IP Library › Granted Patent US 9,093,810
Granted Patent B2
US 9,093,810 · App. 13/281,230 · Granted Jul 28, 2015

Dendrimer based terahertz generator

Inventors: Anis Rahman (Harrisburg, PA); Aunik K. Rahman (Harrisburg, PA)
Assignee: Applied Research and Photonics, Inc.
H01S1/02B82Y20/00G02F1/353G02F1/3558G02F1/3611G02F1/3612G02F1/361G02F1/365G02F2203/13
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Quick Facts
Patent No.
US 9,093,810
App. No.
13/281,230
Granted
Jul 28, 2015
Kind
B2
Abstract

A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, a high power terahertz (THz) source is implemented using an electro-optic dendrimer via electro-optic rectification. Electro-optic rectification provides inherent power scalability, because, pump-THz conversion is not limited either by emission saturation or by heat dissipation. Low dielectric loss and high electro-optic coefficient of dendrimer along with a waveguide structure provides higher output power and tunable THz power generation. A dendrimer fiber array is also disclosed by means of which the input/output signals are connected to multiple components and devices.

Claims (18)

1. A terahertz emitter, comprising: a bulk dendrimer, wherein the bulk dendrimer is a functionalized dendrimer for generating terahertz radiation with a high pump-terahertz conversion efficiency and high output power; and a substrate, the bulk dendrimer positioned on the substrate.

2. The terahertz emitter of claim 1 , wherein the conversion efficiency is greater than 1%.

3. The terahertz emitter of claim 1 , wherein the functionalized dendrimer has an enhanced electro-optic coefficient and a second order magnetic susceptibility resulting from poling induced dipole orientation.

4. The terahertz generator of claim 1 , wherein the dendrimer contains an enhanced number of dipole moments generated from poling at a high electric field at an elevated temperature.

5. The terahertz generator of claim 1 , wherein the dendrimer is poled in-situ or ex-situ at a high electric field at an elevated temperature therein incorporating a dipole depleted charge density.

6. The terahertz generator of claim 1 , wherein the dendrimer is formed from Generation 0 to Generation 11 dendrimers.

7. The terahertz generator of claim 1 , wherein the dendrimer is formed from a film that is cured at a temperature between 80° C. and 400° C.

8. The terahertz generator of claim 7 , wherein the cured film has a glass transition temperature higher than 85° C. and suitable for continuous stable operation and extended life.

9. A terahertz system, comprising: a terahertz emitter including a bulk dendrimer, wherein the bulk dendrimer is a functionalized dendrimer for generating terahertz radiation with a high pump-terahertz conversion efficiency and high output power; at least one laser configured to pump a beam through the terahertz emitter; and the terahertz emitter configured to rectify the beam and generate terahertz radiation.

10. The terahertz system of claim 9 , wherein the at least one laser is a single pulse laser pump configured to rectify the beam and generate pulsed output terahertz radiation.

11. The terahertz system of claim 9 , wherein the at least one laser is a pair of continuous wave lasers configured for difference frequency generation of a continuous wave terahertz radiation.

12. The terahertz system of claim 9 , wherein the conversion efficiency is greater than 1%.

13. The terahertz system of claim 9 , wherein the functionalized dendrimer has an enhanced electro-optic coefficient and second-order magnetic susceptibility resulting from poling induced dipole orientation.

14. The terahertz system of claim 9 , wherein the dendrimer contains an enhanced number of dipole moments generated from poling at a high electric field at an elevated temperature.

15. The terahertz system of claim 9 , wherein the dendrimer is poled in-situ or ex-situ at a high electric field at an elevated temperature therein incorporating a dipole depleted charge density.

16. The terahertz system of claim 9 , wherein the dendrimer is formed from Generation 0 to Generation 11 dendrimers.

17. The terahertz system of claim 9 , wherein the dendrimer is formed from a film that is cured at a temperature between 80° C. and 400° C.

18. The terahertz system of claim 15 , wherein the cured film has a glass transition temperature higher than 85° C. and suitable for continuous stable operation and extended life.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2015
From: RAHMAN, ANIS; RAHMAN, AUNIK K.
To: APPLIED RESEARCH AND PHOTONICS, INC.
Reel/Frame 036437/0132 →
Continuity (3)
Division 11862474 · Sep 27, 2007
Provisional Application 60827206 · Sep 27, 2006
Related Publication 20120099827A1 · Apr 26, 2012