Duty cycle corrector and duty cycle correction method
View Patent ↗The invention relates to a duty cycle corrector for generating from an input clock signal an output clock signal having a desired duty cycle. The duty cycle corrector comprises a pulse generating stage for generating from the input clock signal a pulsed clock signal. The pulse generating stage converts rising edges of the input clock signal into pulses, each of which pulses is shorter than the desired duty cycle times the clock period. The duty cycle corrector further comprises a pulse stretching stage for generating from the pulsed clock signal the output clock signal, the pulse stretching stage delaying falling edges of the pulsed clock signal by a controlled delay. The duty cycle corrector may comprise a duty cycle detector for generating a control signal as a function of the duty cycle of the output clock signal, and a feedback path for delivering the control signal to the pulse stretching stage so as to increase the controlled delay when the duty cycle is less than the desired duty cycle and to decrease the controlled delay when the duty cycle is greater than the desired duty cycle. The invention also relates to a method of generating from an input clock signal an output clock signal having a desired duty cycle.
1. A duty cycle corrector for generating from an input clock signal an output clock signal having a desired duty cycle, comprising:
a pulse generating stage for generating from the input clock signal a pulsed clock signal, the pulse generating stage converting rising edges of the input clock signal into pulses, each of which pulses is shorter than the desired duty cycle multiplied by a clock period; and
a pulse stretching stage for generating from the pulsed clock signal the output clock signal, the pulse stretching stage delaying falling edges of the pulsed clock signal by a controlled delay, wherein the pulse stretching stage comprises a control stage, wherein the control stage comprises
a CMOS inverter comprising a first PMOS transistor for outputting a high and a first NMOS transistor for outputting a low, and
a second transistor, wherein the second transistor is selected from the group consisting of a PMOS transistor, and an NMOS transistor, wherein the second transistor coupled between a source of the first PMOS transistor and a high bias potential when the second transistor is the PMOS transistor, wherein a rise time of the control stage is a function of a gate-to-source voltage at the second transistor, otherwise the second transistor coupled between a source of the first NMOS transistor and a low bias potential when the second transistor is the NMOS transistor, wherein a fall time of the control stage is a function of the gate-to-source voltage at the second transistor.
2. The duty cycle corrector as set forth in claim 1 , wherein a delay of rising edges of the output clock signal relative to the rising edges of the input clock signal is independent of a duty cycle of the input clock signal.
3. The duty cycle corrector as set forth in claim 2 , further comprising:
a duty cycle detector for generating a control signal as a function of a duty cycle of the output clock signal; and
a feedback path for delivering the control signal to the pulse stretching stage so as to increase the controlled delay when the duty cycle is less than the desired duty cycle and to decrease the controlled delay when the duty cycle is greater than the desired duty cycle.
4. The duty cycle corrector as set forth in claim 1 , wherein a delay of rising edges of the output clock signal relative to the rising edges of the input clock signal is short compared to the clock period.
5. The duty cycle corrector as set forth in claim 4 , further comprising:
a duty cycle detector for generating a control signal as a function of a duty cycle of the output clock signal; and
a feedback path for delivering the control signal to the pulse stretching stage so as to increase the controlled delay when the duty cycle is less than the desired duty cycle and to decrease the controlled delay when the duty cycle is greater than the desired duty cycle.
6. The duty cycle corrector as set forth in claim 1 , wherein the pulse generating stage comprises
a delay-and-inversion branch for delaying and inverting the input clock signal to generate an inverted and delayed input clock signal; and
an AND gate or a NAND gate arranged to receive as first input the input clock signal and as second input the inverted and delayed input clock signal.
7. The duty cycle corrector as set forth in claim 1 , wherein the pulse stretching stage comprises the control stage for generating from the pulsed clock signal a raw output clock signal, the control stage having a controllable rise time or a controllable fall time.
8. The duty cycle corrector as set forth in claim 7 , wherein the pulse stretching stage further comprises a refinement stage for generating from the raw output clock signal the output clock signal.
9. The duty cycle corrector as set forth in claim 8 , wherein the refinement stage comprises at least one of: an amplifier, a comparator, or a Schmitt trigger.
