Optical contact micrometer

1. An optical contact micrometer comprising:

a pair of opposable lenses to receive an object and immobilize the object in a position;

a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses;

a microscope to facilitate viewing of the object through the lenses via the mirrors; and

an interferometer to obtain one or more measurements of the object.

2. The micrometer of claim 1 , wherein the pair of opposable lenses comprises a fixed lens and a movable lens.

3. The micrometer of claim 1 , further comprising a goniometer to angularly position the object with respect to the pair of lenses.

4. The micrometer of claim 1 , wherein the interferometer comprises a laser interferometer.

5. The micrometer of claim 4 , further comprising a plane mirror positioned between the interferometer and one of the pair of opposable mirrors to facilitate measurement of the object.

6. The micrometer of claim 1 , further comprising an adjustable spring to close the pair of lenses to immobilize the object.

7. The micrometer of claim 1 , further comprising a micrometer drive to open the pair of lenses to free the object.

8. The micrometer of claim 1 , further comprising a sensor to facilitate correction to a measurement based on one or more environmental factors.

9. A method of object measurement comprising:

facilitating positioning of an object between a pair of opposable lenses at a desired position and angle;

enabling viewing of the object using a microscope via the pair of lenses and one or more mirrors;

facilitating acquisition of at least one measurement of the object using an interferometer; and

providing an output based on the measurement.

10. The method of claim 9 , wherein the interferometer comprises a laser interferometer.

11. The method of claim 9 , wherein the pair of opposable lenses comprises a fixed lens and a movable lens.

12. The method of claim 9 , wherein positioning is facilitated in part using a goniometer to angularly position the object with respect to the pair of lenses.

13. The method of claim 9 , wherein measurement of the object is facilitated in part using a plane mirror positioned between the optical measurement device and one of the one or more mirrors.

14. The method of claim 9 , wherein an adjustable spring facilitates positioning of the object by moving one lens of the pair closer to the other lens of the pair of lenses to immobilize the object.

15. The method of claim 9 , wherein a micrometer drive facilitates positioning of the object by moving one lens of the pair away from the other lens of the pair of lenses to free the object.

16. The method of claim 9 , wherein viewing of the object is enabled via a microscope arranged with respect to the lenses and mirrors.

17. The method of claim 9 , further comprising facilitating correction of a measurement, using a processor, based on one or more environmental factors obtained via sensor data.

18. An optical contact micrometer comprising:

a pair of lenses to receive an object and immobilize the object in a position, the pair of lenses to be positioned on opposite sides of an opening to receive the object, the pair of lenses including a movable lens and a fixed lens, the movable lens contacting the object to immobilize the object against the fixed lens;

a pair of opposable mirrors positioned at an angle with respect to the pair of lenses to facilitate viewing of the object through the lenses;

a microscope to facilitate viewing of the object through the lenses via the mirrors; and

a laser interferometer to obtain one or more measurements of the object.

19. The micrometer of claim 18 , wherein the laser interferometer is driven using a multi-frequency laser to obtain measurements based on reflections from the object.

20. The micrometer of claim 18 , further comprising an adjustable spring to close the pair of lenses to immobilize the object and a micrometer drive to open the pair of lenses to free the object.