IP Library Granted Patent US 9,103,705
Granted Patent B2
US 9,103,705 · App. 13/406,439 · Granted Aug 11, 2015

Combined environmental parameter sensor

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Quick Facts
Patent No.
US 9,103,705
App. No.
13/406,439
Granted
Aug 11, 2015
Kind
B2
Abstract

A combination sensor and corresponding method of measuring a plurality of environmental parameters uses a pressure sensor disposed on an integrated circuit die; a humidity sensor disposed on the integrated circuit die; and a circuit coupled to and shared by the pressure sensor and the humidity sensor to facilitate pressure and humidity sensing.

Claims (27)

1. A combination sensor comprising:

a pressure sensor disposed on a die, the die including a semiconductor material, wherein the pressure sensor is comprised of four piezo resistive transducers arranged in a first Wheatstone bridge configuration;

a humidity sensor disposed on the die, wherein the humidity sensor is comprised of another four piezo resistive transducers arranged in a second Wheatstone bridge configuration; and

a circuitry disposed on the die and coupled to and shared by the pressure sensor and the humidity sensor to facilitate pressure and humidity sensing,

wherein the circuitry comprises one or more bond pads and traces that provide one or more common bias voltages to both the pressure sensor and the humidity sensor, and the circuitry further comprises first and second traces on the die for coupling the bias voltages to opposite corners of the first Wheatstone bridge configuration and the second Wheatstone bridge configuration and pressure sensing traces for coupling pressure sensing signals from the other opposite corners of the first Wheatstone bridge configuration and humidity sensing traces for coupling humidity sensing signals from the other opposite corners of the second Wheatstone bridge configuration.

2. The combination sensor of claim 1 further comprising a sensor package encasing the pressure sensor and the humidity sensor.

3. The combination sensor of claim 1 wherein the die further comprises a first diaphragm associated with the pressure sensor and a second diaphragm associated with the humidity sensor.

4. The combination sensor of claim 3 wherein the first diaphragm and the second diaphragm are formed on a same layer of the die.

5. A combination sensor comprising:

a pressure sensor disposed on a die, the die including a semiconductor material;

a humidity sensor disposed on the die, wherein the die comprises a vent opening to equalize pressure effects on the humidity sensor; and

a circuitry disposed on the die and coupled to and shared by the pressure sensor and the humidity sensor to facilitate pressure and humidity sensing,

wherein the die and one or more of the humidity sensor and pressure sensor are arranged and configured to facilitate offsetting any pressure effects on the humidity sensor.

6. The combination sensor of claim 5 wherein the vent opening is through a backside of the die.

7. The combination sensor of claim 5 wherein values from the pressure sensor are used to offset the pressure effects on values from the humidity sensor.

8. The combination sensor of claim 7 wherein a portion of the values from the pressure sensor are subtracted from the values from the humidity sensor to offset the pressure effects on values from the humidity sensor.

9. A method of measuring a plurality of environmental parameters, the method comprising:

obtaining a first value corresponding to pressure from a pressure sensor disposed on a die;

obtaining a second value corresponding to humidity from a humidity sensor disposed on the die, wherein the die comprises a vent opening to equalize pressure effects on a diaphragm for the humidity sensor;

providing a pressure parameter using at least one of the first value and the second value; and

providing a humidity parameter using at least one of the first value and the second value,

wherein any pressure effects on the humidity sensor are equalized.

10. The method of claim 9 wherein the die is encased in a sensor package.

11. The method of claim 9 wherein the pressure sensor is comprised of a first diaphragm, the diaphragm for the humidity sensor is a second diaphragm, and the first and second diaphragms are formed on the same layer of the die.

12. The method of claim 9 further comprising using the first value from the pressure sensor to equalize pressure effects on the second value from the humidity sensor.

13. The method of claim 9 wherein the obtaining a first value further comprises obtaining a first value resulting from a change in resistance of one or more piezo resistive transducers included with the pressure sensor and wherein the obtaining second value further comprises obtaining a second value resulting from a change in resistance of another one or more piezo resistive transducers included with the humidity sensor.

14. The method of claim 13 wherein the one or more piezo resistive transducers comprises a plurality of piezo resistive transducers arranged in a first Wheatstone bridge configuration and the another one or more piezo resistive transducers comprises a plurality of piezo resistive transducers arranged in a second Wheatstone bridge configuration and wherein one or more bond pads are used to couple one or more common bias voltages to the first and second Wheatstone bridge.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0521 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0476 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0455 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →