IP Library Granted Patent US 8,895,943
Granted Patent B2
US 8,895,943 · App. 13/323,950 · Granted Nov 25, 2014

Lithography system and method of processing substrates in such a lithography system

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Quick Facts
Patent No.
US 8,895,943
App. No.
13/323,950
Granted
Nov 25, 2014
Kind
B2
Abstract

The invention relates to a lithography system comprising a plurality of lithography system units. Each lithography system unit comprises a lithography apparatus arranged in a vacuum chamber for patterning a substrate; a load lock system for transferring substrates into and out of the vacuum chamber; and a door for enabling entry into the vacuum chamber for servicing purposes. The load lock system and the door of each lithography system unit are provided at the same side and face a free area at a side of the lithography system, in particular the service area.

Claims (48)

1. A lithography system comprising a plurality of lithography system units, each lithography system unit comprising:

a vacuum chamber;

a lithography apparatus arranged in the vacuum chamber for patterning a substrate;

a load lock system for transferring substrates into and out of the vacuum chamber; and

a door for enabling entry into the vacuum chamber for servicing purposes;

wherein the load lock system and the door of each lithography system unit are provided at the same side of the lithography system unit and face a free area at a side of the lithography system.

2. The system of claim 1 , wherein the lithography system units are arranged back-to-back in two rows.

3. The system of claim 1 , wherein the door is removably connected to the vacuum chamber.

4. The system of claim 3 , wherein the door is provided with one or more transfer elements.

5. The system of claim 1 , wherein the load lock system is integrated into the door.

6. The system of claim 1 , wherein the lithography system unit comprises a storage unit for temporary storage of substrates.

7. The system of claim 1 , further comprising a preparation system for preparing substrates for patterning in a lithography apparatus.

8. The system of claim 1 preceding the immediately preceding claim, wherein each lithography system unit comprises a preparation system.

9. The system of claim 8 , wherein a lithography system unit comprises a robot for transferring substrates between the preparation system and the load lock system.

10. The system of claim 7 , wherein the preparation system comprises a clamping unit for clamping a substrate on a substrate support structure to form a clamp.

11. The system of claim 1 , further comprising:

a substrate supply system for enabling supply of substrates to the plurality of lithography system units; and

a substrate transfer system for transferring the substrates between the substrate supply system and the plurality of lithography system units.

12. The system of claim 11 , wherein each lithography system unit comprises a preparation system, and a robot for transferring substrates between the substrate transfer system and the preparation system.

13. The system of claim 11 , wherein the substrate supply system is arranged to accommodate a substrate storage unit for temporary storage of substrates.

14. The system of claim 13 , wherein the substrate storage unit is a removable substrate storage unit, such as a front opening unified pod, FOUP.

15. The system of claim 11 , wherein the substrate supply system is connectable to a track system.

16. The system of claim 11 , wherein the substrate transfer system is arranged above the load lock systems of the lithography system units.

17. The system of claim 1 , wherein the lithography apparatus is a charged particle lithography apparatus.

18. A method of processing a substrate in a lithography system unit of a lithography system according to claim 1 , the lithography system unit further comprising a substrate preparation system, and a substrate handling robot for transferring substrates between the load lock system and the substrate preparation system, wherein the method comprises:

providing a substrate to be exposed;

transferring the substrate by means of the robot to the substrate preparation system;

clamping the substrate on a substrate support structure in the substrate preparation system;

transferring the clamped substrate by means of the robot to the load lock system for exposure by the lithography apparatus;

exposing the clamped substrate in a vacuum environment by the lithography apparatus;

transferring the exposed clamped substrate by means of the robot from the load lock system to the substrate preparation system;

separating the exposed substrate from the substrate support structure in the substrate preparation system; and

transferring the exposed substrate by means of the robot to a point for removal from the lithography system unit.

19. The method of claim 18 , further comprising, before the clamping, aligning the substrate with respect to the substrate support structure in the substrate preparation system.

20. The method of claim 18 , wherein the lithography system unit further comprises a substrate storage unit for storing one of one or more substrates, and wherein the substrates to be exposed are provided to the substrate storage unit.

21. The method of claim 20 , wherein the substrate storage unit is further arranged for storing one or more exposed substrates, and wherein transferring the exposed substrate to the point for removal comprises transferring the exposed substrate by means of the robot to the substrate storage unit.

22. The method of claim 18 , wherein the method further comprises directing the substrate towards a predetermined orientation prior to transfer to the substrate preparation unit.

23. The method of claim 18 , wherein the substrate preparation system comprises a first substrate preparation unit and a second substrate preparation unit, the first and second preparation units being arranged for clamping a substrate to be exposed onto a substrate support structure and separating an exposed substrate from a substrate support structure, wherein the robot transfers the substrates to and from the first and second preparation units in an alternating fashion.

24. The method of claim 18 , wherein the lithography system further comprises a substrate supply system comprising an input for receiving substrates to be exposed and an output for providing exposed substrates, and a substrate transfer system for transferring substrates between the substrate supply system and the lithography system units, and wherein providing the substrate to be exposed comprises transferring the substrate to be exposed from the input of the substrate supply system to the lithography system unit by means of the substrate transfer system.

25. The method of claim 24 , wherein the method further comprises removing the exposed substrate from the lithography system by transferring the exposed substrate from the lithography system unit to the output of the substrate supply system by means of the substrate transfer system.

26. A lithography system unit comprising:

a vacuum chamber;

a lithography apparatus arranged in the vacuum chamber for patterning a substrate; and

a door for enabling entry into the vacuum chamber for servicing purposes;

wherein the door of the lithography system unit faces a free area at a side of the lithography system unit, and

wherein the door is provided with one or more components for handling the substrate.

27. The lithography system unit of claim 1 , wherein the door is provided with a load lock system for transferring substrates into and out of the vacuum chamber.

28. A lithography system comprising a plurality of lithography system units according to claim 26 .

Assignments (3)
COURT APPOINTMENT Recorded May 7, 2019
From: MAPPER LITHOGRAPHY HOLDING B.V.; MAPPER LITHOGRAPHY IP B.V.; MAPPER LITHOGRAPHY B.V.
To: WITTEKAMP, J.J.
Reel/Frame 049104/0734 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 7, 2019
From: WITTEKAMP, J.J.
To: ASML NETHERLANDS B.V.
Reel/Frame 049296/0606 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 27, 2012
From: DE BOER, GUIDO; DEJONG, HENDRIK JAN; KUIPER, VINCENT SYLVESTER; SLOT, ERWIN
To: MAPPER LITHOGRAPHY IP B.V.
Reel/Frame 027931/0105 →