IP Library › Granted Patent US 8,958,058
Granted Patent B2
US 8,958,058 · App. 13/296,301 · Granted Feb 17, 2015

Apparatus, process, and system for monitoring the integrity of containers

Inventors: Michel Pierre Bonin (Danville, CA); Thomas Lawrence Harvill (Alamo, CA); Jared Hubert Hoog (Fairfield, CA)
Assignee: Process Metrix
G01S17/88G01N25/72G01B11/06G01S17/023F27D2021/0085
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,958,058
App. No.
13/296,301
Granted
Feb 17, 2015
Kind
B2
Abstract

Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.

Claims (29)

1. An apparatus configured to monitor the integrity of a container protected by a refractory material, the apparatus comprising:

A thermographic system having a first radiation detector, said thermographic system being configured to make spatially resolved temperature measurements of an external surface of the container;

a scanning system having a first radiation source, a scanner, optics, a photodetector, and receiver electronics, said scanning system being configured to make spatially resolved thickness measurements of the refractory material; and

a central controller configured to display to a user the spatially resolved temperature measurements of the external surface of the container and the spatially resolved thickness measurements of the refractory material, wherein a defect on the refractory material is identified by a combination of the spatially resolved temperature measurements of the external surface of the container and the spatially resolved thickness measurements of the refractory material.

2. The apparatus according to claim 1 , wherein the thermographic system comprises a first controller, said first controller being configured to communicate with said central controller.

3. The apparatus according to claim 1 , wherein the thermographic system first radiation detector is a plurality of thermographic systems each comprising a first controller, each of said first controllers being configured to communicate with said central controller.

4. The apparatus according to claim 1 , wherein the spatially resolved temperature measurements of the external surface of the container and the spatially resolved thickness measurements of the refractory material are made substantially simultaneously.

5. The apparatus according to claim 1 , wherein the scanning system comprises a first controller and the scanning system and the first controller are disposed in a fixed-position stand, the first controller being in communication with the central controller.

6. The apparatus according to claim 1 , wherein the scanning system comprises a first controller and the scanning system and the first controller are disposed in a mobile unit, the first controller being in communication with the central controller.

7. The apparatus according to claim 1 , wherein a fining in a location inside the container is detected by a localized temperature measurement of the external surface of the container being above a threshold temperature value and by a corresponding localized thickness measurement of the refractory material being above a minimum thickness threshold value.

8. The apparatus according to claim 1 , wherein a molten metal creep or a small hole in the refractory material in a location inside the container is detected by a localized temperature measurement of the external surface of the container being above a threshold temperature value and by a corresponding localized thickness measurement of the refractory material being above a minimum thickness threshold value.

9. The apparatus according to claim 1 , wherein the scanning system is disposed in a mobile cart and further comprises a tracking system and a contouring system mounted thereon.

10. The apparatus according to claim 1 , wherein the scanning system further comprises a contouring system configured to measure range data from the contouring system to an internal surface of the refractory material.

11. The apparatus according to claim 1 , wherein the container is configured to be used in a gasification process in chemical and/or power production, in an electric-arc furnace, in a basic oxygen furnace, in a ladle, in a blast furnace, in a degasser, or in an argon-oxygen-decarburization furnace.

12. The apparatus according to claim 1 , wherein the thermographic system comprises a first controller, the scanning system comprises a second controller, and the first controller, the second controller, and the central controller are in communication with each other.

13. The apparatus according to claim 12 , wherein the first controller, the second controller, and the central controller are disposed in a single controlling unit.

14. The apparatus according to claim 1 , wherein a monitoring of the container is configured to be performed with the container placed kinematically on a stand with the container placed substantially in a given position before making the spatially resolved thickness measurements or by determining the position of the container on the stand before making the spatially resolved thickness measurements.

15. A method for monitoring the integrity of a container having an internal layer of a refractory material, the method comprising:

taking spatially resolved temperature measurements of an external surface of the container with a thermographic system;

taking spatially resolved thickness measurements of the refractory material with a scanning system; and

detecting a defect on the refractory material by a combination of the spatially resolved temperature measurements of the external surface of the container and the spatially resolved thickness measurements of the refractory material.

16. The method according to claim 15 , wherein the detecting further comprises detecting a fining in a location inside the container by identifying a localized temperature measurement of the external surface of the container above a threshold temperature value and a corresponding localized thickness measurement of the refractory material above a minimum thickness threshold value.

17. The method according to claim 15 , wherein the detecting further comprises detecting a molten metal creep or a small hole in the refractory material in a location inside the container by identifying a localized temperature measurement of the external surface of the container above a threshold temperature value and a corresponding localized thickness measurement of the refractory material above a minimum thickness threshold value.

18. The method according to claim 15 , wherein the taking of spatially resolved thickness measurements of the refractory material further comprises:

positioning the container on a stand; and

taking the thickness measurements with the container maintained substantially in a given position; or

determining the position of the container on the stand before taking the thickness measurements.

19. The method according to claim 15 , wherein the scanning system comprises a first controller and the scanning system and the first controller are disposed in a fixed-position stand.

20. The method according to claim 15 , wherein the scanning system comprises a first controller and the scanning system and the first controller are disposed in a mobile unit.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2025
From: PROCESS METRIX, LLC
To: VESUVIUS PROCESS METRIX, SAS
Reel/Frame 072667/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2011
From: BONIN, MICHEL PIERRE; HARVILL, THOMAS LAWRENCE; HOOG, JARED HUBERT
To: PROCESS METRIX
Reel/Frame 027232/0230 →
Continuity (1)
Related Publication 20130120738A1 · May 16, 2013