Chemical vapor deposition using N,O polydentate ligand complexes of metals
Complexes of metals and N,O polydentate ligands are useful as precursors in the preparation of doped zinc oxide coatings by chemical vapor deposition.
1. A chemical vapor deposition method of forming a doped layer comprised of zinc oxide and at least one metal-containing species selected from the group consisting of Al- and B-containing species on a substrate, comprising contacting a precursor vapor with the substrate to deposit the doped layer thereon, wherein the precursor vapor consists of at least one primary precursor comprising at least one zinc-containing compound, at least one secondary precursor comprising a complex having a structure:
wherein n is 2 or 3, X is OR 3 , Y is NR 4 , M is Al or B, R 1 , R 2 , and R 3 are the same or different, and are methyl or ethyl, and R 4 is H, methyl or ethyl,
optionally at least one oxygen-containing compound that does not contain a metal or fluorine and that is selected from the group consisting of esters, ketones, alcohols, hydrogen peroxide, O 2 and water, and
an inert carrier gas.
2. The method of claim 1 , wherein at least a portion of the precursor vapor is generated by volatilizing a precursor composition comprised of the least one primary precursor and the least one secondary precursor.
3. The method of claim 1 , wherein the at least one primary precursor comprises at least one zinc-containing compound having the general formula R 1 R 2 Zn or R 1 R 2 Zn.[L] n , where R 1 and R 2 are the same or different and are selected from alkyl groups or aryl groups, L is a ligand, n is 1 if L is a polydentate ligand and n is 2 if L is a monodentate ligand.
4. The method of claim 1 , wherein a transparent conductive zinc oxide layer is formed on the substrate.
5. The method of claim 1 , wherein the substrate is a glass substrate.
6. The method of claim 1 , wherein said contacting is carried out at about atmospheric pressure.
7. The method of claim 1 , wherein the substrate is maintained at a temperature of less than 400° C. during the contacting.