Memory cell having heater material and variable resistance material embedded within insulating material
View Patent ↗A variable resistance memory cell structure and a method of forming it. The method includes forming a first electrode, forming an insulating material over the first electrode, forming a via in the insulating material to expose a surface of the first electrode, forming a heater material within the via using gas cluster ion beams, forming a variable resistance material within the via, and forming a second electrode such that the heater material and variable resistance material are provided between the first and second electrodes.
1. A memory cell, comprising:
a first electrode;
an insulating material on the first electrode;
a via in the insulating material exposing a surface of the first electrode;
a gas cluster ion beam formed heater material within the via, wherein the heater material has Ge as a primary atom and includes nitrogen impurity atoms that have a gradient nitrogen level through a thickness of the material;
a variable resistance material within the via; and
a second electrode on the variable resistance material and heater material.
2. The memory cell of claim 1 , wherein the heater material is formed on the surface of the first electrode and the variable resistance material is formed on the heater material.
3. The memory cell of claim 2 , wherein a portion of the heater material on the insulating material is removed.
4. The memory cell of claim 1 , wherein the variable resistance material is a phase-change material.
5. The memory cell of claim 4 , wherein the phase-change material is one of Ge x Te y , GaSb, Sb x Te y , InSb, InSe, In x Sb y Te z , Sn x Sb y Te z , Ga x Se y Te z , InSbGe, AgInSbTe, GeSnSbTe, Te x Ge y Sb z S k , and GeSbSeTe.
6. The memory cell of claim 5 , wherein the phase-change material has at least one of O, F, N, or C as impurity atoms.
7. The memory cell of claim 1 , wherein the variable resistance material is one of NiO, TiO, CuS, and SrTiO.
8. The memory cell of claim 1 , wherein the impurity atoms are from about 0.5 to about 15 atomic percent of the heater material.
9. The memory cell of claim 1 , wherein the impurity atoms are from about 5 to about 10 atomic percent of the heater material.
10. A memory cell, comprising:
a first electrode;
a gas cluster ion beam formed heater material on the first electrode, wherein the heater material has Ge as a primary atom and includes nitrogen impurity atoms that have a gradient nitrogen level through a thickness of the material;
an insulating material on the heater material;
a via in the insulating material to expose a surface of the heater material;
a variable resistance material within the via; and
a second electrode on the variable resistance material and the insulating material.
11. The memory cell of claim 10 , wherein the variable resistance material is a phase-change material.
12. The memory cell of claim 11 , wherein the phase-change material is one of Ge x Te y , GaSb, Sb x Te y , InSb, InSe, In x Sb y Te z , Sn x Sb y Te z , Ga x Se y Te z , InSbGe, AgInSbTe, GeSnSbTe, Te x Ge y Sb z S k , and GeSbSeTe.
13. The memory cell of claim 12 , wherein the phase-change material has at least one of O, F, N, or C as impurity atoms.
14. The memory cell of claim 10 , wherein the variable resistance material is one of NiO, TiO, CuS, and SrTiO.
15. The memory cell of claim 10 , wherein the impurity atoms are from about 0.5 to about 15 atomic percent of the heater material.
16. The memory cell of claim 10 , wherein the impurity atoms are from about 5 to about 10 atomic percent of the heater material.