Characterization of nanoscale structures using an ultrafast electron microscope
The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
1. An electron energy loss spectroscopy system comprising:
a stage assembly configured to support a sample;
a first laser source;
a cathode optically coupled to the first laser source and operable to emit an electron pulse;
a second laser source optically coupled to the sample;
an electron lens assembly configured to focus the electron pulse onto the sample;
an entrance aperture configured to pass one or more electrons passing through the sample;
a sector magnet configured to bend a trajectory path of the one or more electrons passing through the entrance aperture; and
a detector configured to capture the one or more electrons passing through the entrance aperture, the detector providing a data signal associated with the one or more electrons.
2. The electron energy loss spectroscopy system of claim 1 wherein:
the first laser source is operable to emit a first optical pulse of less than 1 ps in duration;
the second laser source is operable to emit a second optical pulse of less than 1 ns in duration; and
the electron pulse less than 1 ps in duration.
3. The electron energy loss spectroscopy system of claim 1 wherein the sample is disposed in a chamber and the entrance aperture is centered in the chamber.
4. The electron energy loss spectroscopy system of claim 1 wherein the trajectory path of the one or more electrons is bent by 90 degrees.
5. The electron energy loss spectroscopy system of claim 1 further comprising an optical delay stage disposed along an optical path between the second laser source and the sample.
6. The electron energy loss spectroscopy system of claim 1 wherein the electron pulse consists of a single electron.
7. The electron energy loss spectroscopy system of claim 1 wherein the detector comprises a CCD camera.
8. The electron energy loss spectroscopy system of claim 1 further comprising:
a processor coupled to the detector, the processor being configured to process the data signal associated with the one or more electrons passing through the sample to output information associated with an energy spectrum of the one or more electrons; and
an output device coupled to the processor, the output device being configured to output the information associated with an energy spectrum of the one or more electrons as an energy spectrum.
9. A microscope comprising:
an electron energy loss spectrometer;
a laser system operable to provide a series of pump optical pulses;
a first frequency conversion unit operable to generate a series of frequency doubled optical pulses from the series of pump optical pulses;
a second frequency conversion unit operable to generate a series of frequency tripled optical pulses from the series of pump optical pulses;
a first optical system operable to direct the series of frequency tripled optical pulses to a impinge on a photocathode operable to generate a train of electron packets;
a first electron lens assembly operable to direct the train of electron packets to a specimen;
a second optical system operable to direct the series of frequency doubled optical pulses to impinge on the specimen; and
a second electron lens assembly operable to direct one or more electrons from the train of electron packets to the election energy loss spectrometer.
10. The microscope of claim 9 wherein the laser system comprises a femtosecond laser.
11. The microscope of claim 9 wherein the second optical system comprises a delay stage operable to increase or decrease a propagation path for the series of frequency doubled optical pulses.
12. The microscope of claim 9 wherein one or more of the electron packets consists of a single electron.
13. The microscope of claim 9 further comprising an accelerator operable to accelerate the train of electron packets to the specimen.
14. A convergent beam ultrafast electron microscope comprising:
an electron generation system operable to generate a series of electron pulses;
a first electron lens assembly operable to focus the series of electron pulses to impinge on a specimen; and
a detector configured to capture one or more electrons passing through the sample, the detector providing a data signal associated with the one or more electrons passing through the sample.
15. The convergent beam ultrafast electron microscope of claim 14 wherein the series of electron pulses comprise femtosecond electron pulses.
16. The convergent beam ultrafast electron microscope of claim 15 wherein an electron pulse in the series of electron pulses consists of a single electron.
17. The convergent beam ultrafast electron microscope of claim 14 further comprising:
a laser system operable to generate femtosecond laser pulses; and
a first optical system operable to direct the femtosecond laser pulses to impinge on the specimen.
18. The convergent beam ultrafast electron microscope of claim 17 wherein the series of electron pulses comprise femtosecond electron pulses.
19. The convergent beam ultrafast electron microscope of claim 14 wherein the detector is further configured to capture a diffraction image of the one or more electrons passing through the sample.
20. The convergent beam ultrafast electron microscope of claim 19 wherein the diffraction image is an image of the Zero Order Laue Zone diffraction pattern.