Test contactor for electrical testing of electronic components
A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips.
1. A testing apparatus for electronic components, comprising:
a mounting block;
a plurality of contact strips arranged on the mounting block and configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component; and
a preload block located on the mounting block that is operative to contact and apply a pre-stress force onto each of the plurality of contact strips in the same biasing direction prior to contact between the electrical leads and the plurality of contact strips, such that the plurality of contact strips are bent in the same biasing direction.
2. The testing apparatus as claimed in claim 1 , wherein the preload block is detachably mounted to the mounting block.
3. The testing apparatus as claimed in claim 2 , further comprising a fixing element which is operative to attach the preload block to the mounting block.
4. The testing apparatus as claimed in claim 3 , wherein the fixing element comprises screws.
5. The testing apparatus as claimed in claim 1 , wherein the preload block further comprises a biasing flange which protrudes onto and bends one or more of the contact strips in the biasing direction.
6. The testing apparatus as claimed in claim 5 , wherein the contact strips are bent by the biasing flange to slightly less than a required displacement for good contact between the contact strips and the electrical leads of the electronic component.
7. The testing apparatus as claimed in claim 1 , wherein the contact strips are pre-stressed such that a distance that the contact strips have to be moved by the electrical leads of the electronic component to achieve a sufficient contact force for good contact is reduced as compared to when the contact strips are not prestressed.