IP Library Granted Patent US 9,076,642
Granted Patent B2
US 9,076,642 · App. 13/244,466 · Granted Jul 7, 2015

High-Throughput batch porous silicon manufacturing equipment design and processing methods

Inventors: Takao Yonehara (Sunnyvale, CA); Subramanian Tamilmani (San Jose, CA); Karl-Josef Kramer (San Jose, CA); Jay Ashjaee (Cupertino, CA); Mehrdad M. Moslehi (Los Altos, CA); Yasuyoshi Miyaji (Kyoto, JP); Noriyuki Hayashi (Kyoto, JP); Takamitsu Inahara (Kyoto, JP)
Assignee: Solexel, Inc.
H01L21/0203C25D11/32C25D11/005H01L21/67086H01L31/1804Y02E10/547
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Quick Facts
Patent No.
US 9,076,642
App. No.
13/244,466
Granted
Jul 7, 2015
Kind
B2
Abstract

This disclosure enables high-productivity fabrication of porous semiconductor layers (made of single layer or multi-layer porous semiconductors such as porous silicon, comprising single porosity or multi-porosity layers). Some applications include fabrication of MEMS separation and sacrificial layers for die detachment and MEMS device fabrication, membrane formation and shallow trench isolation (STI) porous silicon (using porous silicon formation with an optimal porosity and its subsequent oxidation). Further, this disclosure is applicable to the general fields of photovoltaics, MEMS, including sensors and actuators, stand-alone, or integrated with integrated semiconductor microelectronics, semiconductor microelectronics chips and optoelectronics.

Claims (34)

1. A bath-in-bath apparatus for producing porous semiconductor on a plurality of semiconductor wafers, comprising:

an electrolyte-filled outer housing;

an electrolyte-filled inner housing affixed within said outer housing, said inner housing operable to open and close, and forming a seal when closed;

an anode disposed at a first end of said inner housing;

a cathode disposed at an opposite end of said inner housing, said anode and said cathode coupled to electrical circuitry capable of providing an electrical power comprising electrical voltage and current;

a plurality of semiconductor wafers arranged between said anode and said cathode, wherein each said wafer is held in place by a perimeter wafer clamp disposed around a perimeter of said wafer, said perimeter wafer clamp allowing substantially all of a front and a back surface of each said wafer exposure to said electrolyte;

a plurality of vent ports in said inner housing for allowing evolved hydrogen gas to escape, said vent ports extending beyond a surface of said electrolyte to prevent current leakage through said vent ports; and

a plurality of fluid fill ports in said inner housing for replenishing said electrolyte and sweeping said hydrogen gas away from said plurality of wafers.

2. The apparatus of claim 1 , further comprising a conductive anode membrane separating said anode from said plurality of semiconductor wafers.

3. The apparatus of claim 1 , further comprising a conductive cathode membrane separating said cathode from said plurality of semiconductor wafers.

4. The apparatus of claim 1 , wherein said circuitry is operable to produce a graded porosity layer of porous semiconductor on said plurality of semiconductor wafers.

5. The apparatus of claim 1 , wherein said circuitry is operable to produce a multilayer of porous semiconductor on said plurality of semiconductor wafers, said multilayer comprising discrete layers of porous semiconductor having distinct porosities.

6. The apparatus of claim 1 , wherein said electrical circuitry is operable to produce a porous semiconductor layer on both sides of each of said plurality of semiconductor wafers.

7. An apparatus for producing porous semiconductor on a plurality of semiconductor wafers, comprising:

an electrolyte-filled housing, said housing operable to open and close, and forming a seal when closed;

an anode disposed at a first end of said housing;

a cathode disposed at an opposite end of said housing, said anode and said cathode coupled to electrical circuitry capable of providing an electrical power comprising electrical voltage and current;

a plurality of semiconductor wafers arranged between said anode and said cathode, wherein each said wafer is held in place by a perimeter wafer clamp disposed around a perimeter of said wafer, said perimeter wafer clamp allowing substantially all of a front and a back surface of each said wafer exposure to said electrolyte;

a plurality of vent ports in said housing for allowing evolved hydrogen gas to escape; and

a plurality of fluid fill ports in said housing for replenishing said electrolyte and sweeping said hydrogen gas away from said plurality of wafers.

