Method and apparatus for processing bad pixels
A technique for processing at least one bad pixel occurring in an image sensing system is provided. Dynamic bad pixel detection is performed on a plurality of streaming pixels taking from at least one controlled image and value and coordinate information for each bad pixel is subsequently stored as stored bad pixel information. Thereafter, static bad pixel correction may be performed based on the stored bad pixel information. The stored bad pixel information may be verified based on histogram analysis performed on the plurality of streaming pixels. The technique for processing bad pixels in accordance with the present invention may be embodied in suitable circuitry or, more broadly, within devices incorporating image sensing systems.
1. A method of processing one or more bad pixels in an imaging system, the method comprising:
performing a dynamic bad pixel detection process on a plurality of pixels from at least one image to detect the one or more bad pixels;
storing value and coordinate information only for each one of the one or more bad pixels detected by the dynamic bad pixel detection process to provide stored bad pixel information;
performing histogram analysis on the plurality of pixels to determine histogram data;
determining, based on the histogram data, a number of histogram-based pixels corresponding to at least one substantially white pixel bin;
determining, based on the stored bad pixel information, a number of bad pixels corresponding to the at least one substantially white pixel bin; and
comparing the number of histogram-based pixels corresponding to the at least one substantially white pixel bin with the number of bad pixels corresponding to the at least one substantially white pixel bin to verify the stored bad pixel information.
2. The method of claim 1 , further comprising:
performing static bad pixel correction only on the one or more bad pixels detected by the dynamic bad pixel detection process based on the stored bad pixel information.
3. The method of claim 1 , wherein performing static bad pixel correction comprises performing static bad pixel correction on images subsequent to the at least one image based on the stored bad pixel information.
4. The method of claim 1 , wherein performing histogram analysis further comprises determining that the histogram data is valid when there is at least one empty bin occurring between at least one substantially white pixel bin and a histogram mean bin.
5. The method of claim 1 , further comprising:
when the number of histogram-based pixels corresponding to the at least one substantially white pixel bin compares favorably with the number of bad pixels corresponding to the at least one substantially white pixel bin, verifying the stored bad pixel information.
6. The method of claim 5 , further comprising:
obtaining a zero exposure image to provide the at least one image.
7. The method of claim 1 , further comprising:
obtaining at least two non-zero exposure images to provide the at least one image, wherein exposure of each non-zero exposure image is greater than exposure of previous non-zero exposure images.
8. A circuit for processing one or more bad pixels in an image system, the circuit comprising:
a dynamic bad pixel detection component operative to perform dynamic bad pixel detection process on a plurality of pixels from at least one image to detect the one or more bad pixels and to determine value and coordinate information for each one of the one or more bad pixels;
a bad pixel information storage component, coupled to the dynamic bad pixel detection component, operative to store the value and coordinate information only for each one of the one or more bad pixels detected by the dynamic bad pixel detection process as stored bad pixel information;
a histogram analysis component operative to receive the plurality of pixels and to determine histogram data based on the plurality of pixels;
a comparison component coupled to the bad pixel information storage component and the histogram analysis component operative to:
determine, based on the histogram data, a number of histogram-based pixels corresponding to at least one substantially white pixel bin;
determine, based on the stored bad pixel information, a number of bad pixels corresponding to the at least one substantially white pixel bin; and
when the number of histogram-based pixels corresponding to the at least one substantially white pixel bin compares favorably with the number of bad pixels corresponding to the at least one substantially white pixel bin, verify the stored bad pixel information.
9. The circuit of claim 8 , further comprising:
a static bad pixel correction component, coupled to the bad pixel information storage component, operative to perform static bad pixel correction only on the one or more bad pixels detected by the dynamic bad pixel detection process based on the stored bad pixel information.
10. A device comprising:
at least one image sensor that provides at least one image comprising a plurality of pixels; and
a processing circuit, in communication with the at least one image sensor, operative to perform dynamic bad pixel detection process on the plurality of pixels to detect one or more bad pixels, to determine value and coordinate information for each one of the one or more bad pixels, to store the value and coordinate information only for each one of the one or more bad pixels detected by the dynamic bad pixel detection as stored bad pixel information, to perform histogram analysis based on the plurality of pixels to provide histogram data, to determine, based on the histogram data, a number of histogram-based pixels corresponding to at least one substantially white pixel bin, to determine, based on the stored bad pixel information, a number of bad pixels corresponding to the at least one substantially white pixel bin, and when the number of histogram-based pixels corresponding to the at least one substantially white pixel bin compares favorably with the number of bad pixels corresponding to the at least one substantially white pixel bin, verify the stored bad pixel information.
11. The device of claim 10 , wherein the processing circuit is further operative to perform static bad pixel correction only on the one or more bad pixels detected by the dynamic bad pixel detection process based on the stored bad pixel information to provide at least one corrected pixel.
12. The device of claim 10 , further comprising:
a display, in communication with the processing circuit, operative to display the at least one corrected pixel.
13. A circuit for processing one or more bad pixels in an imaging system, the circuit comprising:
means for performing dynamic bad pixel detection on a plurality of pixels from at least one image to detect the one or more bad pixels;
means for storing value and coordinate information only for each one of the one or more bad pixels detected by the dynamic bad pixel detection to provide stored bad pixel information;
means for performing histogram analysis on the plurality of pixels to determine histogram data;
means for determining, based on the histogram data, a number of histogram-based pixels corresponding to at least one substantially white pixel bin;
means for determining, based on the stored bad pixel information, a number of bad pixels corresponding to the at least one substantially white pixel bin; and
means for comparing the number of histogram-based pixels corresponding to the at least one substantially white pixel bin with the number of bad pixels corresponding to the at least one substantially white pixel bin to verify the stored bad pixel information.
14. A method of processing one or more bad pixels in an imaging system, the method comprising:
obtaining stored bad pixel information, wherein the stored bad pixel information is based on at least one image;
obtaining histogram data, wherein the histogram data is based on the at least one image; and
verifying the stored bad pixel information when a number of histogram-based pixels, as determined using the histogram data, corresponding to at least one substantially white pixel bin compares favorably with a number of bad pixels, as determined using the stored bad pixel information, corresponding to the at least one substantially white pixel bin.
15. A circuit for processing one or more bad pixels in an imaging system, the circuit comprising:
a bad pixel information storage component operative to store bad pixel information for each one of one or more bad pixels; and
a histogram analysis component operative to obtain stored bad pixel information from the bad pixel information storage component, wherein the stored bad pixel information is based on at least one image, obtain histogram data, wherein the histogram data is based on the at least one image, and verify the stored bad pixel information when a number of histogram-based pixels, as determined using the histogram data, corresponding to at least one substantially white pixel bin compares favorably with a number of bad pixels, as determined using the stored bad pixel information, corresponding to the at least one substantially white pixel bin.
16. A circuit for processing one or more bad pixels in an imaging system, the circuit comprising:
means for obtaining stored bad pixel information, wherein the stored bad pixel information is based on at least one image;
means for obtaining histogram data, wherein the histogram data is based on the at least one image; and
means for verifying the stored bad pixel information when a number of histogram-based pixels, as determined using the histogram data, corresponding to at least one substantially white pixel bin compares favorably with a number of bad pixels, as determined using the stored bad pixel information, corresponding to the at least one substantially white pixel bin.