10. The duty cycle corrector as set forth in claim 1 , further comprising:
a duty cycle detector for generating a control signal as a function of a duty cycle of the output clock signal; and
a feedback path for delivering the control signal to the pulse stretching stage so as to increase the controlled delay when the duty cycle is less than the desired duty cycle and to decrease the controlled delay when the duty cycle is greater than the desired duty cycle.
11. The duty cycle corrector as set forth in claim 10 , wherein the duty cycle detector comprises:
a capacitor;
a first current source coupled so as to increase a charge of the capacitor when the output clock signal is high; and
a second current source coupled so as to reduce the charge of the capacitor when the output clock signal is low.
12. The duty cycle corrector as set forth in claim 1 , implemented as or forming part of an integrated circuit.
13. A synchronous circuit comprising the duty cycle corrector as set forth in claim 1 .
14. The duty cycle corrector as set forth in claim 1 , wherein the control stage comprises the second transistor, wherein the second transistor is the PMOS transistor.
15. The duty cycle corrector as set forth in claim 14 , wherein the source of the first NMOS transistor is shortened to the low bias potential.
16. The duty cycle corrector as set forth in claim 1 , wherein the control stage comprises the second transistor, wherein the second transistor is the NMOS transistor.
17. The duty cycle corrector as set forth in claim 16 , wherein the source of the first PMOS transistor is shortened to the high bias potential.
18. A method of generating from an input clock signal an output clock signal having a desired duty cycle, comprising:
generating from the input clock signal a pulsed clock signal, by converting rising edges of the input clock signal into pulses, each of which pulses is shorter than the desired duty cycle multiplied by a clock period; and
generating from the pulsed clock signal the output clock signal, by delaying falling edges of the pulsed clock signal by a controlled delay, wherein generating from the pulsed clock signal further comprises a control stage, wherein the control stage comprises
a CMOS inverter comprising a first PMOS transistor for outputting a high and a first NMOS transistor for outputting a low, and
a second transistor, wherein the second transistor is selected from the group consisting of a PMOS transistor, and an NMOS transistor, wherein a second transistor coupled between a source of the first PMOS transistor and a high bias potential when the second transistor is the PMOS transistor, wherein a rise time of the control stage is a function of a gate-to-source voltage at the second transistor, otherwise the second transistor coupled between a source of the first NMOS transistor and a low bias potential when the second transistor is the NMOS transistor, wherein a fall time of the control stage is a function of the gate-to-source voltage at the second transistor.
19. The method as set forth in claim 18 , further comprising
controlling the delay so as to converge a duty cycle of the output clock signal to the desired duty cycle.
20. The method as set forth in claim 18 , wherein the control stage comprises the second transistor, wherein the second transistor is the PMOS transistor.
21. The method as set forth in claim 18 , wherein the control stage comprises the second transistor, wherein the second transistor is the NMOS transistor.
22. A duty cycle corrector for generating from an input clock signal an output clock signal having a desired duty cycle, comprising:
a duty cycle detector for generating a control signal as a function of a duty cycle of the output clock signal;
a pulse generating stage for generating from the input clock signal a pulsed clock signal, the pulse generating stage converting rising edges of the input clock signal into pulses, each of which pulses is shorter than the desired duty cycle multiplied by a clock period;
a pulse stretching stage for generating from the pulsed clock signal the output clock signal, the pulse stretching stage delaying falling edges of the pulsed clock signal by a controlled delay, wherein the pulse stretching stage comprises a control stage, wherein the control stage comprises
a CMOS inverter comprising a first PMOS transistor and a first NMOS transistor, and
a second transistor, wherein the second transistor is selected from the group consisting of a PMOS transistor, and an NMOS transistor, wherein the second transistor coupled between a source of the first PMOS transistor and a high bias potential when the second transistor is the PMOS transistor, otherwise the second transistor coupled between a source of the first NMOS transistor and a low bias potential when the second transistor is the NMOS transistor; and
a feedback path for delivering the control signal to the pulse stretching stage, wherein the control signal coupled to a gate of the second transistor of the control stage.
23. The duty cycle corrector as set forth in claim 22 , wherein the control stage comprises the second transistor, wherein the second transistor is the PMOS transistor.
24. The duty cycle corrector as set forth in claim 22 , wherein the control stage comprises the second transistor, wherein the second transistor is the NMOS transistor.