IP Library Granted Patent US 8,935,981
Granted Patent B2
US 8,935,981 · App. 13/245,288 · Granted Jan 20, 2015

High contrast alignment marks through multiple stage imprinting

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,935,981
App. No.
13/245,288
Granted
Jan 20, 2015
Kind
B2
Abstract

Two-stage imprinting techniques capable of protecting fine patterned features of an imprint lithography template are herein described. In particular, such techniques may be used during fabrication of recessed high-contrast alignment marks for preventing deposited metal layers from coming into contact with fine features etched into the template.

Claims (39)

1. A method of fabricating a template having high-contrast alignment marks comprising the steps of:

(a) providing a template having a surface having an alignment area and a fine feature area, each such area having a plurality of protrusions and recessions;

(b) forming a first layer on the fine feature area;

(c) depositing high contrast material on the alignment area and the formed first layer;

(d) forming a second layer over the deposited high contrast material

(e) removing a portion of the second layer such that a remaining portion of the second layer remains in the recessions of the alignment area;

(f) removing a portion of the high contrast material such that a remaining portion of the high contrast material remains in the recessions of the alignment area;

(g) removing the first layer from the fine feature area together with the remaining portion of the second layer from the recessions of the alignment area.

2. The method of claim 1 wherein the first layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

3. The method of claim 1 wherein forming the first layer further comprises:

forming a precursor layer over both the fine feature and alignment areas, with the precursor layer having a first thickness over the fine feature area and a second thickness over the alignment area and where the first thickness is greater than the second thickness;

removing a portion of the precursor layer such that the alignment area is exposed while a remaining portion of the precursor layer remains over fine feature area and defines the first formed layer.

4. The method of claim 3 wherein the precursor layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

5. The method of claim 3 wherein the removing the precursor layer portion further comprises a descum etch step.

6. The method of claim 1 wherein the second formed layer is planarized.

7. The method of claim 1 wherein the second layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

8. The method of claim 1 wherein the removing the second layer portion further comprises a descum etch step.

9. The method of claim 1 wherein the removing of the high contrast material step further comprises a reactive ion etching (RIE) step.

10. The method of claim 1 wherein the removing the first layer further comprises a descum etch step.

11. A method of fabricating a template having high-contrast alignment marks comprising the steps of:

(a) providing a template having a surface having an alignment area and a fine feature area, each such area having a plurality of protrusions and recessions;

(b) forming a first layer on the fine feature area by dispensing a polymerizable material on the fine feature area of the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material;

(c) depositing high contrast material on the alignment area and the formed first layer;

(d) forming a second planarized layer over the deposited high contrast material;

(e) removing a portion of the second layer such that a remaining portion of the second layer remains in the recessions of the alignment area;

(f) removing a portion of the high contrast material such that a remaining portion of the high contrast material remains in the recessions of the alignment area; and

(g) removing the first layer from the fine feature area together with the remaining portion of the second layer from the recessions of the alignment area.

12. The method of claim 11 wherein the second layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

13. A method of fabricating a template having high-contrast alignment marks comprising the steps of:

(a) providing a template having a surface having an alignment area and a fine feature area, each such area having a plurality of protrusions and recessions;

(b) forming a precursor layer over both the fine feature and alignment areas, with the precursor layer having a first thickness over the fine feature area and a second thickness over the alignment area and where the first thickness is greater than the second thickness;

(c) removing a portion of the precursor layer such that the alignment area is exposed and a remaining portion of the precursor layer defining a first formed layer remains over fine feature area;

(d) depositing high contrast material on the alignment area and the formed first layer;

(e) forming a second planarized layer over the deposited high contrast material

(f) removing a portion of the second layer such that a remaining portion of the second layer remains in the recessions of the alignment area;

(g) removing a portion of the high contrast material such that a remaining portion of the high contrast material remains in the recessions of the alignment area; and

(h) removing the first layer from the fine feature area together with the remaining portion of the second layer from the recessions of the alignment area.

14. The method of claim 13 wherein the precursor layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

15. The method of claim 13 wherein the second layer is formed by dispensing a polymerizable material on the template surface, contacting the polymerizable material with an imprint lithography template, and solidifying the polymerizable material.

Assignments (7)
ASSIGNMENT OF SECURITY INTEREST IN PATENTS Recorded Nov 7, 2019
From: JPMORGAN CHASE BANK, N.A.
To: CITIBANK, N.A.
Reel/Frame 050967/0138 →
PATENT SECURITY AGREEMENT Recorded Aug 22, 2019
From: MAGIC LEAP, INC.; MOLECULAR IMPRINTS, INC.; MENTOR ACQUISITION ONE, LLC
To: JP MORGAN CHASE BANK, N.A.
Reel/Frame 050138/0287 →
CONFIRMATORY ASSIGNMENT OF JOINT PATENT OWNERSHIP Recorded Apr 27, 2015
From: CANON NANOTECHNOLOGIES, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 035507/0559 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2014
From: MOLECULAR IMPRINTS, INC.
To: CANON NANOTECHNOLOGIES, INC.
Reel/Frame 033733/0950 →
CHANGE OF NAME Recorded Jul 30, 2014
From: MII NEWCO, INC.
To: MOLECULAR IMPRINTS, INC.
Reel/Frame 033449/0684 →
CHANGE OF NAME Recorded Jul 24, 2014
From: MOLECULAR IMPRINTS, INC.
To: CANON NANOTECHNOLOGIES, INC.
Reel/Frame 033400/0184 →
ASSIGNMENT OF JOINT OWNERSHIP Recorded Jul 15, 2014
From: MOLECULAR IMPRINTS, INC.
To: MII NEWCO, INC.
Reel/Frame 033329/0280 →