication 20120068291A1 · Mar 22, 2012