Fault diagnosis based on design partitioning
View Patent ↗Aspects of the invention relate to techniques for fault diagnosis based on circuit design partitioning. According to various implementations of the invention, a circuit design of a failing die is first partitioned into a plurality of sub-circuits. The sub-circuits may be formed based on fan-in cones of observation points. Shared gate ratios may be used as a metric for adding fan-in cones of observation points into a sub-circuit. Based on test patterns and the sub-circuits, sub-circuit test patterns are determined. Fault diagnosis is then performed on the sub-circuits. The sub-circuit fault diagnosis comprises extracting sub-circuit failure information from the failure information for the failing die. The sub-circuit fault diagnosis may employ fault-free values for boundary gates in the sub-circuits.
1. One or more non-transitory processor-readable storage media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
receiving information of a circuit design for a die, failure information obtained after test patterns are applied to the circuit design, and the test patterns employed to generate the failure information;
partitioning the circuit design into a plurality of sub-circuits;
determining sub-circuit test patterns based on the test patterns and the plurality of sub-circuits;
performing fault diagnosis on the plurality of sub-circuits based on the sub-circuit test patterns and the failure information to generate sub-circuit diagnosis data;
generating diagnosis data for the die based on the sub-circuit diagnosis data; and
outputting the diagnosis data.
2. The one or more processor-readable storage media recited in claim 1 , wherein the partitioning comprises:
forming a plurality of sub-circuits based on fan-in cones of observation points.
3. The one or more processor-readable storage media recited in claim 2 , wherein the forming comprises:
determining shared gate ratio values between the fan-in cones; and
combining fan-in cones based on the shared gate ratio values.
4. The one or more processor-readable storage media recited in claim 2 , wherein the forming comprises:
selecting an unused observation point with a small fan-in cone as an initial fan-in cone to be placed in a sub-circuit.
5. The one or more processor-readable storage media recited in claim 2 , wherein the plurality of sub-circuits have a similar size.
6. The one or more processor-readable storage media recited in claim 1 , wherein the outputting comprises storing the diagnosis data in computer memory or storage.
7. The one or more processor-readable storage media recited in claim 1 , wherein the performing fault diagnosis comprises:
extracting sub-circuit failure information for the plurality of sub-circuits from the failure information; and
performing fault diagnosis on sub-circuits that have one or more failing bits based on the sub-circuit failure information and the sub-circuit test patterns.
8. The one or more processor-readable storage media recited in claim 1 , wherein the determining comprises:
mapping the test patterns to the plurality of sub-circuits.
9. The one or more processor-readable storage media recited in claim 8 , wherein the determining further comprises:
performing good machine simulation for the test patterns to determine fault-free values for boundary gates in the plurality of sub-circuits.
10. The one or more processor-readable storage media recited in claim 1 , wherein some or all of the plurality of sub-circuits are not disjointed.
11. A method of fault diagnosis, comprising:
with a computer,
receiving information of a circuit design for a die, failure information obtained after test patterns are applied to the circuit design, and the test patterns employed to generate the failure information;
partitioning the circuit design into a plurality of sub-circuits;
determining sub-circuit test patterns based on the test patterns and the plurality of sub-circuits;
performing fault diagnosis on the plurality of sub-circuits based on the sub-circuit test patterns and the failure information to generate sub-circuit diagnosis data;
generating diagnosis data for the die based on the sub-circuit diagnosis data; and
outputting the diagnosis data.
12. The method recited in claim 11 , wherein the partitioning comprises:
forming a plurality of sub-circuits based on fan-in cones of observation points.
13. The method recited in claim 12 , wherein the forming comprises:
determining shared gate ratio values between the fan-in cones; and
combining fan-in cones based on the shared gate ratio values.
14. The method recited in claim 12 , wherein the forming comprises:
selecting an unused observation point with a small fan-in cone as an initial fan-in cone to be placed in a sub-circuit.
15. The method recited in claim 12 , wherein the plurality of sub-circuits have a similar size.
16. The method recited in claim 11 , wherein the performing fault diagnosis comprises:
extracting sub-circuit failure information for the plurality of sub-circuits from the failure information; and
performing fault diagnosis on sub-circuits that have one or more failing bits based on the sub-circuit failure information and the sub-circuit test patterns.
17. The method recited in claim 11 , wherein the determining comprises:
mapping the test patterns to the plurality of sub-circuits.
18. The method recited in claim 17 , wherein the determining further comprises:
performing good machine simulation for the test patterns to determine fault-free values for boundary gates in the plurality of sub-circuits.
19. The method recited in claim 11 , wherein some or all of the plurality of sub-circuits are not disjointed.
20. A system comprising one or more processors, the one or more processors programmed to perform a method, the method comprising:
receiving information of a circuit design for a die, failure information obtained after test patterns are applied to the circuit design, and the test patterns employed to generate the failure information;
partitioning the circuit design into a plurality of sub-circuits;
determining sub-circuit test patterns based on the test patterns and the plurality of sub-circuits;
performing fault diagnosis on the plurality of sub-circuits based on the sub-circuit test patterns and the failure information to generate sub-circuit diagnosis data;
generating diagnosis data for the die based on the sub-circuit diagnosis data; and
outputting the diagnosis data.