IP Library Granted Patent US 8,842,413
Granted Patent B2
US 8,842,413 · App. 13/353,010 · Granted Sep 23, 2014

Multilayered ceramic electronic component

Inventors: Myung Jun Park (Chungcheongbuk-do, KR); Da Young Choi (Gyunggi-do, KR); Byong Gyun Kim (Gyunggi-do, KR); Ji Sook Kim (Seoul, KR); Byung Jun Jeon (Seoul, KR); Hyun Hee Gu (Gyunggi-do, KR); Kyu Ha Lee (Gyunggi-do, KR); Gun Jung Yoon (Seoul, KR); Eun Sang Na (Gyunggi-do, KR)
Assignee: Samsung Electro-Mechanics Co., Ltd.
C03C3/00
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Quick Facts
Patent No.
US 8,842,413
App. No.
13/353,010
Granted
Sep 23, 2014
Kind
B2
Abstract

There is provided a multilayered ceramic electronic component having a reduced thickness and exhibiting hermetic sealing. In multilayered ceramic electronic component, an external electrode includes two layers, that is, first and second layers, and the first and second layers contain glass with different compositions, respectively. Therefore, the multilayered ceramic electronic component having high reliability, such as strong adhesion between the external electrode and the internal electrode, prevention of glass exudation, or the like, may be obtained.

Claims (13)

1. A multilayered ceramic electronic component, comprising:

a body formed by alternately laminating a ceramic layer and an internal electrode layer; and

an external electrode provided on one surface of the body,

wherein the external electrode includes:

a first layer formed on one surface of the body to contact the internal electrode and containing a conductive metal and a first glass frit represented by a formula of aSiO 2 -bB 2 O 3 -cAEMO (where, a+b+c=100, ‘a’ ranges from 20 to 60, ‘b’ ranges from 5 to 40, ‘c’ ranges from 1 to 30, in terms of parts by mole, and AEM denotes an alkali-earth metal selected from a group consisting of barium and calcium); and

a second layer formed on the first layer, having a plated layer formed on a surface thereof, and containing a conductive metal and a second glass frit represented by a formula of aSiO 2 -bB 2 O 3 -cAEMO (where, a+b+c=100, ‘a’ ranges from 5 to 19, ‘b’ ranges from 10 to 40, ‘c’ ranges from 5 to 40, in terms of parts by mole, and AEM denotes an alkali-earth metal selected from a group consisting of barium and calcium),

wherein the first layer is formed of a conductive paste including 100 parts by weight of the conductive metal and 5 to 15 parts by weight of the first glass frit, and

the second layer is formed of a conductive paste including 100 parts by weight of the conductive metal and 10 to 20 parts by weight of the second glass frit.

2. The multilayered ceramic electronic component of claim 1 , wherein the first glass frit further includes at least one selected from a group consisting of up to and including 10 parts by mole of Al 2 O 3 , up to and including 30 parts by mole of TM x O y , and up to and including 40 parts by mole of AM 2 O (where, TM is at least one transition metal selected from a group consisting of vanadium and zinc, x and y are atomic ratios of the at least one transition metal and oxygen in a transition metal oxide, AM is an alkaline metal selected from a group consisting of lithium, sodium and potassium), and

wherein the second glass frit further includes at least one selected from a group consisting of up to and including 10 parts by mole of Al 2 O 3 , up to and including 10 parts by mole of TM x O y , and up to and including 20 parts by mole of AM 2 O (where, TM is at least one transition metal selected from a group consisting of vanadium and zinc, x and y are atomic ratios of the at least one transition metal and oxygen in a transition metal oxide, and AM is an alkaline metal selected from a group consisting of lithium, sodium and potassium).

3. The multilayered ceramic electronic component of claim 1 , wherein the conductive metal is copper.

4. The multilayered ceramic electronic component of claim 1 , wherein the ceramic layer is a dielectric layer.

5. The multilayered ceramic electronic component of claim 1 , wherein the internal electrode is made of nickel.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2012
From: PARK, MYUNG JUN; CHOI, DA YOUNG; KIM, BYONG GYUN; KIM, JI SOOK; JEON, BYUNG JUN; GU, HYUN HEE; LEE, KYU HA; YOON, GUN JUNG; NA, EUN SANG
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 027554/0426 →
Priority Claims (1)
KR 10-2011-0047696 · May 20, 2011 · national
Continuity (1)
Related Publication 20120295122A1 · Nov 22, 2012