IP Library Granted Patent US 8,609,473
Granted Patent B2
US 8,609,473 · App. 13/271,797 · Granted Dec 17, 2013

Method for fabricating a neo-layer using stud bumped bare die

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Quick Facts
Patent No.
US 8,609,473
App. No.
13/271,797
Granted
Dec 17, 2013
Kind
B2
Abstract

A method for fabricating a stackable integrated circuit layer and a device made from the method are disclosed. A stud bump is defined on the contact pad of an integrated circuit die and the stud-bumped die encapsulated in a potting material to define a potted assembly. A predetermined portion of the potting material is removed whereby a portion of the stud bump is exposed. One or more electrically conductive traces are defined on the layer surface and in electrical connection with the stud bump to reroute the integrated circuit contacts to predetermined locations on the layer to provide a stackable neolayer.

Claims (8)

1. A method for fabricating a stackable integrated circuit layer comprising the steps of:

providing a prepackaged integrated circuit package comprising an integrated circuit die,

removing a predetermined portion of the package in a first operation to define a partially-depackaged integrated circuit die,

affixing the partially-depackaged integrated circuit die and a spacer element having a predetermined thickness and a predetermined set of surface dimensions to a substrate whereby at least a portion of the spacer element is disposed between the partially-depackaged integrated circuit die and the substrate to define a convex, partially-depackaged integrated circuit die surface,

removing a predetermined portion of the convex, partially-depackaged integrated circuit die surface in a second operation,

defining a stud bump on a contact pad of the integrated circuit die,

encapsulating the die in a potting material to define a potted assembly having an active surface and an inactive surface,

removing a portion of the potting material from the active surface to a predetermined first depth whereby a predetermined portion of the stud bump is exposed on the active surface, and defining one or more electrically conductive traces on the active surface in electrical connection with the stud bump.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2014
From: PARTNERS FOR GROWTH III, L.P.
To: PFG IP LLC
Reel/Frame 033793/0508 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2014
From: ISC8 INC.
To: PFG IP LLC
Reel/Frame 033777/0371 →
SECURITY AGREEMENT Recorded Dec 15, 2011
From: IRVINE SENSORS CORPORATION
To: PARTNERS FOR GROWTH III, L.P.
Reel/Frame 027387/0793 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2011
From: BOYD, W. ERIC; BINDRUP, RANDY; LIEU, PETER; YAMAGUCHI, JAMES
To: IRVINE SENSORS CORPORATION
Reel/Frame 027084/0503 →