Semiconductor storage device and method for producing semiconductor storage device
A semiconductor storage device comprises a timing control circuit that generates a signal for controlling at least one of a read operation and a write operation; an input-signal pad; a plurality of control-signal pads; and a switch circuit coupled to at least one of the plurality of control-signal pads. The switch circuit generates a first control signal to be supplied to the timing control circuit based on a signal from the input-signal pad in a first mode.
1. A method for manufacturing a semiconductor storage device, the method comprising:
generating a test control signal based on one of a test command and a test signal;
generating a first control signal for controlling the semiconductor storage device based on the test control signal and a first signal from an input-signal pad;
generating a second control signal for controlling the semiconductor storage device based on a second signal from a control-signal pad; and
testing the semiconductor storage device based on the first control signal and the second control signal to manufacture the semiconductor storage device.
2. The method for producing the semiconductor storage device according to claim 1 , wherein the control-signal pad is at least one of a DQ-mask-signal pad, a clock-signal pad, a chip-enable-signal pad, a write-enable-signal pad, and an output-enable-signal pad.
3. The method for producing the semiconductor storage device according to claim 1 , wherein at least one of a write operation of a data signal and a read operation of the data signal is performed while a portion of a bit sequence of the data signal is masked based on the first signal.
4. The method for producing the semiconductor storage device according to claim 1 , wherein at least one of a clock synchronous test and a clock asynchronous test is performed,
wherein a clock signal is supplied as the first signal in the clock synchronous test and a fixed signal is supplied as the second signal in the asynchronous test.