Microscope, in particular laser scanning microscope
Microscope, particularly laser scanning microscope, for optical detection of light radiation excited in a specimen, having a detection beam path for detecting spectral components of the light radiation in a plurality of detection channels, wherein the light radiation arrives at a variable longpass filter or shortpass filter from which reflected and/or transmitted components are reflected back with a parallel offset, and the latter arrive at a detector after at least one back-reflection of this kind.
1. A microscope for optical detection of light radiation excited in a specimen, comprising:
a detection beam path for detecting spectral wavelength components of the light radiation in a plurality of detection channels;
a longpass filter or shortpass filter arranged in the detection beam path, said longpass filter or shortpass filter being changeable with respect to the wavelength components it reflects and transmits;
at least one reflector configured to generate a parallel offset of either a reflected radiation a back-reflection or both in the direction of the longpass filter or shortpass filter for the reflected or transmitted wavelength component; and
wherein detectors are configured to receive the wavelength components reflected or transmitted by the longpass filter or shortpass filter after at least one back-reflection and a further reflection or transmission through said longpass or shortpass filter.
2. The microscope according to claim 1 ;
wherein the longpass filter or shortpass filter is a variable edge filter which has different splitting into transmitted wavelength components and reflected wavelength components along its longitudinal extension.
3. The microscope according to claim 1 ;
wherein the longpass filter or shortpass filter has a variable cut-off wavelength along its profile which determines a ratio of wavelength components which are reflected to the wavelength components which are transmitted.
4. The microscope according to claim 3 ;
wherein the longpass filter or shortpass filter is displaceable along the direction of the variable cut-off wavelength.
5. The microscope according to claim 1 ;
wherein at least one reflector is displaceable perpendicular to the incident direction of the light.
6. The microscope according to claim 5 ;
wherein a displaceable detector is displaced to as to be coupled with the reflector.
7. The microscope according to claim 1 ;
wherein the reflector is a roof prism or roof mirror.
8. The microscope according to claim 1 ;
wherein the longpass filter or shortpass filter is a variable edge filter which has different splitting into transmitted wavelength components and reflected wavelength components along its longitudinal extension.
9. The microscope according to claim 1 ;
wherein the longpass filter or shortpass filter has a variable cut-off wavelength along its profile which determines a ratio of wavelength components which are reflected to the wavelength components which are transmitted.
10. The microscope according to claim 9 ;
wherein longpass filter or shortpass the filter is displaceable along the direction of the variable cut-off wavelength.
11. The microscope according to claim 1 ;
wherein at least one reflector is displaceable perpendicular to the incident direction of the light.
12. The microscope according to claim 11
wherein a displaceable detector is displaced so as to be coupled with the reflector.
13. The microscope according to claim 1 ;
wherein the reflector is a roof prism or roof mirror.