IP Library Granted Patent US 8,778,782
Granted Patent B2
US 8,778,782 · App. 13/306,031 · Granted Jul 15, 2014

Fabrication of graphene electronic devices using step surface contour

Inventors: Gunther Lippert (Frankfurt, DE); Jaroslaw Dabrowski (Frankfurt, DE); Grzegorz Lupina (Berlin, DE); Olaf Seifarth (Burghausen, DE)
Assignee: IHP GmbH—Innovations for High Performance Microelectronics
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Quick Facts
Patent No.
US 8,778,782
App. No.
13/306,031
Granted
Jul 15, 2014
Kind
B2
Abstract

A method for fabricating an electronic component, comprising providing a substrate; and depositing a graphene layer; wherein the substrate is either provided with a van-der-Waals functional layer or a van-der-Waals functional layer is deposited on the substrate before depositing the graphene layer; a surface step contour is formed; and growth of the graphene layer is seeded at the step contour.

Claims (22)

1. A method for fabricating an electronic component, comprising:

providing a substrate and a plurality of surface step contours on the substrate; and

depositing a van der Waals layer adjacent to the surface step contours; and

depositing a graphene layer on the van der Waals layer; wherein

growth of the graphene layer is seeded at a kink of the surface step contours.

2. The method according to claim 1 , wherein forming the surface step-contours comprises fabricating a line-shaped or mesa-shaped seed layer on the van-der-Waals functional layer.

3. The method according to claim 2 , wherein the seed layer is made of Si or a metal from the group formed by Ti, Ni, Al, and Cu.

4. The method according to claim 1 , wherein providing the surface step contours comprises a depositing a plurality of seed layers, which are stacked in a vertical direction on the surface and are separated from each other by a respective intermediate dielectric layer.

5. The method according to claim 1 , wherein a forming the surface step contours comprises fabricating the surface step contour to have a step-height that limits a vertical growth of the graphene layer to a monolayer or a bi-layer of graphene.

6. The method according to claim 1 , wherein the substrate either contains or consists of silicon.

7. The method according to claim 1 , wherein depositing the graphene layer is performed at a substrate temperature higher than 600° C. and lower than 1000° C.

8. The method according to claim 1 , wherein depositing the graphene layer comprises depositing atomic Carbon (C).

9. The method according to claim 1 , wherein depositing the graphene layer comprises catalytically separating Carbon atoms (C) from a Carbon-comprising compound.

10. An electronic component comprising:

a substrate and a plurality of surface step contours on the substrate;

a van-der-Waals layer deposited adjacent to the step contours; and,

a graphene layer on the van der Waals layer and seeded at a kink of the step contours.

11. The electronic component according to claim 10 , comprising a plurality of graphene layers, which are arranged in a lateral layer sequence or in a vertical layer stack.

12. The electronic component of claim 10 , which takes the form of a memory cell or a transistor.

13. The electronic component of claim 10 , wherein a line-shaped or mesa-shaped seed layer is arranged between the van-der-Waals layer and the graphene layer.

14. The electronic component of claim 10 , wherein the substrate either contains or consists of silicon.

15. The electronic component of claim 10 , wherein the van-der-Waals functional layer is made from the group formed by boron nitride BN and aluminum oxide Al 2 O 3 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2012
From: LIPPERT, GUNTHER; DABROWSKI, JAROSLAW; LUPINA, GRZEGORZ; SEIFARTH, OLAF
To: IHP GMBH - INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS / LEIBNIZ-INSTITUT FUR INNOVATIVE MIKROELEKTRONIK
Reel/Frame 027651/0947 →
Priority Claims (2)
EP 10192982 · Nov 29, 2010 · regional
EP 11177483 · Aug 12, 2011 · regional
Continuity (1)
Related Publication 20120132885A1 · May 31, 2012