Parameter matching hotspot detection

1. A method of hotspot determination, comprising:

receiving layout data for a layout design;

extracting, using a computer, a netlist from the layout design;

classifying devices in the netlist into device groups based on values for one or more device parameters derived from the layout data, the one or more device parameters describing one or more physical parameters of the devices corresponding to electrical information for the devices in the device groups;

determining hotspots based on the electrical information for the device groups; and

storing information of the hotspots in a tangible medium.

2. The method recited in claim 1 , further comprising:

generating physical verification rules based on the information of the hotspots.

3. The method recited in claim 1 , further comprising:

correcting the hotspots.

4. The method recited in claim 1 , further comprising:

generating schematic design recommendations based on the information of the hotspots.

5. The method recited in claim 1 , wherein the devices are transistors.

6. The method recited in claim 1 , wherein the one or more device parameters are selected based on electrical properties of interest.

7. The method recited in claim 1 , wherein the one or more physical parameters comprises one or more physical parameters selected from channel width, channel length, SA parameter, or SB parameter.

8. The method recited in claim 1 , wherein the determining hotspots comprises:

selecting a reference device for each of the device groups;

determining representative electrical information for the reference device for each of the device groups; and

identifying hotspots based on the representative electrical information.

9. A non-transitory processor-readable medium storing processor-executable instructions for causing one or more processors to perform a method of hotspot determination, the method comprising:

receiving layout data for a layout design;

extracting a netlist from the layout design;

classifying devices in the netlist into device groups based on values for one or more device parameters derived from the layout data, the one or more device parameters describing one or more physical parameters of the devices corresponding to electrical information for the devices in the device groups;

determining hotspots based on the electrical information for the device groups; and

storing information of the hotspots in a tangible medium.

10. The non-transitory processor-readable medium recited in claim 9 , wherein the method further comprises:

generating physical verification rules based on the information of the hotspots.

11. The non-transitory processor-readable medium recited in claim 9 , wherein the devices are transistors.

12. The non-transitory processor-readable medium recited in claim 9 , wherein the one or more physical parameters comprises one or more physical parameters selected from channel width, channel length, SA parameter, or SB parameter.

13. The non-transitory processor-readable medium recited in claim 9 , wherein the determining hotspots comprises:

selecting a reference device for each of the device groups;

determining representative electrical information for the reference device for each of the device groups; and

identifying hotspots based on the representative electrical information.

14. A system comprising one or more processors, the one or more processors programmed to perform a method of hotspot determination, the method comprising:

receiving layout data for a layout design;

extracting a netlist from the layout design;

classifying devices in the netlist into device groups based on values for one or more device parameters derived from the layout data, the one or more physical parameters describing one or more physical parameter of the devices corresponding to electrical information for the device in the device groups;

selecting a reference device for each of the device groups;

determining representative electrical information for the reference device for each of the device groups;

identifying hotspots based on the representative electrical information; and

storing information of the hotspots in a tangible medium.

15. The system recited in claim 14 , wherein the method further comprises:

generating physical verification rules based on the information of the hotspots.

16. The system recited in claim 14 , wherein the devices are transistors.

17. The system recited in claim 14 , wherein the one or more physical parameters comprises one or more physical parameters selected from channel width, channel length, SA parameter, or SB parameter.

18. A non-transitory processor-readable medium storing processor-executable instructions for causing one or more processors to perform a method of hotspot determination, the method comprising:

receiving layout data for a layout design;

extracting a netlist from the layout design;

classifying devices in the netlist into device groups based on values for one or more physical device parameters derived from the layout data, the one or more physical parameters corresponding to electrical information for the devices;

selecting a reference device for each of the device groups;

determining representative electrical information for the reference device for each of the device groups;

identifying hotspots based on the representative electrical information; and

storing information of the hotspots in a tangible medium.

19. The method recited in claim 1 , wherein the devices in each device group have similar electrical performance.

20. The non-transitory processor-readable medium recited in claim 9 , wherein the devices in each device group have similar electrical performance.