Testing of analog-to-digital converters
View Patent ↗Complete testing of an analog-to-digital converter (ADC) can be carried out using digital signals and at high speeds. Circuit elements are added to an ADC so that a first phase of testing may be carried out using a limited number of analog test voltages. The ADC may then be reconfigured using added circuit elements to disable conventional analog-to-digital conversion. A digital signal may then be applied to the ADC to rapidly test all switching elements used in analog-to-digital conversion. According to some implementations, testing times for ADCs may be reduced from hours to milliseconds.
1. A method of testing an analog-to-digital converter (ADC) that includes a resistive network for converting analog signals, the method comprising:
isolating one end of the resistive network from any reference potential while recording a test measurement; and
digitally testing internal conversion circuit elements of the ADC with an externally applied digital signal.
2. The method of claim 1 , further comprising bypassing or disabling analog-to-digital conversion in the ADC during the act of digitally testing the internal conversion circuit elements of the ADC.
3. The method of claim 2 , further comprising:
enabling analog-to-digital conversion in the ADC;
applying less than about 10 analog voltage values to an analog input of the ADC; and
measuring analog-to-digital conversion for the applied analog voltage values.
4. The method of claim 1 , wherein the internal conversion circuit elements comprise a plurality of switches in the ADC and the digitally testing activates at least one of the plurality of switches.
5. The method of claim 4 , further comprising:
applying a test voltage to a resistive network coupled to the plurality of switches;
measuring an output from the plurality of switches; and
determining whether the at least one of the plurality of switches is functioning based upon the measured output.
6. The method of claim 4 , wherein the ADC includes a successive approximation register.
7. The method of claim 6 , wherein the act of digitally testing comprises:
applying a digital signal code to control logic of the successive approximation register to selectively activate the plurality of switches according to the applied digital signal code.
8. The method of claim 7 , wherein the selectively activating comprises placing one of the plurality of switches in a first state and the remaining switches in a second state different from the first state.
9. An analog-to-digital converter (ADC) comprising:
a plurality of switches for use in converting an analog input voltage to a digital output code corresponding to the analog input voltage;
a resistive network coupled to the plurality of switches;
an isolation switch configured to isolate one end of the resistive network from any reference potential; and
a digital test input configured to receive a signal for activating the plurality of switches.
10. The analog-to-digital converter of claim 9 , wherein the digital test input is coupled to control logic configured to activate the plurality of switches.
11. The analog-to-digital converter of claim 10 , wherein the control logic comprises a successive approximation register.
12. The analog-to-digital converter of claim 9 , further comprising
a comparator coupled at a first input to an analog voltage input for the ADC and coupled at a second input to an output from the plurality of switches,
wherein the resistive network and plurality of switches are configured to alter the voltage at the second input of the comparator.
13. The analog-to-digital converter of claim 12 , wherein the isolation switch is configured to isolate the resistive network from ground while testing the analog-to-digital converter.
14. The analog-to-digital converter of claim 13 , further comprising an external voltage input for applying a voltage to the resistive network from a source external to the ADC.
15. The analog-to-digital converter of claim 12 , further comprising:
measuring circuitry configured to measure a signal at the second input of the comparator; and
an isolation switch for isolating the measuring circuitry from the second input of the comparator.
16. The analog-to-digital converter of claim 15 , wherein the measuring circuitry comprises:
a coupling to a reference voltage; and
logic circuitry configured to indicate whether the reference voltage is present at the second input of the comparator or whether an applied voltage to the resistive network is present at the second input of the comparator.
17. The analog-to-digital converter of claim 12 , further comprising a multiplexor for selecting an output from the comparator or a signal from the digital test input for transmission to control logic configured to activate the plurality of switches.