Compact high precision adjustable beam defining aperture
View Patent ↗The present invention provides an adjustable aperture for limiting the dimension of a beam of energy. In an exemplary embodiment, the aperture includes (1) at least one piezoelectric bender, where a fixed end of the bender is attached to a common support structure via a first attachment and where a movable end of the bender is movable in response to an actuating voltage applied to the bender and (2) at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam. In an exemplary embodiment, the beam of energy is electromagnetic radiation. In an exemplary embodiment, the beam of energy is X-rays.
1. An adjustable aperture for controlling the dimensions of a beam of energy comprising:
at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender; and
at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam.
2. The aperture of claim 1 wherein the first attachment comprises plastic.
3. The aperture of claim 1 wherein the bender is positioned approximately parallel to the beam.
4. The aperture of claim 1 wherein the support structure comprises holes through which the bender can pass.
5. The aperture of claim 1 wherein the bender comprises at least one strain gauge.
6. The aperture of claim 5 wherein the gauge is configured to measure dimensional changes of the bender.
7. The aperture of claim 6 wherein the gauge is configured to provide data about the position of the blade.
8. The aperture of claim 1 wherein the blade is approximately perpendicular to the beam.
9. The aperture of claim 1 wherein the bender comprises:
at least one actuator conductor;
at least one signal conductor; and
at least one reference conductor.
10. The aperture of claim 9 wherein the actuator conductor and the reference conductor are configured to carry the actuating voltage.
11. The aperture of claim 9 wherein the signal conductor and the reference conductor are configured to carry a signal from at least one strain gauge attached to the bender.
12. The aperture of claim 9 wherein at least one of the conductors is attached to the support structure via a third attachment.
13. The aperture of claim 1 wherein the bender comprises a non-conducting material.
14. The aperture of claim 13 wherein the material can be electrically isolated.
15. The aperture of claim 1 wherein the blade is configured as an electrical conductor.
16. The aperture of claim 1 wherein the blade is configured as an electrical emitter.
17. The aperture of claim 1 further comprising an inner lining tube that is configured to protect the bender from impinging radiation from the beam.
18. The aperture of claim 17 wherein the tube is seated at both ends of the tube.
19. The aperture of claim 17 further comprising an outer lining tube that surrounds the inner lining tube.
20. The aperture of claim 19 further comprising a cap that is attached to the outer lining tube.
21. The aperture of claim 1 wherein the blade comprises a single crystal of material.
22. An adjustable aperture for limiting the dimension of a beam of energy comprising at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender, thereby being able to impinge upon the beam.
23. An adjustable aperture for limiting the dimension of a beam of particles comprising:
at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender; and
at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam.
24. An adjustable aperture for reducing the dimension of a beam of particles comprising at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender, thereby being able to impinge upon the beam.