Near field optical microscope
The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.
1. A device for the near-field optical measurement of a specimen comprising a probe, a primary mirror ( 10 ), which is a concave mirror, and at least two secondary mirror(s) ( 30 ), wherein each one of the secondary mirrors ( 30 ) is located in an independent optical pathway, whereby each one independent optical pathway starts at the probe and passes the primary mirror ( 10 ) and the secondary mirror ( 30 ), each one of the secondary mirrors ( 30 ) is the first mirror located in the respective independent optical pathway downwards the primary mirror ( 10 ), whereby the optical pathways start at the probe and pass the primary mirror ( 10 ), and the secondary mirrors ( 30 ) are arranged such that the parts of different independent optical pathways that are located downwards the secondary mirrors ( 30 ) are not parallel to each other, whereby the independent optical pathways start at the probe and pass the primary mirror ( 10 ) and the respective secondary mirror ( 30 ).
2. A device for the near-field optical measurement of a specimen comprising a probe, a primary mirror ( 10 ), which is a concave mirror, and one or more secondary mirror(s) ( 30 ), wherein each one of the secondary mirrors ( 30 ) is located in an independent optical pathway, whereby each one independent optical pathway starts at the probe and passes the primary mirror ( 10 ) and the secondary mirror ( 30 ), each one of the secondary mirrors ( 30 ) is the first mirror located in the respective independent optical pathway downwards the primary mirror ( 10 ), whereby the optical pathways start at the probe and pass the primary mirror ( 10 ), and at least one of the secondary mirrors ( 30 ) is arranged such that the distance of the edge of the secondary mirror ( 32 ) to the probe is less or equal to about half the focal distance of the primary mirror ( 10 ).
3. The device according to claim 2 , wherein the secondary mirrors ( 30 ) are arranged such that the parts of different independent optical pathways that are located downwards of the secondary mirrors ( 30 ) are not parallel to each other, whereby the independent optical pathways start at the probe and pass the primary mirror ( 10 ) and the respective secondary mirror ( 30 ).
4. The device according to claim 1 , wherein the at least two independent optical pathways are reflected on the primary mirror ( 10 ) at different areas of the primary mirror.
5. The device according to claim 1 , wherein the at least two independent optical pathways do not overlap except at the probe.
6. The device according to claim 1 , wherein the secondary mirrors ( 30 ) are planar mirrors.
7. The device according to claim 1 , wherein the primary mirror ( 10 ) is a parabolic mirror.
8. The device according to claim 1 , wherein the secondary mirrors ( 30 ) are arranged such that the parts of the independent optical pathways that are located downwards the secondary mirrors, form an angle of about 20° to about 180°.
9. The device according to claim 1 , wherein the probe or a holder of the probe is located substantially between two of the secondary mirrors ( 30 ).
10. The device according to claim 1 , wherein said device has two secondary mirrors ( 30 ).
11. The device according to claim 1 , wherein the distance from the centre of the reflective area of the secondary mirror(s) ( 30 ) to the focal point of the primary mirror ( 10 ) is less than about four times the focal distance of the primary mirror ( 10 ).
12. A method for scanning the optical near-field of a specimen, comprising the step of analyzing the specimen using the device according to claim 1 .
13. The device according to claim 1 , wherein the distance from the centre of the reflective area of the secondary mirror(s) ( 30 ) to the focal point of the primary mirror ( 10 ) is less than about two times the focal distance of the primary mirror ( 10 ).