Localization of an element of interest by XRF analysis of different inspection volumes
View Patent ↗An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.
1. A method of inspecting a sample by x-ray fluorescence (XRF) analysis, comprising:
irradiating a sample with a beam of exciting x-rays having energies suitable for causing an element of interest to emit characteristic fluorescent x-rays;
detecting the fluorescent x-rays emitted from a first inspection volume located at least partially in the sample and measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume;
detecting the fluorescent x-rays emitted from a second inspection volume located at least partially in the sample and measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume, wherein the first inspection volume overlaps with and is non-identical to the second inspection volume; and
comparing the first intensity to the second intensity;
wherein the first inspection volume extends to a coating layer portion and a bulk portion of the sample, and the second inspection volume extends only to a bulk portion of the sample.
2. The method of claim 1 , further comprising a step of moving a collimator between first and second positions to vary the collimation of the exciting x-rays so as to change between inspection volumes.
3. The method of claim 1 , further comprising a step of moving an eclipser between first and second positions to vary the degree of blocking of the exciting and fluorescing x-rays so as to change between inspection volumes.
4. The method of claim 1 , further comprising a step of deriving a concentration of the element of interest in the determined location.
5. The method of claim 1 , further comprising a step of comparing a ratio of the first to second intensities to an empirically derived calibration ratio.
6. The method of claim 1 , wherein the element of interest is lead.
7. An XRF analyzer, comprising:
an x-ray source for directing a beam of exciting x-rays onto a sample to cause an element of interest to emit characteristic fluorescent x-rays;
a detector positioned to receive fluorescent x-rays from an inspection volume and to responsive produce detection signals;
an actuator for controllably changing the inspection volume; and
a programmable controller having logic for operating the actuator to define a first inspection volume, measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume, operating the actuator to define a second inspection volume, measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume, and comparing the first intensity to the second intensity to determine a location of the element of interest;
wherein the first inspection volume overlaps with and is non-identical to the second inspection volume; and
the actuator is coupled to a collimator structure or an eclipser structure to change the inspection volume.
8. The XRF analyzer of claim 7 , wherein the actuator is coupled to a collimator structure movable between first and second positions, and wherein moving the collimator structure between first and second positions varies the collimation of the exciting x-rays to thereby change the inspection volume.
9. The XRF analyzer of claim 7 , wherein the actuator is coupled to a collimator structure movable between first and second positions, and wherein moving the collimator structure between first and second positions varies the collimation of the fluorescent x-rays to thereby change the inspection volume.
10. The XRF analyzer of claim 7 , wherein the actuator is coupled to an eclipser structure movable between first and second positions, and wherein moving the eclipser structure between first and second positions varies a degree of blocking of the exciting x-rays and the fluorescent x-rays to thereby change the inspection volume.
11. A method of inspecting a sample by x-ray fluorescence (XRF) analysis, comprising:
irradiating a sample with a beam of exciting x-rays having energies suitable for causing an element of interest to emit characteristic fluorescent x-rays;
detecting the fluorescent x-rays emitted from a first inspection volume located at least partially in the sample and measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume;
detecting the fluorescent x-rays emitted from a second inspection volume located at least partially in the sample and measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume, wherein the first inspection volume overlaps with and is non-identical to the second inspection volume; and
comparing the first intensity to the second intensity so as to determine the homogeneity of one or more elements of interest in an uncoated material.
12. A method according to claim 11 wherein a collimator scans continuously or stepwise across the exciting and/or fluoresced x-ray beams.
13. The method of claim 11 , further comprising a step of moving a collimator or an eclipser between first and second positions to vary the collimation of the exciting or fluoresced x-rays so as to change between inspection volumes.