IC clock doubler output gated to multiplexer and output buffer
The disclosure describes a novel method and apparatus for providing a shadow access port within a device. The shadow access port is accessed to perform operations in the device by reusing the TDI, TMS, TCK and TDO signals that are used to operate a test access port within the device. The presence and operation of the shadow access port is transparent to the presence and operation of the test access port. According to the disclosure, the shadow access port operates on the falling edge of the TCK signal while the test access port conventionally operates on the rising edge of the TCK signal.
1. An integrated circuit having an output circuit comprising:
A. a first data out input lead;
B. a second data out input lead;
C. multiplexer circuitry having a first data input, a second data input, a control input, and a data output;
D. a first data out enable input lead;
E. a second data out enable input lead;
F. an output buffer having an input connected to the data output of the multiplexer circuitry, a control input, and an output;
G. a data out output lead coupled to the data output of the output buffer;
H. a clock input lead;
I. clock doubler circuitry having an input connected to the clock input lead and having an output; and
J. gating circuitry having:
i. first gating circuitry coupling the first data out input lead to the first input of the multiplexer circuitry,
ii. second gating circuitry coupling the second data out input lead to the second input of the multiplexer circuitry,
iii. third gating circuitry coupling the first data out enable input lead, the second data out enable input lead, and the output of the clock doubler circuitry to the control input of the output buffer, and
iv. fourth gating circuitry coupling the first data out enable input lead, the second data out enable input lead, and the output of the clock doubler circuitry to the control input of the multiplexer circuitry.
2. The integrated circuit of claim 1 including a test access port having a test data out lead connected to the first data out input lead and a test data out enable lead connected to the first data out enable lead.
3. The integrated circuit of claim 1 including a shadow access port having a shadow data out lead connected to the second data out input lead and a shadow data out enable lead connected to the second data out enable lead.