Method for using a bit specific reference level to read a phase change memory
View Patent ↗A voltage derived from accessing a selected bit using one read current may be utilized to read a selected bit of an untriggered phase change memory after the read current is changed. As a result, different reference voltages may be used to sense the state of more resistive versus a less resistive selected cells. The resulting read window or margin may be improved in some embodiments.
1. A method comprising:
reading a cell on an addressed cell line of a memory by developing a reference level from the addressed line; and
comparing a reference voltage, generated before a read current to the addressed line is changed, to a voltage generated on the addressed line after the read current is changed.
2. The method of claim 1 including providing different reference levels to detect higher and lower resistance cells.
3. The method of claim 1 including offsetting the reference level from said addressed line.
4. The method of claim 1 including using a reference level derived from a voltage on the addressed line.
5. The method of claim 1 including sensing whether a level on the addressed line is above or below the reference level.
6. The method of claim 1 including storing said reference level from the addressed line for comparison to a level on said addressed line at a later time.
7. The method of claim 6 including comparing said levels after changing a current in the addressed line.
8. The method of claim 6 including comparing said levels after changing the read current into the addressed line.
9. The method of claim 1 including using a higher reference voltage to sense a cell in its higher resistance state and using a lower reference voltage to sense a cell in its lower resistance state.
10. The method of claim 1 including using a read current greater than the threshold current of a threshold device and less than the threshold current of the cell.