Mold design and semiconductor package
View Patent ↗A chip package includes a carrier having a first and a second major surface. The first major surface includes an active region surrounded by an inactive region. The chip package includes contact pads in the active region for mating with chip contacts of a chip. A support structure is disposed on the inactive region of the first major surface. The support structure forms a dam that surrounds the active region. When a chip or chip stack is mounted in the active region, spacing exists between the dam and the chip or chip stack. The spacing creates convention paths for heat dissipation.
1. A chip package comprising:
a carrier having a first and a second major surface, wherein the first major surface comprises an active region surrounded by an inactive region;
contact pads in the active region for mating with chip contacts of a chip;
a support structure disposed on the inactive region of the first major surface, wherein
the support structure forms a dam surrounding the active region, and
inner sidewalls of the dam comprise a stepped profile; and
when a chip or a chip stack is mounted in the active region, spacing exists between the dam and the chip or chip stack, wherein the spacing creates convection paths to dissipate heat; and
at least one chip stabilizer in the spacing, wherein the chip stabilizer contacts the chip or chip stack and dam to stabilize the chip or chip stack without completely filling the spacing to maintain the convection paths to dissipate heat.
2. The chip package of claim 1 wherein an upper portion of the inner sidewalls of the dam is provided with a step for accommodating a lid.
3. The chip package of claim 2 comprises when a chip or chip stack is mounted:
a lid being attached to a step of the stepped profile of the dam covering the spacing and chip or chip stack.
4. The chip package of claim 1 wherein the inner sidewalls of the dam comprise a slanted profile.
5. The chip package of claim 4 wherein the dam includes a top surface and a bottom surface which is wider than the top surface and the bottom surface of the dam is disposed on the inactive region of the carrier.
6. The chip package of claim 1 further comprises a chip being mounted in the active region.
7. The chip package of claim 1 further comprises a chip stack comprising n number of chips disposed in the active region.
8. The chip package of claim 7 wherein the chip stack is arranged such that
a n th chip is stacked on top of a n th −1 chip, and
contacts of the n th chip are coupled to contact pads on a top surface of the n th −1 chip.
9. The chip package of claim 1 includes a plurality of chip stabilizers, wherein the chip stabilizers are disposed in the spacing at corners of the dam and chip or chip stack.
10. A method of packaging comprising:
providing a carrier having a first and a second major surface, wherein the first major surface comprises an active region surrounded by an inactive region;
providing contact pads in the active region for mating with chip contacts of a chip;
providing a support structure on the inactive region of the first major surface, wherein the support structure forms a dam surrounding the active region, the inner sidewalls of the dam comprise a stepped profile and provides spacing around a chip between the dam and the chip to create convection paths to dissipate heat when the chip is mounted in the active region; and
providing at least one chip stabilizer in the spacing, wherein the chip stabilizer contacts the chip and dam to stabilize the chip without completely filling the spacing to maintain the convection paths to dissipate heat.
11. The method of claim 10 further comprises providing a chip in the active region.
12. The method of claim 10 further comprises forming a chip stack having n number of chips in the active region.
13. The method of claim 12 wherein forming the chip stack includes:
stacking a n th chip on top of a n th −1 chip; and
contacts of the n th chip are coupled to contact pads on a top surface of the n th −1 chip.
14. The method of claim 10 wherein the inner sidewalls of the dam comprise a slanted profile.
15. The method of claim 14 wherein the dam includes a top surface and a bottom surface which is wider than the top surface and the bottom surface of the dam is provided on the inactive region of the carrier.
16. A chip package comprising:
a carrier having a first and a second major surface, wherein the first major surface comprises an active region surrounded by an inactive region;
contact pads in the active region for mating with chip contacts of a chip;
a support structure disposed on the inactive region of the first major surface, wherein the support structure forms a dam surrounding the active region, wherein
inner sidewalls of the dam comprise a slanted profile,
a bottom surface of the dam is wider than a top surface of the dam, and the bottom surface of the dam is disposed on the inactive region of the carrier; and
when a chip or a chip stack is mounted in the active region, spacing exists between the dam and the chip or chip stack, wherein the spacing creates convection paths to dissipate heat.
17. The chip package of claim 16 comprises at least one chip stabilizer in the spacing, wherein the chip stabilizer contacts the chip or chip stack and dam to stabilize the chip or chip stack without completely filling the spacing to maintain the convection paths to dissipate heat.
18. The chip package of claim 16 further comprises a chip being mounted in the active region.
19. The chip package of claim 16 further comprises a chip stack comprising n number of chips disposed in the active region.
20. The chip package of claim 16 wherein the inner sidewalls of the dam comprise a stepped profile.