Memory device and voltage interpreting method for read bit line
View Patent ↗A memory device comprises a memory cell array, a first and a second pre-charging switch circuits, a selecting circuit, an auxiliary memory cell array, a dynamic voltage controller and a sense amplifier. The auxiliary memory cell array comprises an auxiliary read bit line and a plurality of memory cells arranged in a column and electrically connected to the auxiliary read bit line. The second pre-charging switch circuit determines whether or not to supply a reference voltage to each of the aforementioned memory cells according to a pre-charging control signal. The dynamic voltage controller determines whether or not to supply a voltage to the auxiliary read bit line according to the voltage level of the output signal of the selecting circuit. The sense amplifier compares the voltage levels of the output signal of the selecting circuit and the voltage on the auxiliary read bit line to output a sensing result accordingly.
1. A memory device, comprising:
a memory cell array, comprising:
a plurality of read word lines;
a plurality of read bit lines; and
a plurality of first memory cells, the first memory cells being arranged in a matrix, and each of the first memory cells being electrically connected to one of the read bit lines and one of the read word lines;
a first pre-charging switch circuit electrically connected to each of the first memory cells, the first pre-charging switch circuit being used for receiving a first voltage and for determining whether or not to supply the first voltage to each of the first memory cells as an operating voltage according to a pre-charging control signal;
a selecting circuit electrically connected to each of the read bit lines, the selecting circuit being used for selecting one of the read bit lines and referring the signal on the selected read bit line as an output signal;
an auxiliary memory cell array, comprising:
an auxiliary read bit line; and
a plurality of second memory cells, the second memory cells being arranged in a column, and each of the second memory cells being electrically connected to the auxiliary read bit line and one of the read word lines;
a second pre-charging switch circuit electrically connected to each of the second memory cells, the second pre-charging switch circuit being for receiving a reference voltage and for determining whether or not to supply the reference voltage to each of the second memory cells as an operating voltage according to the pre-charging control signal;
a dynamic voltage controller electrically connected to the output of the selecting circuit and the auxiliary read bit line, the dynamic voltage controller being used for receiving a second voltage and for determining whether or not to supply the second voltage to the auxiliary read bit line according to the voltage level of the output signal of the selecting circuit; and
a sense amplifier electrically connected to the output of the selecting circuit and the auxiliary read bit line, the sense amplifier being used for comparing the voltage level of the output signal of the selecting circuit with the voltage level of the voltage on the auxiliary read bit line and outputting a sensing result accordingly.
2. The memory device according to claim 1 , wherein the first memory cells and the second memory cells have the same circuit structure, each of the first memory cells and the second memory cells has only one data read port, the data read port of each of the first memory cells is electrically connected to one of the read bit lines, and the data read port of each of the second memory cells is electrically connected to the auxiliary read bit line.
3. The memory device according to claim 1 , wherein the dynamic voltage controller comprises a P-type transistor, a source/drain of the P-type transistor is electrically connected to the second voltage, the other source/drain of the P-type transistor is electrically connected to the auxiliary read bit line, and the gate of the P-type transistor is electrically connected to the output of the selecting circuit.
4. The memory device according to claim 1 , wherein each of the first voltage and the second voltage is larger than the reference voltage.
5. The memory device according to claim 4 , wherein the first voltage and the second voltage have the same voltage level.
6. A voltage interpreting method for read bit line, the voltage interpreting method being applied to a memory device, the memory device comprising a memory cell array, a first pre-charging switch circuit, a selecting circuit and a sense amplifier, the memory cell array comprising a plurality of read word lines, a plurality of read bit lines and a plurality of first memory cells, the first memory cells being arranged in a matrix, and each of the first memory cells being electrically connected to one of the read bit lines and one of the read word lines, the first pre-charging switch circuit being electrically connected to each of the first memory cells, the first pre-charging switch circuit being used for receiving a first voltage and for determining whether or not to supply the first voltage to each of the first memory cells as an operating voltage according to a pre-charging control signal, the selecting circuit being electrically connected to each of the read bit lines, the selecting circuit being used for selecting one of the read bit lines and referring the signal on the selected read bit line as an output signal, the sense amplifier being electrically connected to the output of the selecting circuit, the voltage interpreting method comprising:
providing an auxiliary memory cell array, wherein the auxiliary memory cell array comprises an auxiliary read bit line and a plurality of second memory cells, the second memory cells are arranged in a matrix, and each of the second memory cells is electrically connected to the auxiliary read bit line and one of the read word lines;
providing a second pre-charging switch circuit, wherein the second pre-charging switch circuit is electrically connected to each of the second memory cells, the second pre-charging switch circuit is used for receiving a reference voltage and for determining whether or not to supply the reference voltage to each of the second memory cells as an operating voltage according to the pre-charging control signal;
determining whether or not to supply the second voltage to the auxiliary read bit line according to the voltage level of the output signal of the selecting circuit, so as to dynamically adjust the voltage level of the voltage on the auxiliary read bit line; and
supplying the voltage on the auxiliary read bit line to the sensing amplifier, wherein the sensing amplifier compares the voltage level of the output signal of the selecting circuit with the voltage level of the voltage on the auxiliary read bit line, so as to output a sensing result accordingly.
7. The voltage interpreting method according to claim 6 , wherein the first memory cells and the second memory cells have the same circuit structure, each of the first memory cells and the second memory cells has only one data read port, the data read port of each of the first memory cells is electrically connected to one of the read bit lines, and the data read port of each of the second memory cells is electrically connected to the auxiliary read bit line.
8. The voltage interpreting method according to claim 6 , wherein the dynamic voltage controller comprises a P-type transistor, a source/drain of the P-type transistor is electrically connected to the second voltage, the other source/drain of the P-type transistor is electrically connected to the auxiliary read bit line, and the gate of the P-type transistor is electrically connected to the output of the selecting circuit.
9. The voltage interpreting method according to claim 6 , wherein each of the first voltage and the second voltage is larger than the reference voltage.
10. The voltage interpreting method according to claim 9 , wherein the first voltage and the second voltages have the same voltage level.