System for designating, displaying and selecting types of process parameters and product outcome parameters
Described is the display on a visual display device of one or more first visual indicators that indicate that one or more first process parameters of a process are critical process parameters. The critical process parameters are displayed on the visual display device as part of a hierarchical data structure.
1. A method comprising:
displaying, on a visual display device, one or more process parameters of a process based on a hierarchical data structure, wherein one or more first visual indicators indicate that one or more of the one or more process parameters are one or more key process parameters;
performing a risk analysis on the one or more key process parameters to determine a total rank score for each of the one or more key process parameters; and
changing, on the visual display device, at least one of the one or more first visual indicators, associated with at least one of the one or more key process parameters having a total rank score exceeding a threshold value, to at least one of one or more second visual indicators that indicates that the at least one of the one or more key process parameters is a critical process parameter,
wherein the total rank score for each of the one or more key process parameters is based on a plurality of cause-and-effect quality scores.
2. The method of claim 1 , wherein one or more names of one or more critical process parameters are shown as data leaves of the hierarchical data structure, and each data leaf of the data leaves includes one of the one or more second visual indicators that indicate that the data leaf is a critical process parameter.
3. The method of claim 1 , wherein the process is a manufacturing process for a product.
4. The method of claim 3 , wherein the product is a chemical composition.
5. The method of claim 3 , wherein the product is a pharmaceutical product.
6. The method of claim 1 , wherein the one or more first process parameters comprise an input material attribute.
7. The method of claim 2 , wherein the hierarchical data structure comprises one or more data nodes, and wherein the one or more names of the one or more critical process parameters are shown as data leaves beneath one or more data nodes of the hierarchical data structure.
8. The method of claim 1 , wherein the critical process parameter has a risk assessment score exceeding the threshold value.
9. The method of claim 1 , wherein each of the plurality of cause-and-effect quality scores is associated with a corresponding one of the one or more key process parameters and a corresponding one of one or more key quality attributes.
10. A non-transitory computer-readable storage medium encoded with a plurality of computer-executable instructions that, when executed, perform a method comprising:
displaying, on a visual display device, one or more process parameters of a process based on a hierarchical data structure, wherein one or more first visual indicators indicate that one or more of the one or more process parameters are one or more key process parameters;
performing a risk analysis on the one or more key process parameters to determine a total rank score for each of the one or more key process parameters; and
changing at least one of the one or more first visual indicators, associated with at least one of the one or more key process parameters having a total rank score exceeding a threshold value, to at least one of one or more second visual indicators that indicates that the at least one of the one or more key process parameters is a critical process parameter,
wherein the total rank score for each of the one or more key process parameters is based on a plurality of cause-and-effect quality scores.
11. The non-transitory computer-readable storage medium of claim 10 , wherein one or more names of one or more critical process parameters are shown as data leaves of the hierarchical data structure, and each data leaf of the data leaves includes one of the one or more second visual indicators that indicate that the data leaf is a critical process parameter.
12. The non-transitory computer-readable storage medium of claim 10 , wherein the process is a manufacturing process for a product.
13. The non-transitory computer-readable storage medium of claim 12 , wherein the product is a chemical composition.
14. The non-transitory computer-readable storage medium of claim 12 , wherein the product is a pharmaceutical product.
15. The non-transitory computer-readable storage medium of claim 10 , wherein the one or more process parameters comprise an input material attribute.
16. The non-transitory computer-readable storage medium of claim 11 , wherein the hierarchical data structure comprises one or more data nodes, and wherein the one or more names of the one or more critical process parameters are shown as data leaves beneath one or more data nodes of the hierarchical data structure.
17. The non-transitory computer-readable storage medium of claim 10 , wherein the critical process parameter has a risk assessment score exceeding the threshold value.
18. The non-transitory computer-readable storage medium of claim 10 , wherein each of the plurality of cause-and-effect quality scores is associated with a corresponding one of the one or more key process parameters.