8. The apparatus of claim 7 , further comprising a conductive anode membrane separating said anode from said plurality of semiconductor wafers.

9. The apparatus of claim 7 , further comprising a conductive cathode membrane separating said cathode from said plurality of semiconductor wafers.

10. The apparatus of claim 7 , wherein said electrical circuitry is operable to produce a graded porosity layer of porous semiconductor on said plurality of semiconductor wafers.

11. The apparatus of claim 7 , wherein said circuitry is operable to produce a multilayer of porous semiconductor on said plurality of semiconductor wafers, said multilayer comprising discrete layers of porous semiconductor having distinct porosities.

12. The apparatus of claim 7 , wherein said circuitry is operable to produce a porous semiconductor layer on both sides of each of said plurality of semiconductor wafers.

13. The apparatus of claim 1 , further comprising a loading and unloading mechanism for transferring batches of said semiconductor wafers into and out of said inner housing.

14. The apparatus of claim 1 , wherein said semiconductor wafers are circular shaped.

15. The apparatus of claim 1 , wherein said semiconductor wafers are square shaped.

16. The apparatus of claim 1 , wherein said semiconductor wafers are crystalline silicon wafers.

17. The apparatus of claim 1 , wherein said inner housing may open in multiple sections.

18. The apparatus of claim 7 , wherein said semiconductor wafers are circular shaped.

19. The apparatus of claim 7 , wherein said semiconductor wafers are square shaped.

20. The apparatus of claim 7 , wherein said semiconductor wafers are crystalline silicon wafers.

21. The apparatus of claim 7 , wherein said electrolyte-filled housing may open in multiple sections.

Assignments (10)
SECURITY INTEREST Recorded Nov 12, 2024
From: TRUTAG TECHNOLOGIES, INC.
To: KUMUKAHI HOLDINGS, INC.
Reel/Frame 069240/0893 →
NON-RECOURSE ASSIGNMENT OF INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Oct 1, 2024
From: FIRST-CITIZENS BANK & TRUST COMPANY
To: KUMUKAHI HOLDINGS, INC.
Reel/Frame 069083/0367 →
SECURITY INTEREST Recorded Dec 26, 2023
From: TRUTAG TECHNOLOGIES, INC.
To: FIRST-CITIZENS BANK & TRUST COMPANY
Reel/Frame 066140/0667 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2017
From: OB REALTY, LLC
To: TRUTAG TECHNOLOGIES, INC.
Reel/Frame 044920/0495 →
ASSIGNMENT OF LOAN DOCUMENTS Recorded Sep 29, 2017
From: OPUS BANK
To: OB REALTY, LLC
Reel/Frame 044062/0383 →
CHANGE OF NAME Recorded Jul 28, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043367/0649 →
RECORDATION OF FORECLOSURE OF PATENT PROPERTIES Recorded Jul 27, 2017
From: OB REALTY, LLC
To: OB REALTY, LLC
Reel/Frame 043350/0822 →
CHANGE OF NAME Recorded Jul 26, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043342/0439 →
SECURITY INTEREST Recorded Jan 7, 2015
From: SOLEXEL, INC.
To: OPUS BANK
Reel/Frame 034731/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2014
From: YONEHARA, TAKAO; TAMILMANI, SUBRAMANIAN; KRAMER, KARL-JOSEF; ASHJAEE, JAY; MOSLEHI, MEHRDAD M.; MIYAJI, YASUYOSHI; HAYASHI, NORIYUKI; INAHARA, TAKAMITSU
To: SOLEXEL, INC.
Reel/Frame 034552/0623 →
Continuity (4)
Continuation In Part 12688495 · Jan 15, 2010
Continuation In Part 12774667 · May 5, 2010
Provisional Application 61386318 · Sep 24, 2010
Related Publication 20130180847A1 · Jul 18, 2013