IP Library Granted Patent US 8,952,482
Granted Patent B2
US 8,952,482 · App. 13/599,900 · Granted Feb 10, 2015

Three-dimensional devices having reduced contact length

Inventor: Toru Tanzawa (Tokyo, JP)
Assignee: Micron Technology, Inc.
H01L27/11578H01L27/11531
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Quick Facts
Patent No.
US 8,952,482
App. No.
13/599,900
Granted
Feb 10, 2015
Kind
B2
Abstract

Various embodiments comprise apparatuses and methods including a memory array having alternating levels of semiconductor materials and dielectric material with strings of memory cells formed on the alternating levels. One such apparatus includes a memory array formed substantially within a cavity of a substrate. Peripheral circuitry can be formed adjacent to a surface of the substrate and adjacent to the memory array. Additional apparatuses and methods are described.

Claims (23)

1. An apparatus, comprising:

a memory array having alternating levels of semiconductor materials and dielectric materials that are substantially parallel to a substrate on which they are formed, the memory array being at least partially within a cavity of the substrate, the alternating levels being stepped such that an uppermost surface of at least one end of a lower level of each of the semiconductor material levels extends beyond an overlying one of the semiconductor material and the dielectric material levels, the substrate being a semiconducting material, the cavity being sufficiently deep such that an upper surface of the memory array is substantially coplanar with an uppermost surface of the substrate; and

peripheral circuitry including one or more devices formed on or in the uppermost surface of the substrate and adjacent to the memory array, an upper surface of the peripheral circuitry being substantially coplanar with the upper surface of the memory array to reduce an overall height and to reduce a resistance of peripheral circuitry contacts to couple the peripheral circuitry contacts from the peripheral circuitry to respective ones of a plurality of interconnects, the plurality of interconnects being formed between the memory array and the peripheral circuitry.

2. The apparatus of claim 1 , wherein the peripheral circuitry includes passive electrical components.

3. The apparatus of claim 1 , wherein the peripheral circuitry includes active electrical components.

4. The apparatus of claim 1 , further comprising strings of memory cells formed along the alternating levels.

5. The apparatus of claim 1 , wherein the memory array is substantially within the cavity of the substrate.

6. The apparatus of claim 1 , wherein the substrate comprises a semiconductor material over a dielectric material.

7. An apparatus, comprising: a memory array substantially within a cavity of a substrate, the substrate being a semiconducting material, the cavity being sufficiently deep such that an upper surface of the memory array is substantially coplanar with an uppermost surface of the substrate, the memory array comprising a number of levels of semiconductor material and a number of levels of dielectric material that are formed substantially parallel to the substrate, each of the levels of semiconductor material being separated from a respective adjacent one of the levels of semiconductor material by at least a respective one of the levels of dielectric material, a respective string of memory cells being formed along the levels of semiconductor material, the levels being stepped such that an uppermost surface of at least one end of a lower level of each of the semiconductor material levels extends beyond an overlying one of the semiconductor material and the dielectric material levels, and peripheral circuitry having one or more devices formed on or in the uppermost surface of the substrate and adjacent to an edge of the memory array, an upper surface of the peripheral circuitry being substantially coplanar with the upper surface of the memory array to reduce an overall height and to reduce a resistance of peripheral circuitry contacts to couple the peripheral circuitry contacts from the peripheral circuitry to respective ones of a plurality of interconnects, the plurality of interconnects being formed between the memory array and the peripheral circuitry.

8. The apparatus of claim 7 , wherein the cavity is a trench formed in the substrate.

9. The apparatus of claim 7 , wherein the peripheral circuitry interfaces with the memory array.

10. The apparatus of claim 7 , wherein the peripheral circuitry includes decoders and sense circuitry.

11. A method of forming an apparatus, the method comprising:

forming a cavity in a substrate to a depth substantially equivalent to a height of a three-dimensional circuit, the substrate being a semiconducting material;

forming alternating levels semiconductor materials and dielectric materials that are substantially parallel to the substrate, the alternating levels being stepped such that an uppermost surface of at least one end of a lower level of each of the semiconductor material levels extends beyond an overlying one of the semiconductor material and the dielectric material levels, the three-dimensional circuit substantially within the cavity such that an upper surface of the three-dimensional circuit is substantially coplanar with an uppermost surface of the substrate;

forming peripheral circuitry including one or more devices formed adjacent to the cavity and on or in the uppermost surface of the substrate including forming an upper surface of the peripheral circuitry to be substantially coplanar with the upper surface of the three-dimensional circuit to reduce an overall height and to reduce a resistance of peripheral circuitry contacts to couple the peripheral circuitry contacts from the peripheral circuitry to respective ones of a plurality of interconnects; and

forming the plurality of interconnects between the three-dimensional circuit and the peripheral circuitry.

12. The method of claim 11 , further comprising forming the three-dimensional circuit to be a memory circuit having multiple levels.

13. An apparatus, comprising:

a three-dimensional array having alternating levels of semiconductor materials and dielectric materials that are substantially parallel to a substrate on which they are formed, the alternating levels being stepped such that an uppermost surface of at least one end of a lower level of each of the semiconductor material levels extends beyond an overlying one of the semiconductor material and the dielectric material levels substantially within a cavity of the substrate, the substrate being a semiconducting material, the cavity being sufficiently deep such that an upper surface of the memory array is substantially coplanar with an uppermost surface of the substrate; and

peripheral circuitry having devices formed on or in the uppermost surface of the substrate and adjacent to an edge of the three-dimensional array, an upper surface of the peripheral circuitry being substantially coplanar with the upper surface of the three-dimensional array to reduce an overall height of peripheral circuitry contacts to couple the peripheral circuitry contacts from the peripheral circuitry to respective ones of a plurality of interconnects, the plurality of interconnects being formed between the three-dimensional array and the peripheral circuitry.

14. The apparatus of claim 13 , wherein the three-dimensional array is a memory array.

15. The apparatus of claim 13 , further comprising contacts coupled to the three-dimensional array and the peripheral circuitry, wherein a height of the longest contacts coupled to the three-dimensional array are substantially longer than the contacts coupled to the peripheral circuitry.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2013
From: TANZAWA, TORU
To: MICRON TECHNOLOGY, INC.
Reel/Frame 030781/0266 →
Continuity (1)
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