CALIBRATION SYSTEM OF ELECTRONIC DEVICES

1 . A calibration system of electronic devices, comprising:

an electronic calibration device; and

an electronic device having a space configured to connect to the electronic calibration device;

wherein the electronic calibration device has a calibration parameter storage module configured to pre-store a first standard parameter of a plurality of calibration items of an electronic device.

2 . The calibration system of claim 1 , wherein the first standard parameter includes a first date.

3 . The calibration system of claim 2 , wherein the first date is an expiration date of the first standard parameter.

4 . The calibration system of claim 1 , wherein the electronic device comprises a second standard parameter having a second date.

5 . The calibration system of claim 4 , wherein the second date is a written date of the second standard parameter.

6 . The calibration system of claim 1 , wherein the space includes a parameter data transmitting interface configured to connect the electronic device.

7 . The calibration system of claim 1 , wherein the plurality of calibration items are selected based on the model of the electronic device.

8 . The calibration system of claim 1 , wherein the electronic device includes semiconductor equipment.

9 . The calibration system of claim 1 , wherein the electronic device further comprises a parameter data receiving module, a parameter data comparison module and a parameter data writing module.

10 . The calibration system of claim 9 , wherein the parameter data receiving module is configured to receive the first standard parameter data of the electronic device.

11 . The calibration system of claim 9 , wherein the parameter data comparison module is configured to compare the first date and the second date.

12 . The calibration system of claim 9 , wherein the parameter data writing module is configured to write the first standard parameter data and a written date into the electronic device.