Erasable block segmentation for memory
Various embodiments comprise apparatuses such as those having a block of memory divided into sub-blocks that share a common data line. Each of the sub-blocks of the block of memory corresponds to a respective one of a number of segmented sources. Each of the segmented sources is electrically isolated from the other segmented sources of the block of memory. Additional apparatuses and methods of operation are described.
1. An apparatus comprising:
a block of memory having sub-blocks that share a common data line, each of the sub-blocks of the block of memory corresponding to a respective one of a number of segmented sources, each of the segmented sources of the block of memory being electrically isolated from the other segmented sources of the block of memory, each of the sub-blocks of the block of memory having a respective number of strings of memory cells, the sub-blocks of the block of memory each sharing a common source select line, the sub-blocks further having respective drain select devices coupled to the memory cell strings of the respective sub-block, the drain select devices having an asymmetric dopant profile.
2. The apparatus of claim 1 , wherein the sub-blocks of the block of memory share a number of common access lines, wherein each of the common access lines corresponds to a respective one of the strings of memory cells in the block of memory.
3. The apparatus of claim 1 , wherein each of the strings of memory cells is coupled to the common data line through the respective drain select device and to the respective segmented source through a respective source select device, wherein the source select devices have a higher breakdown voltage than the drain select devices.
4. The apparatus of claim 1 , wherein the drain select devices within each of the sub-blocks are electrically isolated from the drain select devices in other sub-blocks.
5. The apparatus of claim 3 , wherein the source select devices in each of the sub-blocks are electrically coupled to one another.
6. The apparatus of claim 3 , wherein the SGD junction on the data line side has a junction breakdown voltage that is asymmetric with reference to the SGS junction on the source side.
7. The apparatus of claim 1 , wherein the apparatus is configured to:
apply a first bias voltage to the segmented source of a sub-block of the block of memory selected to be erased during an erase operation; and
apply a second bias voltage to the segmented source of a sub-block of the block of memory not selected to be erased during the erase operation, the first bias voltage being greater than the second bias voltage.
8. The apparatus of claim 1 , wherein the sub-blocks of the block of memory do not share a memory cell.
9. A three-dimensional device comprising multiple tiers of memory cells, the three-dimensional device comprising:
a first sub-block of a block of memory, the first sub-block including a first number of memory cell strings and a first segmented source; and
a second sub-block of the block of memory, the second sub-block including a second number of memory cell strings and a second segmented source, the first and second segmented source being electrically isolated, the first sub-block and the second sub-block of the block of memory each sharing a common source select line, the first number of memory cell strings and the second number of memory cell strings being coupled to a common data line through a number of drain select devices, each of the drain select devices having an asymmetric dopant profile.
10. The three-dimensional device of claim 9 , wherein each of the first number of memory cell strings is coupled to a respective one of a first number of drain select devices and wherein each of the second number of memory cell strings is coupled to a respective one of a second number of drain select devices.
11. The three-dimensional device of claim 10 , wherein the source select devices have a higher breakdown voltage than the drain select devices.
12. The three-dimensional device of claim 10 , wherein each of the first number of memory cell strings is coupled to a common data line through a respective one of the first number of drain select devices and wherein each of the second number of memory cell strings is coupled to the common data line through a respective one of the second number of drain select devices.
13. The three-dimensional device of claim 12 , wherein the device is configured to erase a selected one of the first sub-block and the second sub-block separately from a non-selected one of the first sub-block and the second sub-block by applying separate bias voltages to the first and second segmented sources.
14. The three-dimensional device of claim 13 , wherein the device is configured to apply a bias voltage to the segmented source of the selected one of the sub-blocks that is higher than a bias voltage applied to the segmented source of the non-selected one of the sub-blocks.
15. The three-dimensional device of claim 14 , wherein the device is further configured to erase a selected one of the first sub-block and the second sub-block separately from a non-selected one of the first sub-block and the second sub-block by floating drain select lines coupled to the drain select devices of the selected one of the sub-blocks and by applying a bias voltage to drain select lines coupled to the drain select devices of the non-selected one of the sub-blocks.
16. The three-dimensional device of claim 15 , wherein the bias voltage that the device is configured to apply to the drain select lines coupled to the drain select devices of the non-selected one of the sub-blocks is no more than 75% of the bias voltage the device is configured to apply to the segmented source of the selected one of the sub-blocks.
17. An apparatus, comprising:
a block of memory including a first sub-block and a second sub-block, the first sub-block and the second sub-block including a first number of memory cell strings and a second number of memory cell strings, respectively, the first number of memory cell strings and the second number of memory cell strings being coupled to a common data line through a number of drain select devices, each of the drain select devices having an asymmetric dopant profile, the block of memory further comprising:
a first segmented source coupled to the first number of memory cell strings in the first sub-block through a first number of source select devices; and
a second segmented source coupled to the second number of memory cell strings in the second sub-block through a second number of source select devices, the source select devices having a higher breakdown voltage than the drain select devices.
18. The apparatus of claim 17 , wherein the asymmetric dopant profile in the drain select devices is configured to prevent a reverse bias condition in a channel of the memory cell strings in one of the sub-blocks that is not selected for an erase operation.
19. The apparatus of claim 17 , wherein the block further comprises common data lines, common access lines, and common source select lines that are shared between each of the sub-blocks.
20. The apparatus of claim 17 , wherein the block further comprises at least one of segmented data lines, segmented access lines, and segmented source select lines.
21. An apparatus comprising:
a memory block including a number of memory cell strings, each of the memory cell strings including respective memory cells of a number of memory cells, the memory block being divided into a number of sub-blocks, each of the sub-blocks comprising non-overlapping ones of the memory cell strings, each of the sub-blocks further comprising:
a respective one of a number of segmented sources, the respective one of the number of segmented sources being coupled to the memory cell strings of the respective sub-block, the segmented sources of the block being electrically isolated from each other; and
respective drain select devices coupled to the memory cell strings of the respective sub-block, each of the drain select devices having an asymmetric dopant profile.
22. The apparatus of claim 21 , wherein the asymmetric dopant profile is configured to prevent an erase disturb of non-selected ones of the sub-blocks during an erase operation.
23. The apparatus of claim 21 , wherein the apparatus is configured to bias the drain select devices of a selected one of the sub-blocks with a different signal than the drain select devices of a non-selected one of the sub-blocks.