Semiconductor device and method of manufacturing the same
According to one embodiment, a semiconductor device includes a fin type stacked layer structure which has first to third semiconductor layers, and first to third layer select transistors to select one of the first to third semiconductor layers. The second layer select transistor is normally on in the second semiconductor layer, and is controlled to be on or off in the first and third semiconductor layers. A channel region of the second semiconductor layer which is covered with a gate electrode of the second layer select transistor has a metal silicide.
1. A semiconductor device comprising:
a semiconductor substrate;
a fin type stacked layer structure which has first to n-th semiconductor layers (n is a natural number equal to or more than 2) that are stacked in a first direction perpendicular to a surface of the semiconductor substrate and which extends in a second direction parallel to the surface of the semiconductor substrate; and
first to n-th layer select transistors to select one of the first to n-th semiconductor layers,
wherein the i-th layer select transistor (i is one of 1 to n) among the first to n-th layer select transistors has a gate electrode which extends in the first direction on the surface of the fin type stacked layer structure that is located in a third direction perpendicular to the first and second directions, is normally on in the i-th semiconductor layer among the first to n-th semiconductor layers, and is controlled to be on or off in the remaining semiconductor layers other than the i-th semiconductor layer, and
a channel region of the i-th semiconductor layer which is covered with the gate electrode of the i-th layer select transistor has a metal silicide.
2. The device of claim 1 ,
wherein the fin type stacked layer structure has first to n-th memory strings, and
the i-th memory string among the first to n-th memory strings uses the i-th semiconductor layer as a channel, and comprises memory cells connected in series in the second direction.
3. The device of claim 2 ,
wherein each of the memory cells is an FET which has a recording layer and a control gate electrode and whose threshold value changes in accordance with a state of the recording layer.
4. The device of claim 1 , further comprising:
first to m-th conductive layers (m is a natural number equal to or more than 2) which extend in the third direction; and
resistance change elements arranged between the first to n-th semiconductor layers and the first to m-th conductive layers.
5. The device of claim 1 ,
wherein a channel width of each of the first to n-th layer select transistors is 15 nm or smaller.
6. The device of claim 1 ,
wherein the channel region having the metal silicide includes one of Ni, V, Cr, Mn, Y, Mo, Ru, Rh, Hf, Ta, W, Ir, Co, Ti, Er, Pt, Pd, Zr, Gd, Dy and Ho.
7. The device of claim 1 ,
wherein the channel region having the metal silicide includes one of As, P, Si, Ge, F and C as an impurity.
8. The device of claim 1 ,
wherein the first to n-th semiconductor layers are made of one of silicon, germanium and silicon germanium.
9. A semiconductor device comprising:
a semiconductor substrate;
a fin type stacked layer structure which is disposed in a first direction perpendicular to a surface of the semiconductor substrate and which extends in a second direction parallel to the surface of the semiconductor substrate;
a beam which is connected to one end of the fin type stacked layer structure in the second direction and which extends in a third direction perpendicular to the first and second directions; and
first to n-th layer select transistors (n is a natural number equal to or more than 2) arranged on the surface of the beam that is located in the second direction,
wherein the fin type stacked layer structure and the beam have first to n-th semiconductor layers, the first to n-th layer select transistors select one of the first to n-th semiconductor layers,
the i-th layer select transistor (i is one of 1 to n) among the first to n-th layer select transistors has a gate electrode which extends in the first direction on the surface of the beam that is located in the second direction, is normally on in the i-th semiconductor layer among the first to n-th semiconductor layers, and is controlled to be on or off in the remaining semiconductor layers other than the i-th semiconductor layer, and
a channel region of the i-th semiconductor layer which is covered with the gate electrode of the i-th layer select transistor has a metal silicide.
10. The device of claim 9 ,
wherein the fin type stacked layer structure has first to n-th memory strings, and
the i-th memory string among the first to n-th memory strings uses the i-th semiconductor layer as a channel, and comprises memory cells connected in series in the second direction.
11. The device of claim 10 ,
wherein each of the memory cells is an FET which has a recording layer and a control gate electrode, and whose threshold value changes in accordance with a state of the recording layer.
12. The device of claim 9 , further comprising:
first to m-th conductive layers (m is a natural number equal to or more than 2) which extend in the third direction; and
resistance change elements arranged between the first to n-th semiconductor layers and the first to m-th conductive layers.
13. The device of claim 9 ,
wherein a channel width of each of the first to n-th layer select transistors is 15 nm or smaller.
