IP Library › Granted Patent US 8,659,523
Granted Patent B2
US 8,659,523 · App. 13/243,034 · Granted Feb 25, 2014

Element substrate and light-emitting device

Inventors: Mitsuaki Osame (Kanagawa, JP); Aya Anzai (Kanagawa, JP); Yu Yamazaki (Tokyo, JP); Ryota Fukumoto (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 8,659,523
App. No.
13/243,034
Granted
Feb 25, 2014
Kind
B2
Abstract

A potential of a gate of a driving transistor is fixed, and the driving transistor is operated in a saturation region, so that a current is supplied thereto anytime. A current control transistor operating in a linear region is disposed serially with the driving transistor, and a video signal for transmitting a signal of emission or non-emission of the pixel is input to a gate of the current control transistor via a switching transistor.

Claims (60)

1. A semiconductor device comprising:

a light-emitting element;

a first transistor;

a second transistor; and

a third transistor,

wherein one of a source and a drain of the first transistor is electrically connected to the light-emitting element,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,

wherein a gate of the second transistor is electrically connected to one of a source and a drain of the third transistor,

wherein the other of the source and the drain of the third transistor is electrically connected to a first line,

wherein a gate of the first transistor is electrically connected to a second line,

wherein the other of the source and the drain of the second transistor is electrically connected to a third line,

wherein the third line comprises a conductive film,

wherein the conductive film overlaps with a channel formation region of the first transistor,

wherein the conductive film overlaps with a channel formation region of the second transistor,

wherein a semiconductor film comprises the channel formation region of the first transistor and the channel formation region of the second transistor, and

wherein a channel length of the first transistor is longer than a channel width of the first transistor.

2. The semiconductor device according to claim 1 , wherein the first transistor comprises silicon.

3. The semiconductor device according to claim 1 ,

wherein the light-emitting element, the first transistor, the second transistor and the third transistor are comprised in a first pixel, and

wherein the first line is electrically connected to a second pixel.

4. The semiconductor device according to claim 1 , wherein the semiconductor film has a winding shape.

5. The semiconductor device according to claim 4 , wherein the first transistor is a P-type transistor.

6. The semiconductor device according to claim 1 , wherein the second transistor is configured to operate in a linear area.

7. The semiconductor device according to claim 1 ,

wherein the light-emitting element comprises a first electrode, a light-emitting layer over the first electrode and a second electrode over the light-emitting layer,

wherein the light-emitting element is configured to pass light through the second electrode.

8. The semiconductor device according to claim 1 , wherein a ratio of the channel length to the channel width of the first transistor is 5 or more.

9. The semiconductor device according to claim 1 , wherein the first transistor is formed by using an SOI.

10. The semiconductor device according to claim 1 , further comprising a color filter over the light-emitting element.

11. A semiconductor device comprising:

a light-emitting element;

a first transistor;

a second transistor; and

a third transistor,

wherein one of a source and a drain of the first transistor is electrically connected to the light-emitting element,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,

wherein a gate of the second transistor is electrically connected to one of a source and a drain of the third transistor,

wherein the other of the source and the drain of the third transistor is electrically connected to a first line,

wherein a gate of the first transistor is electrically connected to a second line,

wherein the other of the source and the drain of the second transistor is electrically connected to a third line,

wherein the second line comprises a first conductive film,

wherein the third line comprises a second conductive film,

wherein the second conductive film overlaps with a channel formation region of the first transistor,

wherein the second conductive film overlaps with a channel formation region of the second transistor,

wherein the second conductive film overlaps with the first conductive film,

wherein a semiconductor film comprises the channel formation region of the first transistor and the channel formation region of the second transistor, and

wherein a channel length of the first transistor is longer than a channel width of the first transistor.

12. The semiconductor device according to claim 11 , wherein the first transistor comprises silicon.

13. The semiconductor device according to claim 11 ,

wherein the light-emitting element, the first transistor, the second transistor and the third transistor are comprised in a first pixel, and

wherein the first line is electrically connected to a second pixel.

14. The semiconductor device according to claim 11 , wherein the semiconductor film has a winding shape.

15. The semiconductor device according to claim 14 , wherein the first transistor is a P-type transistor.

16. The semiconductor device according to claim 11 , wherein the second transistor is configured to operate in a linear area.

17. The semiconductor device according to claim 11 ,

wherein the light-emitting element comprises a first electrode, a light-emitting layer over the first electrode and a second electrode over the light-emitting layer,

wherein the light-emitting element is configured to pass light through the second electrode.

18. The semiconductor device according to claim 11 , wherein a ratio of the channel length to the channel width of the first transistor is 5 or more.

19. The semiconductor device according to claim 11 , wherein the first transistor is formed by using an SOI.

20. The semiconductor device according to claim 11 , further comprising a color filter over the light-emitting element.

Priority Claims (3)
JP 2003-086500 · Mar 26, 2003 · national
JP 2003-139560 · May 16, 2003 · national
JP 2003-174134 · Jun 18, 2003 · national
Continuity (2)
Continuation 10807545 · Mar 24, 2004
Related Publication 20120032199A1 · Feb 9, 2012