Electron beam apparatus for inspecting a pattern on a sample using multiple electron beams
An electron beam apparatus for inspecting a pattern on a sample using multiple electron beams includes a plurality of primary electro-optical systems and a plurality of secondary electro-optical systems associated with the respective primary electro-optical systems. The primary electro-optical systems are for irradiating multiple primary electron beams on a surface of the sample, and each includes an electron gun having an anode and an objective lens. The secondary electro-optical systems are for inducing secondary electrons emitted from a surface of the sample by irradiation of the primary electron beams. Detectors are each for detecting the secondary electrons and generating electric signals corresponding to the detected electrons. The anodes of the electron guns of the primary electro-optical systems comprise an anode substrate in common having multiple holes corresponding to the axes of the respective primary electro-optical systems. The anode substrate has metal coatings around the respective holes.
1. An electron beam apparatus for inspecting a pattern on a sample using multiple electron beams, comprising:
a plurality of primary electro-optical systems for irradiating multiple primary electron beams on a surface of the sample, each of the primary electro-optical systems comprising an electron gun having an anode and an objective lens;
a plurality of secondary electro-optical systems associated with the respective primary electro-optical systems, for inducing secondary electrons emitted from a surface of the sample by irradiation of the primary electron beams; and
a plurality of detectors associated with the respective secondary electro-optical systems, each for detecting the secondary electrons and generating electric signals corresponding to the detected electrons,
wherein the anodes of the electron guns of the primary electro-optical systems comprise an anode substrate in common having multiple holes corresponding to the axes of the respective primary electro-optical systems, and
wherein the anode substrate has metal coatings around the respective holes, to which power is independently supplied so that anode currents flowing through the anodes are independently controlled.
2. The electron beam apparatus of claim 1 , wherein the holes of the anode substrate are located at the same interval in a line so that the holes are aligned with corresponding regions of corresponding stripes of different dies on the sample.
3. The electron beam apparatus of claim 1 , wherein the anode substrate comprises a mechanism for rotating the anode substrate to adjust the alignment of the holes.
4. The electron beam apparatus of claim 1 , wherein the anode substrate is made of ceramic having a coefficient of thermal expansion substantially equal to zero.
5. The electron beam apparatus of claim 1 , wherein the objective lenses of the respective primary electro-optical systems comprise a substrate in common having multiple electrode holes corresponding to the axes of the primary electro-optical systems.
6. The electron beam apparatus of claim 5 , wherein the substrate of the objective lenses comprises at least one knock hole for aligning the electrode holes with the axes of the respective primary electro-optical systems.
7. The electron beam apparatus of claim 5 , wherein the substrate of the objective lenses is made of ceramic having a coefficient of thermal expansion substantially equal to zero.
8. The electron beam apparatus of claim 5 , wherein the substrate of the objective lenses has metal coatings around the respective electrode holes, to which power is independently supplied.
9. An electron beam apparatus for inspecting a pattern on a sample using multiple electron beams, comprising:
a plurality of primary electro-optical systems for irradiating multiple primary electron beams on a surface of the sample, each of the primary electro-optical systems comprising an electron gun having an anode and an objective lens;
a plurality of secondary electro-optical systems associated with the respective primary electro-optical systems, for inducing secondary electrons emitted from a surface of the sample by irradiation of the primary electron beams; and
a plurality of detectors associated with the respective secondary electro-optical systems, each for detecting the secondary electrons and generating electric signals corresponding to the detected electrons,
wherein the anodes of the electron guns of the primary electro-optical systems comprise an anode substrate in common having multiple holes corresponding to the axes of the respective primary electro-optical systems.
10. The electron beam apparatus of claim 9 , wherein the holes of the anode substrate are located at the same interval in a line so that the holes are aligned with corresponding regions of corresponding stripes of different dies on the sample.
11. The electron beam apparatus of claim 9 , wherein the anode substrate comprises a mechanism for rotating the anode substrate to adjust the alignment of the holes.
12. The electron beam apparatus of claim 9 , wherein the anode substrate is made of ceramic having a coefficient of thermal expansion substantially equal to zero.
13. The electron beam apparatus of claim 9 , wherein the objective lenses of the respective primary electro-optical systems comprise a substrate in common having multiple electrode holes corresponding to the axes of the primary electro-optical systems.
14. The electron beam apparatus of claim 13 , wherein the substrate of the objective lenses comprises at least one knock hole for aligning the electrode holes with the axes of the respective primary electro-optical systems.
15. The electron beam apparatus of claim 13 , wherein the substrate of the objective lenses is made of ceramic having a coefficient of thermal expansion substantially equal to zero.
16. The electron beam apparatus of claim 13 , wherein the substrate of the objective lenses has metal coatings around the respective electrode holes, to which power is independently supplied.