14. The device of claim 9 ,
wherein the channel region having the metal silicide includes one of Ni, V, Cr, Mn, Y, Mo, Ru, Rh, Hf, Ta, W, Ir, Co, Ti, Er, Pt, Pd, Zr, Gd, Dy and Ho.
15. The device of claim 9 ,
wherein the channel region having the metal silicide includes one of As, P, Si, Ge, F and C as an impurity.
16. The device of claim 9 ,
wherein the first to n-th semiconductor layers are made of one of silicon, germanium and silicon germanium.
17. A semiconductor device comprising:
a semiconductor substrate;
an insulating layer which is disposed on the semiconductor substrate and which has first and second recess portions;
a first semiconductor layer which is disposed in the first recess portion and which comprises an n-type region and a p-type region on the n-type region; and
a second semiconductor layer which is disposed in the second recess portion,
wherein the first semiconductor layer includes a metal silicide in an upper surface of the p-type region and the second semiconductor layer includes a metal silicide as a whole.
18. The device of claim 17 , further comprising: a resistance change element which constitutes a stacked layer structure together with the first semiconductor layer.
19. The device of claim 17 ,
wherein a width of each of the first and second recess portions is 15 nm or smaller.
20. The device of claim 17 , wherein the metal silicide includes one of Ni, V, Cr, Mn, Y, Mo, Ru, Rh, Hf, Ta, W, It, Co, Ti, Er, Pt, Pd, Zr, Gd, Dy and Ho.
21. The device of claim 17 , wherein the metal silicide includes one of As, P, Si, Ge, F and C as an impurity.
22. A semiconductor device comprising:
a semiconductor substrate;
an insulating layer which is disposed on the semiconductor substrate;
first and second semiconductor layers which are disposed on the insulating layer;
a first FET which has a first gate electrode disposed on the first semiconductor layer and which is controlled to be on or off; and
a second FET which has a second gate electrode disposed on the second semiconductor layer and which is normally on,
wherein a channel of the second FET has a metal silicide.
23. The device of claim 22 , further comprising:
a logic LSI which is disposed on the semiconductor substrate and which is covered with the insulating layer,
wherein the first and second FETs constitute a configuration memory which holds selection information of the logic LSI.
24. The device of claim 22 ,
wherein a channel width of each of the first and second FETs is 15 nm or smaller.
25. The device of claim 22 ,
wherein the channel region having the metal silicide includes one of Ni, V, Cr, Mn, Y, Mo, Ru, Rh, Hf, Ta, W, Ir, Co, Ti, Er, Pt, Pd, Zr, Gd, Dy and Ho.
26. The device of claim 22 ,
wherein the channel region having the metal silicide includes one of As, P, Si, Ge, F and C as an impurity.
27. A method of manufacturing the device of claim 1 , the method comprising:
implanting, in the channel region of the i-th semiconductor layer which is covered with the gate electrode of the i-th layer select transistor, an impurity to amorphize the channel region;
forming a metal layer on the surface of a region of the i-th semiconductor layer which is not covered with the gate electrode of the i-th layer select transistor, in the third direction; and
selectively bringing a region in which the impurity is implanted to a silicide by a heat treatment.
28. The method of claim 27 ,
wherein the impurity includes one of As, P, Si, Ge, F and C.
29. A method of manufacturing the device of claim 9 , the method comprising:
implanting, in the channel region of the i-th semiconductor layer which is covered with the gate electrode of the i-th layer select transistor, an impurity to amorphize the channel region;
forming a metal layer on the surface of a region of the i-th semiconductor layer which is not covered with the gate electrode of the i-th layer select transistor, in the second direction; and
selectively bringing a region in which the impurity is implanted to a silicide by a heat treatment.
30. The method of claim 29 ,
wherein the impurity includes one of As, P, Si, Ge, F and C.
31. A method of manufacturing the device of claim 17 , the method comprising:
implanting, in the whole second semiconductor layer, an impurity to amorphize the whole second semiconductor layer;
forming a metal layer on the first and second semiconductor layers; and
selectively bringing a region in which the impurity is implanted to a silicide by a heat treatment.
32. The method of claim 31 ,
wherein the impurity includes one of As, P, Si, Ge, F and C.
33. A method of manufacturing the device of claim 22 , the method comprising:
implanting, in the whole second semiconductor layer, an impurity to amorphize the whole second semiconductor layer;
forming a metal layer on the first and second semiconductor layers which are not covered with the first and second gate electrodes; and
selectively bringing a region in which the impurity is implanted to a silicide by a heat treatment.
34. The method of claim 33 ,
wherein the impurity includes one of As, P, Si, Ge, F and C.