IP Library Patent Application 13245888
Patent Application
App. No. 13/245,888

METHOD OF REDUCING POWER LEAKAGE OF INTEGRATED CIRCUIT

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Patent No.
US None
App. No.
13/245,888
Abstract

A method and system for performing power leakage reduction for an integrated circuit (IC) in a Virtual Multi-mode Multi-corner set up. Multiple view of the IC design data are analyzed in parallel to determine which low threshold voltage cells (LTVC) may be replaced with high threshold voltage cells (HVTC). A second analysis is performed that combines the analyses of each of the analyzed views and the IC design data is updated, where all of the LTVCs having positive slack time in all of the plurality of views are replaced with HTVCs.

Claims (32)

1 . A method of reducing power leakage in an integrated circuit (IC) design defined by IC design data, the IC having a Virtual Multi-Mode Multi-Corner (Virtual MMMC) set up, the method comprising:

providing IC design data to each of a plurality of computing resources, wherein the IC defined by the design data is capable of operating in a number of modes and the IC may be manufactured having a plurality of design corners, wherein each mode and each corner comprises a view;

performing a plurality of first analyses of the design data using the plurality of computing resources, wherein each computer resource analyzes a different view of the IC and generates separate view data;

performing a second analysis based on the plurality of first analyses using a final computing resource, wherein the final computing resource analyzes all of the separate view data and swaps at least one low voltage threshold cell with a high voltage threshold cell; and

updating the IC design data based on the second analysis, the updated design data including the at least one swapped cell.

2 . The method of claim 1 , wherein the final computer resource comprises a randomly selected one of the plurality of computer resources.

3 . The method of claim 1 , wherein each of the plurality of first analyses comprises performing a first timing analysis.

4 . The method of claim 3 , wherein the first timing analysis comprises identifying one or more low threshold voltage cells of the IC having positive slack time.

5 . The method of claim 4 , further comprising swapping at least one of the one or more low threshold voltage cells having positive slack time with a high threshold voltage cell and saving as new view design data.

6 . The method of claim 5 , wherein the swapping is performed in a burst mode, wherein the burst mode comprises substantially simultaneously swapping a plurality of low voltage threshold cells with high voltage threshold cells.

7 . The method of claim 5 , further comprising performing a second timing analysis on the new view design data.

8 . The method of claim 7 , further comprising reverting the swapping of the at least one low voltage threshold cell if the swapping causes the second timing analysis to fail.

9 . The method of claim 8 , wherein in the second analysis, the at least one swapped low threshold voltage cell has positive slack time in each of the plurality of views.

10 . The method of claim 1 , wherein swapping the at least one low threshold cell is performed at a mask layer of the integrated circuit.

11 . A computer implemented system for performing power leakage optimization for an integrated circuit in a Virtual Multi-Mode Multi-Corner (Virtual MMMC) set up, the system comprising:

a generating module configured for generating design data for the integrated circuit;

a plurality of primary modules configured for performing a plurality of first analyses, wherein each of the plurality of first analyses is performed using a separate and independent primary module of the plurality of primary modules; and

a secondary module configured for performing a second analysis based on the plurality of first analyses.

12 . The system of claim 10 , wherein the view module generates a view of the integrated circuit based on the design data, wherein the view comprises one of a mode, a corner, and a combination of a mode and a corner of the integrated circuit.

13 . The system of claim 12 , wherein the analysis module performs a timing analysis and provides timing data to the swapping module.

14 . The system of claim 12 , wherein the swapping module swaps low threshold voltage cells and higher threshold voltage cells of the integrated circuit based on the timing data.

15 . The system of claim 11 , wherein the secondary module comprises an input module, an operation module, and a recovery module.

16 . The system of claim 15 , wherein the input module transfers the timing data and swap information received from the analysis module and swapping module respectively to the operation module.

17 . The system of claim 15 , wherein the operation module provides recovery information to the recovery module based on intersection and union operations performed on the timing data and swap information.

18 . The system of claim 15 , wherein the recovery information comprises a list of cells having positive slack time in all of the views.

19 . The system of claim 18 , wherein the recovery module recovers all of the cells in the list.

20 . A computer program product for use with a computer, the computer program product comprising a non-transitory computer usable medium having a computer readable program code embodied therein for performing power leakage optimization for an integrated circuit in a Virtual Multi-Mode Multi-Corner (Virtual MMMC) set up, the computer readable program code having instructions for:

generating design data for the integrated circuit having a plurality of modes and a plurality of corners, wherein generating the design data comprises generating a plurality of views of the integrated circuit;

providing the design data to each of a plurality of computing resources;

performing a plurality of first analyses of the design data using the plurality of computing resources, wherein each of the plurality of first analyses is performed by a separate and independent computing resource randomly selected from the plurality of computing resources;

performing a second analysis based on the plurality of first analyses using a final computing resource, wherein the final computing resource is randomly selected from the plurality of computing resources; and

recovering at least one low threshold voltage cell of a plurality of cells of the integrated circuit based on the second analysis.

Assignments (27)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2011
From: SINGH, HANS RAJ
To: FREESCALE SEMICONDUCTOR, INC.
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