IP Library Granted Patent US 9,093,596
Granted Patent B2
US 9,093,596 · App. 13/536,784 · Granted Jul 28, 2015

Epitaxial wafer for light emitting diode, light emitting diode chip and methods for manufacturing the same

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,093,596
App. No.
13/536,784
Granted
Jul 28, 2015
Kind
B2
Abstract

An epitaxial wafer for a light emitting diode (LED) and a method for manufacturing the same are provided. The method comprises: providing a substrate; forming a first LED epitaxial structure on a first surface of the substrate, in which the first LED epitaxial structure comprises a first n-type semiconductor layer, a first light emitting layer, a first anti-diffusion layer between the first n-type semiconductor layer and the first light emitting layer, a first p-type semiconductor layer, and a second anti-diffusion layer between the first p-type semiconductor layer and the first light emitting layer; and forming a second LED epitaxial structure on a second surface of the substrate. An LED chip comprising the epitaxial wafer and a method for manufacturing the same are also provided.

Claims (39)

1. An epitaxial wafer for a light emitting diode, said epitaxial wafer comprising:

a substrate;

a first LED epitaxial structure formed on a first surface of the substrate, in which the first LED epitaxial structure comprises:

a first n-type semiconductor layer doped with n-type impurities,

a first light emitting layer,

a first anti-diffusion layer between the first n-type semiconductor layer and the first light emitting layer, the first anti-diffusion layer being formed directly on the first n-type semiconductor layer,

a second anti-diffusion layer,

a first electron barrier layer directly on the second anti-diffusion layer, and

a first p-type semiconductor layer doped with p-type impurities on the first electron barrier layer, wherein the first and second anti-diffusion layers are adapted to block respectively the n-type and p-type impurities from diffusing to the first light emitting layer;

and

a second LED epitaxial structure formed on a second surface of the substrate.

2. The epitaxial wafer according to claim 1 , wherein the first LED epitaxial structure further comprises a first buffer layer formed between the first surface of the substrate and the first n-type semiconductor layer.

3. The epitaxial wafer according to claim 2 , wherein the first anti-diffusion layer and the second anti-diffusion layer comprise independently a nitride chosen from GaN, InGaN and AlGaInN.

4. The epitaxial wafer according to claim 1 , wherein the second LED epitaxial structure comprises:

a second buffer layer formed on the second surface of the substrate;

a second n-type semiconductor layer formed on the second buffer layer;

a second light emitting layer formed on the second n-type semiconductor layer; and

a second p-type semiconductor layer formed on the second light emitting layer.

5. The epitaxial wafer according to claim 1 , wherein the substrate is made of sapphire, and wherein the substrate has a thickness ranging from about 80 μm to about 200 μm.

6. The epitaxial wafer according to claim 1 , wherein the first anti-diffusion layer and the second anti-diffusion layer have independently a thickness ranging from about 2 nm to about 20 nm.

7. A light emitting diode (LED) chip, comprising:

a substrate;

a first LED epitaxial structure formed on a first surface of the substrate, wherein the first LED epitaxial structure comprises:

a first n-type semiconductor layer doped with n-type impurities,

a first light emitting layer,

a first anti-diffusion layer between the first n-type semiconductor layer and the first light emitting layer, the first anti-diffusion layer being formed directly on the first n-type semiconductor layer,

a second anti-diffusion layer,

a first electron barrier layer directly on the second anti-diffusion layer, and

a first p-type semiconductor layer doped with p-type impurities on the first electron barrier layer, wherein the first and second anti-diffusion layers are adapted to block respectively the n-type and p-type impurities from diffusing to the first light emitting layer;

a second LED epitaxial structure formed on a second surface of the substrate;

a first n-type electrode and a first p-type electrode formed on the first LED epitaxial structure;

a second n-type electrode and a second p-type electrode formed on the second LED epitaxial structure;

a circuit base board to which one of the first LED epitaxial structure and the second LED epitaxial structure is bonded; and

a heat conduction base board to which the other of the first LED epitaxial structure and the second LED epitaxial structure is bonded.

8. The LED chip according to claim 7 , wherein the first LED epitaxial structure emits blue light, and the second LED epitaxial structure emits yellow light; or

wherein the first LED epitaxial structure emits yellow light, and the second LED epitaxial structure emits blue light.

9. The LED chip according to claim 7 , wherein the substrate is made of sapphire, and wherein the substrate has a thickness ranging from about 80 μm to about 200 μm.

10. The LED chip according to claim 7 , wherein the first anti-diffusion layer and the second anti-diffusion layer comprise independently a nitride chosen from GaN, InGaN and AlGaInN.

11. The LED chip according to claim 7 , wherein the first anti-diffusion layer and the second anti-diffusion layer have independently a thickness ranging from about 2 nm to about 20 nm.

Assignments (3)
CHANGE OF NAME Recorded Feb 11, 2021
From: BYD MICROELECTRONICS CO., LTD.
To: BYD SEMICONDUCTOR COMPANY LIMITED
Reel/Frame 055280/0971 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2020
From: SHENZHEN BYD AUTO R&D COMPANY LIMITED; BYD COMPANY LIMITED
To: BYD MICROELECTRONICS CO., LTD.
Reel/Frame 051477/0903 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 28, 2012
From: HUO, DONGMING; HU, HONGPO; XIE, CHUNLIN; ZHANG, WANG
To: SHENZHEN BYD AUTO R&D COMPANY LIMITED; BYD COMPANY LIMITED
Reel/Frame 028464/0316 →