IP Library Granted Patent US 8,658,468
Granted Patent B2
US 8,658,468 · App. 13/570,986 · Granted Feb 25, 2014

Method for fabricating a semiconductor and semiconductor package

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Quick Facts
Patent No.
US 8,658,468
App. No.
13/570,986
Granted
Feb 25, 2014
Kind
B2
Abstract

A method for fabricating a semiconductor chip module and a semiconductor chip package is disclosed. One embodiment provides a first layer, a second layer, and a base layer. The first layer is disposed on the base layer, and the second layer is disposed on the first layer. A plurality of semiconductor chips is applied above the second layer, and the second layer with the applied semiconductor chips is separated from the first layer.

Claims (12)

1. A semiconductor chip package, comprising:

at least one semiconductor chip comprising a contact pads on a first surface of the semiconductor chip;

a material layer covering at least partially the semiconductor chip, other than the first surface of the semiconductor chip; and

a dielectric layer disposed above the first surface of the semiconductor chip, wherein the dielectric layer comprises a material with at least one additive, wherein the at least one additive releases a catalytic starter or an electrically conducting material upon irradiation.

2. The semiconductor chip package of claim 1 , wherein the dielectric layer comprises a plurality of vias aligned with the plurality of contact pads, wherein the plurality of vias are filled with conductive material.

3. The method of claim 2 , wherein the conductive material comprises conductive ink.

4. The semiconductor chip package of claim 1 , further comprising:

a wiring layer comprising a contact area connected with the plurality of vias.

5. The semiconductor chip package of claim 4 , further comprising:

a solder resist layer applied above the wiring layer, the solder resist layer comprising an opening in which the contact area is exposed.

6. The semiconductor chip package of claim 4 , further comprising:

a solder ball applied above the opening of the solder resist layer, the solder ball being electrically connected with the contact area.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061827/0686 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2022
From: INTEL DEUTSCHLAND GMBH
To: INTEL CORPORATION
Reel/Frame 061356/0001 →
CHANGE OF NAME Recorded Nov 6, 2015
From: INTEL MOBILE COMMUNICATIONS GMBH
To: INTEL DEUTSCHLAND GMBH
Reel/Frame 037057/0061 →
CORRECTED ASSIGNMENT TO CORRECT PREVIOUS ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL/FRAME 028773/0322 Recorded Apr 24, 2013
From: BEER, GOTTFRIED; ESCHER-POEPPEL, IRMGARD
To: INTEL MOBILE COMMUNICATIONS GMBH
Reel/Frame 030302/0969 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 13, 2012
From: BEER, GOTTFRIED; ESCHER-POEPPEL, IRMGARD
To: INFINEON TECHNOLOGIES AG
Reel/Frame 028773/0322 →