Low frequency variation calibration circuitry
View Patent ↗An integrated circuit may include path delay calibration circuitry. The calibration circuitry may be configured to calibrate respective delay paths so that data and control signals travelling through the respective delay paths experience proper propagation delays during normal user operation. The calibration circuitry may include a high frequency error calibration circuit, a monitoring circuit, and a calibration processing circuit. The high frequency error calibration circuit may be used to compute first calibration settings that take into account jitter and process variations. The monitoring circuit may be used to measure a proxy parameter of interest. The processing circuit may be used to compute an offset based at least partly on the measured value of the proxy parameter. The offset may be applied to the first calibration settings to obtain second calibration settings, which can be used to configure the respective delay paths.
1. An integrated circuit comprising:
first and second logic circuits;
a delay path that connects the first and second logic circuits, wherein the delay path provides a first amount of delay to signals travelling through the delay path;
a monitoring circuit configured to periodically measure a value of at least one parameter associated with dynamic sources of path delay variations within the integrated circuit; and
a processing circuit configured to access a variation model to identify an offset based on measuring the value of the at least one parameter, wherein the processing circuit is further configured to adjust the delay path to provide a second amount of delay that is different than the first amount of delay based on the offset, and wherein identifying the offset based on the measured parameter comprises taking the measured parameter as an input to an equation and using the equation to compute the offset.
2. The integrated circuit defined in claim 1 further comprising:
a calibration circuit for obtaining preliminary calibration settings to take into account static sources of path delay variation.
3. The integrated circuit defined in claim 2 , wherein the processing circuit is further configured to apply the offset to the preliminary calibration settings to obtain adjusted calibration settings to take into account dynamic sources of variation.
4. The integrated circuit defined in claim 3 , wherein the adjusted calibration settings configure delay paths on the integrated circuit.
5. The integrated circuit defined in claim 1 , wherein measuring the value of at least one parameter comprises measuring the value of a proxy parameter selected from the group consisting of: an operating temperature, an operating voltage associated with the integrated circuit, an amount of transistor aging associated with delay paths on the integrated circuit, and performance information provided from another integrated circuit.
6. The integrated circuit defined in claim 1 , wherein identifying the offset based on the measured parameter comprises referring to a precomputed look-up table having offset values corresponding to different measured parameter levels.
7. A method for calibrating an integrated circuit comprising:
while a parameter that serves as a dynamic source of path delay variations in the integrated circuit is at a first level, calibrating the integrated circuit to obtain first calibration settings for the integrated circuit using a calibration circuit on the integrated circuit;
changing the parameter from the first level to a second level that is different than the first level; and
while the parameter is at the second level, recalibrating the integrated circuit to obtain second calibration settings for the integrated circuit using the calibrating circuit, wherein the first and second calibration settings are stored on the integrated circuit and correspond to respective first and second adjustments to the amount of delay provided by delay paths on the integrated circuit, wherein the first adjustment is different from the second adjustment, wherein the integrated circuit exhibits an operating temperature, and wherein changing the parameter from the first level to the second level comprises changing the operating temperature of the integrated circuit from a first temperature to a second temperature that is different than the first temperature.
8. A method for calibrating an integrated circuit comprising:
while a parameter that serves as a dynamic source of path delay variations in the integrated circuit is at a first level, calibrating the integrated circuit to obtain first calibration settings for the integrated circuit using a calibration circuit on the integrated circuit;
changing the parameter from the first level to a second level that is different than the first level; and
while the parameter is at the second level, recalibrating the integrated circuit to obtain second calibration settings for the integrated circuit using the calibrating circuit, wherein the first and second calibration settings are stored on the integrated circuit and correspond to respective first and second adjustments to the amount of delay provided by delay paths on the integrated circuit, wherein the first adjustment is different from the second adjustment, wherein the integrated circuit exhibits an operating voltage level, and wherein changing the parameter from the first level to the second level comprises changing the operating voltage level of the integrated circuit from a first voltage level to a second voltage level that is different than the first voltage level.