High-stability reset circuit for monitoring supply undervoltage and overvoltage

1. A method of monitoring supply undervoltage and overvoltage, comprising:

providing a single reference voltage;

providing a single ratioed supply voltage;

comparing the reference voltage to the ratioed supply voltage to provide an output signal, wherein

the output signal comprises a first logic value in an undervoltage and an overvoltage condition, and a second logic value in a normal operating condition.

2. The method of claim 1 wherein the reference voltage comprises a bandgap voltage.

3. The method of claim 1 wherein the undervoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages up to a first voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

4. The method of claim 3 wherein the first voltage crossing occurs during a transitional phase of the static characteristic of the reference voltage.

5. The method of claim 1 wherein the overvoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages greater than a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

6. The method of claim 5 wherein the second voltage crossing occurs during either a transitional phase or an invariant phase of the reference voltage.

7. The method of claim 1 wherein the normal operating condition comprises a condition wherein the reference voltage is greater than the ratioed supply voltage for voltages between a first voltage crossing and a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

8. The method of claim 1 , wherein the method is performed without a clock.

9. The method of claim 1 , wherein the reference voltage is generated at a node that is coupled to at least one other component in an integrated circuit.

10. The method of claim 1 , wherein the reference voltage comprises an unswitched reference voltage.

11. The method of claim 1 , wherein comparing comprises comparing with a single comparator having a first input directly coupled to the ratioed supply voltage and a second input directly coupled to the reference voltage.

12. A method of monitoring supply undervoltage and overvoltage, comprising:

providing a single reference voltage;

providing a single ratioed supply voltage;

comparing the reference voltage to the ratioed supply voltage to provide an output signal,

wherein the output signal comprises a first logic value in an undervoltage and an overvoltage condition, and a second logic value in a normal operating condition, and wherein providing the single reference voltage comprises using an exclusively bipolar, or a mixed bipolar and FET bandgap reference circuit.

13. The method of claim 12 wherein the undervoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages up to a first voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

14. The method of claim 12 wherein the overvoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages greater than a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

15. The method of claim 12 wherein the normal operating condition comprises a condition wherein the reference voltage is greater than the ratioed supply voltage for voltages between a first voltage crossing and a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

16. The method of claim 12 wherein comparing further comprises hysteresis.

17. The method of claim 12 further comprising providing output signal edge delay.

18. A method of monitoring supply undervoltage and overvoltage, comprising:

providing a single reference voltage, using a substrate PNP bandgap reference circuit;

providing a single ratioed supply voltage;

comparing the reference voltage to the ratioed supply voltage to provide an output signal, wherein

the output signal comprises a first logic value in an undervoltage and an overvoltage condition, and a second logic value in a normal operating condition.

19. The method of claim 18 wherein the undervoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages up to a first voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

20. The method of claim 18 wherein the overvoltage condition comprises a condition wherein the reference voltage is less than the ratioed supply voltage for voltages greater than a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

21. The method of claim 18 wherein the normal operating condition comprises a condition wherein the reference voltage is greater than the ratioed supply voltage for voltages between a first voltage crossing and a second voltage crossing of the reference voltage and the ratioed supply voltage characteristics.

22. The method of claim 18 wherein comparing further comprises hysteresis.

23. The method of claim 18 further comprising providing output signal edge delay.

24. A method of monitoring supply voltage, comprising:

providing a single reference voltage;

providing a single ratioed supply voltage;

comparing the reference voltage to the ratioed supply voltage to provide an output signal, wherein

the output signal comprises a first logic value in first and second operating conditions, and a second logic value in a third operating condition, wherein the first, second, and third operating conditions are determined by two crossing points of the reference voltage and ratioed supply voltage characteristics, and wherein

the first operating condition comprises an undervoltage condition, the second operating condition comprises an overvoltage condition, and the third operating condition comprises a normal operating condition.