INSPECTION DEVICE AND METHOD
Inspection units have moving parts such as XY-movement stage mechanisms and high-speed rotation mechanisms for inspecting the entire surfaces of substrates, and it is difficult for fan filter units (FFUs) to completely remove all foreign materials. The provided inspection device has: a fan filter unit divided into a plurality of regions; an exhaust unit, divided into a plurality of regions, for getting rid of air from the fan filter unit; and a transfer system disposed between the fan filter unit and the exhaust unit. The chief characteristic of the provided inspection device is that the flow rate in some of the regions of the fan filter unit and the flow rate in some of the regions of the exhaust unit are controlled in accordance with the operations of the transfer system.
1 . An inspection device for inspecting a substrate, comprising:
a fan filter unit which is divided into a plurality of domains;
an exhaust unit which is divided into a plurality of domains for exhausting air from the fan filter unit; and
a transfer system which is disposed between the fan filter unit and the exhaust unit,
and controlling, depending on movement of the transfer system,
a flow amount in a partial domain of the fan filter unit; and
a flow amount in a partial domain of the exhaust unit.
2 . The inspection device according to claim 1 , further comprising a wind speed sensor; wherein
the fan filter unit and the exhaust unit vary the flow amount, depending on information from the wind speed sensor.
3 . The inspection device according to claim 2 , wherein the wind speed sensor is disposed at least in either one of a delivery position of an inspected object in the transfer system, or an inspection position.
4 . The inspection device according to claim 1 , further comprising a louver at least in either one of a backward part of the fan filter or a forward part of the exhaust unit.