IP Library › Granted Patent US 8,976,352
Granted Patent B2
US 8,976,352 · App. 13/370,794 · Granted Mar 10, 2015

Microparticle analysis apparatus

Inventors: Yosuke Muraki (Tokyo, JP); Masashi Saitoh (Chiba, JP); Shigemi Sakamoto (Chiba, JP)
Assignee: Sony Corporation
G01N15/1427G01N21/64G01N21/53
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Quick Facts
Patent No.
US 8,976,352
App. No.
13/370,794
Granted
Mar 10, 2015
Kind
B2
Abstract

A microparticle analysis apparatus includes at least: a detecting unit having one or a plurality of light sources and a plurality of photodetectors, configured to emit excitation light from the light sources, and to detect light emitted from microparticles on which the excitation light is irradiated, at the photodetectors; a first storage unit configured to store, for each microparticle, data detected at the photodetectors of the detecting unit based on detected time; and a second storage unit configured to store data relating to a particular microparticle of detected data stored in the first storage unit.

Claims (15)

1. A microparticle analysis apparatus, comprising at least:

a detecting unit, including

one or a plurality of light sources, and

a plurality of photodetectors,

configured to emit excitation light from said light sources, and to detect light emitted from microparticles on which said excitation light is irradiated, at said photodetectors;

a first storage unit configured to store, for each microparticle, data detected at the photodetectors of said detecting unit based on detected time, the first storage unit comprising a synchronous dynamic random access memory (SDRAM);

a second storage unit configured to store data relating to a particular microparticle of detected data stored in said first storage unit, the second storage unit comprising a static random access memory (SRAM) or a field programmable gate array (FPGA), and the first and second storage units respectively configured to store delay-adjusted optical signals of the particular microparticle; and

a first delay adjustment unit operatively coupled to the first storage unit and configured to adjust the detected time for each microparticle before storing in the second storage unit such that the detected time has a non-zero difference between the plurality of photodetectors.

2. The microparticle analysis apparatus according to claim 1 , further comprising:

a frequency conversion unit configured to down-convert each detected data according to an input frequency before storing in said first storage unit.

3. The microparticle analysis apparatus according to claim 1 , further comprising:

a computing unit configured to compute one or more of height, width and area of a voltage pulse from detected data stored in said second storage unit.

4. The microparticle analysis apparatus according to claim 1 , further comprising:

a second delay adjustment unit configured to adjust the difference of detected time for each microparticle regarding detected data.

5. The microparticle analysis apparatus according to claim 1 , wherein said storage unit is SDRAM.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2012
From: MURAKI, YOSUKE; SAITOH, MASASHI; SAKAMOTO, SHIGEMI
To: SONY CORPORATION
Reel/Frame 027947/0461 →
Continuity (2)
Provisional Application 61528978 · Aug 30, 2011
Related Publication 20130050698A1 · Feb 28, 2013