Vacuum quality measurement system
View Patent ↗A gas analyzer for a vacuum chamber includes processing electronics configured to receive mass spectral data, receive input of total pressure in the vacuum chamber, receive external input from at least one sensor, and employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.
1. A gas analyzer for a vacuum chamber comprising processing electronics configured to:
a) receive mass spectral data;
b) receive input of total pressure in the vacuum chamber;
c) receive external input from at least one sensor; and
d) employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.
2. The gas analyzer of claim 1 , wherein the processing electronics are further configured to determine an identity of at least one chemical species present in the vacuum chamber based on the mass spectral data.
3. The gas analyzer of claim 2 , wherein the processing electronics are further configured to determine fullness level of a cryopump having at least a first stage and a second stage.
4. The gas analyzer of claim 3 , wherein the at least one sensor includes a temperature sensor of the temperature of the second stage of the cryopump, at least one chemical species present in the vacuum chamber is hydrogen, and the at least one criteria of quality includes a ratio of hydrogen partial pressure to the total pressure in the vacuum chamber.
5. The gas analyzer of claim 2 , wherein the processing electronics are further configured to determine relative concentrations of at least two chemical species present in the vacuum chamber, and to employ the relative concentrations to calculate the vacuum quality index.
6. The gas analyzer of claim 2 , wherein the processing electronics are further configured to determine partial pressure of the at least one chemical species present in the vacuum chamber, and to employ the partial pressure to calculate the vacuum quality index.
7. The gas analyzer of claim 6 , wherein the processing electronics are further configured to determine the partial pressure of at least two chemical species present in the vacuum chamber, and to employ the partial pressure of the at least two chemical species to calculate the vacuum quality index.
8. The gas analyzer of claim 6 , further including a display of the partial pressure of the at least one chemical species.
9. The gas analyzer of claim 6 , further including a display of minimum and maximum partial pressures of the at least one chemical species.
10. The gas analyzer of claim 6 , further including a digital output of the partial pressure of the at least one chemical species.
11. The gas analyzer of claim 1 , wherein the at least one sensor includes a substrate temperature sensor.
12. The gas analyzer of claim 1 , wherein the at least one sensor includes a vacuum pump speed sensor.
13. The gas analyzer of claim 1 , wherein the at least one sensor includes a cryopump temperature sensor.
14. The gas analyzer of claim 1 , wherein the vacuum quality index controls a binary output.
15. The gas analyzer of claim 1 , wherein the processing electronics are further configured to employ the vacuum quality index to control a process.
16. The gas analyzer of claim 15 , wherein the process is baseout of the vacuum chamber and the at least one sensor includes a temperature sensor of the temperature of the vacuum chamber.
17. The gas analyzer of claim 16 , wherein the at least one criteria of quality includes a ratio of hydrogen to all other chemical species in the vacuum chamber.
18. The gas analyzer of claim 15 , wherein the process is baseout of the vacuum chamber and the at least one sensor includes a position sensor of a gate valve between the vacuum chamber and a vacuum pump for evacuating the vacuum chamber.
19. The gas analyzer of claim 18 , wherein the at least one criteria of quality includes a ratio of water to all other chemical species in the vacuum chamber.
20. The gas analyzer of claim 1 , further including a display of at least one of the vacuum quality index, the total pressure in the vacuum chamber, and a scan range of the mass spectral data.
21. The gas analyzer of claim 1 , further including a digital output of at least one of the vacuum quality index and the mass spectral data.
22. The gas analyzer of claim 1 , wherein the at least one criteria of quality is user-programmable.
23. The gas analyzer of claim 1 , further including a mass spectrometer configured to provide the mass spectral data.
24. A method of analyzing gas in a vacuum chamber comprising:
a) receiving mass spectral data;
b) receiving input of total pressure in the vacuum chamber;
c) receiving external input from at least one sensor; and
d) employing the mass spectral data, total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.
25. The method of claim 24 , further including determining an identity of at least one chemical species present in the vacuum chamber based on the mass spectral data.
26. The method of claim 25 , further including determining fullness level of a cryopump having at least a first stage and a second stage.
27. The method of claim 26 , wherein the at least one sensor includes a temperature sensor of the temperature of the second stage of the cryopump, at least one chemical species present in the vacuum chamber is hydrogen, and the at least one criteria of quality includes a ratio of hydrogen partial pressure to the total pressure in the vacuum chamber.
28. The method of claim 25 , further including determining relative concentrations of at least two chemical species present in the vacuum chamber, and employing the relative concentrations to calculate the vacuum quality index.
29. The method of claim 26 , further including determining partial pressure of the at least one chemical species present in the vacuum chamber, and employing the partial pressure to calculate the vacuum quality index.
30. The method of claim 29 , further including outputting a digital output of the partial pressure of the at least one chemical species.
31. The method of claim 24 , wherein the at least one sensor includes at least one of a substrate temperature sensor, a vacuum pump speed sensor, and a cryopump temperature sensor.
32. The method of claim 24 , further including employing the vacuum quality index to control at least one of a binary output and an analog output.
33. The method of claim 24 , further including employing the vacuum quality index to control a process.
34. The method of claim 33 , wherein the process is baseout of the vacuum chamber and the at least one sensor includes a position sensor of a gate valve between the vacuum chamber and a vacuum pump for evacuating the vacuum chamber.
35. The method of claim 34 , wherein the at least one criteria of quality includes a ratio of water to all other chemical species in the vacuum chamber.
36. The method of claim 33 , wherein controlling the process includes feed forward process control.
37. The method of claim 33 , wherein controlling the process includes feed backward process control.
38. The method of claim 33 , wherein controlling the process includes matching the quality of the process in different vacuum chambers.
39. The method of claim 24 , further including outputting a digital output of the vacuum quality index.
40. A method of analyzing gas in a vacuum chamber comprising:
a) receiving mass spectral data;
b) receiving input of total pressure in the vacuum chamber; and
c) employing the mass spectral data and total pressure in the vacuum chamber to calculate a vacuum quality index based on at least one criteria of quality.
41. A method of analyzing gas in a vacuum chamber comprising:
a) receiving mass spectral data;
b) receiving input of total pressure in the vacuum chamber;
c) receiving external input from an ion beam current sensor;
d) employing the mass spectral data, total pressure in the vacuum chamber, and the external input from the ion beam current sensor to calculate a vacuum quality index based on at least one criteria of quality; and
e) employing the vacuum quality index to control a process of ion implantation with an ion beam.
42. The method of claim 41 , wherein the at least one criteria of quality includes a compensation due to beam charge state changes caused by charge exchange between ions in the ion beam and neutral gas species in the vacuum chamber.
43. A gas analysis system for a vacuum chamber comprising:
i) a mass spectrometer;
ii) at least one sensor; and
iii) a gas analyzer comprising processing electronics configured to:
a) receive mass spectral data;
b) receive input of total pressure in the vacuum chamber;
c) receive external input from the at least one sensor; and
d) employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.